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Array substrate, method for manufacturing the same, and display device

An array substrate and transparent substrate technology, applied in the field of liquid crystal displays, can solve the problems of poor measurement accuracy, blurred distribution boundaries of strip electrodes, and unmeasured line width of strip electrodes, achieving the effect of increasing accuracy and clear distribution boundaries

Active Publication Date: 2018-01-30
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the fuzzy distribution of strip electrodes in the line width measurement area, there have always been problems that the line width of the strip electrodes cannot be measured and the measurement accuracy is too poor

Method used

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  • Array substrate, method for manufacturing the same, and display device
  • Array substrate, method for manufacturing the same, and display device
  • Array substrate, method for manufacturing the same, and display device

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Embodiment Construction

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.

[0035] An embodiment of the present invention provides an array substrate, such as figure 1 , figure 2 As shown, the array substrate includes: a transparent substrate 1, a gate metal layer disposed on the transparent substrate 1, a gate insulating layer 3, an active layer 4, a source-drain metal layer, and a passivation layer 6; wherein, the The gate metal layer includes: patterns 2 of gate lines and gates, and the source-drain metal layer includes: patterns 5 of data lines, source electrodes, and drain electrodes; the array substrate further includes: The first strip electrodes 7 and the second strip electrodes 8 are arranged in the line width measurement areas B1...

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Abstract

The embodiment of the invention provides an array substrate, a manufacturing method thereof and a display device and relates to the field of liquid crystal displays. The accurate line widths of strip electrodes can be measured. The array substrate comprises a transparent substrate body, a grid metal layer, a grid insulating layer, an active layer, a source-drain metal layer and a passivation layer, wherein the grid metal layer, the grid insulating layer, the active layer, the source-drain metal layer and the passivation layer are arranged on the transparent substrate body; the grid metal layer comprises grid lines and a pattern of a grid electrode; the source-drain metal layer comprises a data line, a source electrode and a pattern of a drain electrode. The array substrate further comprises the first strip electrodes arranged in a pixel region, the second strip electrodes arranged in a line width measuring region and a non-transparent pattern arranged in the line width measuring region, wherein the non-transparent pattern is located below the second strip electrodes, and part of the boundaries on the two sides of at least one strip electrode are located in the region where the non-transparent pattern is located. The passivation layer at least covers the pixel region.

Description

[0001] This application requires a divisional application of the Chinese patent application submitted to the China Patent Office on November 21, 2012, with the application number 201210475414.0 and the title of the invention "array substrate and its manufacturing method, display device, line width measurement method and device", The entire contents of which are incorporated by reference in this application. technical field [0002] The invention relates to the field of liquid crystal displays, in particular to an array substrate, a manufacturing method thereof, and a display device. Background technique [0003] In the TFT-LCD (Thin Film Transistor-Liquid Crystal Display, thin film transistor liquid crystal display) manufacturing industry, the monitoring and measurement of CD (Critical Dimension, key dimension) is very important, and the accuracy of the measurement results will affect the performance of the entire display device . In the ADS (Advanced-Super Dimension Switch...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/1362G02F1/1343G02F1/13H01L27/02H01L21/77G01B21/02
CPCG02F1/134309G02F1/136286G02F1/1368H01L22/30
Inventor 刘耀孙亮丁向前李梁梁白金超
Owner BOE TECH GRP CO LTD