Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-Channel Time-Interleaved Analog-to-Digital Converter

An analog-to-digital converter and time interleaving technology, applied in the field of electronics, can solve the problems affecting the dynamic performance of Time-interleaved ADC, timing mismatch error, etc.

Active Publication Date: 2018-06-05
HUAWEI TECH CO LTD
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In fact, it is difficult for ADCs between different channels to completely match the sampling time, resulting in a timing mismatch error (timing skewerror)
If not corrected, it will seriously affect the dynamic performance of Time-interleaved ADC

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-Channel Time-Interleaved Analog-to-Digital Converter
  • Multi-Channel Time-Interleaved Analog-to-Digital Converter
  • Multi-Channel Time-Interleaved Analog-to-Digital Converter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0058] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0059] Such as figure 1 As shown, an embodiment of the present invention provides an analog-to-digital converter, which is a multi-channel time-interleaved analog-to-digital converter. figure 1 It can be seen that the analog-to-digital converter includes an M-channel ADC group, a clock generation circuit, a channel mismatch parameter detection circuit, a signal supplementation and reconstruction circuit, and a signal combination circuit.

[0060] Wherein, the clock generation circuit is used to generate the working clock of the analog-to-digital converter. The M-channel ADC group includes ADCs of M channels, and M is a natural number not less than 2. These ADCs are configured in a time-interleaved architecture. Under the control of the clock generation circuit, the interleaved clock is used to make it rotate in a time-...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a multi-channel time interleaving analog-to-digital converter, which includes: a clock generation circuit generates a working clock of the analog-to-digital converter; a channel ADC group includes M ADC channels, which are configured as a time interleaving structure, and the clock generation circuit Under the control, it works in turn according to the time-division multiplexing method, and converts one high-speed analog input signal into M low-speed digital output signals, where M is an integer not less than 2; the channel mismatch detection circuit has a mismatch in the timing of the output signals of the M ADC channels. The matching error is detected in real time, and the timing mismatch parameters of each ADC channel relative to the reference ADC channel are obtained; the signal compensation and reconstruction circuit is based on the timing mismatch error detected by the channel mismatch detection circuit. The digital output signal output by the channel ADC group Compensation and reconstruction are performed; the signal combination circuit combines the M channels of low-speed output signals after compensation of each channel generated by the signal compensation and reconstruction circuit to obtain the final channel of high-speed digital output signals.

Description

technical field [0001] The invention relates to the field of electronics, in particular to a multi-channel time-interleaved analog-to-digital converter. Background technique [0002] Multi-channel Time-interleaved Analog-to-Digital Converter (Multi-channel Time-interleaved Analog-to-Digital Converter) is a kind of parallel connection of multiple Analog-to-Digital Converters (Analog-to-Digital Converter, ADC), and uses interleaved clock to make Its high-speed ADC architecture that rotates in time-division multiplexing can combine the low-speed signals output by each ADC that maintains low-frequency operation into high-speed signals. Ideally, when the ADC circuit parameters of each channel are exactly the same, the sampling rate of the Time-interleaved ADC increases proportionally to the number of interleaved parallel ADC channels. In fact, it is difficult for ADCs of different channels to completely match the sampling time, resulting in a timing mismatch error (timing skewer...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/10
CPCH03M1/0624H03M1/0626H03M1/0836H03M1/1033H03M1/1061H03M1/1215H03M1/0631
Inventor 邱炳森
Owner HUAWEI TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products