A Method of Finding the Cause of Infrared Cut-off Film Manufacturing Deviation by Grouping

Abstract

The invention disclosed a method for finding out a reason for the making deviation of infrared ending films in a subgrouping manner. The method comprises the following processing steps: a, actually measuring a spectroscopical curve and data, with deviation; b, opening an original design procedure by using a TPC film system design software, saving an original design curve and film parameters, and deleting the original goal setting data; c, guiding in the actual measured data and showing a new goal spectroscopical curve; d, grouping by using a grouping function according to an actual optically controlled equinoctial method; e, respectively increasing or decreasing the tool factor of each group by using an interactive analyzing function, and finding out a key layer which influences the deviation of the spectroscopical curve in a simulated manner; f, optimizing all groups by using a group optimizing function, and finding out the groups with the greatest influence; g, locking other groups except the groups found out in the step f, and performing re-optimization so as to find out the direction of improvement. The method disclosed by the invention can effectively and rapidly find out the reason which causes the deviation, so that the determination of the direction for improving production and processing and the correction of the deviation are facilitated.

Description

technical field [0001] The invention relates to the technical field of optical filters, in particular to a method for finding the cause of deviations in the manufacture of infrared cut-off films by means of subgrouping. Background technique [0002] For a mobile phone with a camera function, its lens module generally includes a support base, an infrared cut filter, a lens and a camera sensor, wherein the infrared cut filter, lens and camera sensor are adhesively connected to the support base. [0003] For the infrared cut-off filter, it is composed of blue glass and the infrared cut-off film coated on the surface of the blue glass; in the process of making the infrared cut-off film, due to various reasons, there will be manufacturing errors, which will cause the spectral curve to vary and exceed the technical level. It becomes a defective product due to the requirements of the specifications; among them, the variation of the spectroscopic curve is generally caused by the thi...

AI Technical Summary

Problems solved by technology

[0004] For the existing technology, due to the large number of layers of the infrared cut-off film, when the spectroscopic curve of the actual coating does not match the designed spectroscopic curve, it is difficult to find the reason quickly, and sometimes it is necessary to consider redesigning a new film system, or from The adjustment of equipment parameters, process parameters, etc. is relatively uncertain, and the improvement cycle is prolonged, which is not conducive to quality improvement