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Double excitation coil conductor defect automatic flaw detection device and flaw detection method

A technology for coil conductors and flaw detection devices, which is used in measurement devices, instruments, and material analysis by electromagnetic means, can solve problems such as low sensitivity, radiation pollution and damage in the environment, and achieve high detection accuracy, improve detection capabilities, and efficiency. high effect

Active Publication Date: 2016-09-14
JIANGSU UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Ultrasonic flaw detection is a manual operation. The display of defects by ultrasonic flaw detection is not intuitive. It needs a couplant. The flaw detection technology is difficult and easily affected by subjective and objective factors. It requires experienced inspectors to distinguish the type of defect. It is suitable for thicker parts. Inspection; radiographic flaw detection has side effects or even certain damage to the human body, has adverse effects on other sensitive objects, and has radiation pollution to the environment; and the current ordinary eddy current flaw detection, due to the use of single-coil technology, has no comparison between defects and non-defects, and the sensitivity lower

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  • Double excitation coil conductor defect automatic flaw detection device and flaw detection method
  • Double excitation coil conductor defect automatic flaw detection device and flaw detection method
  • Double excitation coil conductor defect automatic flaw detection device and flaw detection method

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Embodiment Construction

[0019] The present invention is described in further detail now in conjunction with accompanying drawing. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.

[0020] Such as Figure 1-3 As shown, an automatic flaw detection device for conductor defects with double excitation coils includes a power trolley 1, a single-chip microcomputer, a detection board 4, an excitation coil 5, a giant magnetoresistive sensor 6 and a relay. The single-chip microcomputer is arranged inside the power trolley 1, and the detection The board 4 is arranged on one end of the bottom surface of the power trolley 1, and the two ends of the detection board 4 are elastically connected to the bottom surface of the power trolley 1 through springs 7 respectively. The relay is connected with the detection board 4 and can control both sides of the ...

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Abstract

The invention relates to an automatic flaw detection device and flaw detection method for conductor defects with double excitation coils, comprising a power trolley, a single-chip microcomputer, a detection board, an excitation coil, a giant magnetoresistive sensor and a relay, the single-chip microcomputer is arranged inside the power trolley, and the detection board is set At one end of the bottom surface of the power trolley, the two ends of the detection board are respectively elastically connected to the bottom surface of the power trolley through springs. The relay is connected to the detection board and can control both sides of the detection board to turn down. Two excitation coils are fixed on the detection board The two excitation coils are symmetrically arranged on the detection board, and giant magnetoresistance sensors are respectively arranged in the two excitation coils, the bottom surface of the giant magnetoresistance sensors is at the same level as the bottom end of the excitation coil, and the giant magnetoresistance sensors are electrically connected with the single-chip electromechanical. The double excitation coil conductor defect automatic flaw detection device and flaw detection method effectively improve the system's ability to detect deep defects and surface microscopic defects, have high detection accuracy and high efficiency, and have popularization and use value.

Description

technical field [0001] The invention relates to the technical field of nondestructive testing, in particular to an automatic flaw detection device and a flaw detection method for conductor defects with double excitation coils. Background technique [0002] The role of non-destructive testing technology in the quality assurance system has increasingly shown its importance and necessity, and has become an important means to control product quality and ensure the safe operation of in-service equipment. Ultrasonic, X-ray, eddy current and other methods are commonly used in non-destructive testing. Ultrasonic flaw detection is a manual operation. The display of defects by ultrasonic flaw detection is not intuitive. It needs a couplant. The flaw detection technology is difficult and easily affected by subjective and objective factors. It requires experienced inspectors to distinguish the type of defect. It is suitable for thicker parts. Inspection; radiographic flaw detection has...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/90G01N27/904
Inventor 杨龙兴杨浩轩周德强
Owner JIANGSU UNIV OF TECH