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Sample analyzer and method for replacing light source unit

A technology for sample analysis devices and components, which is applied to measurement devices, analysis materials, and material analysis by optical means, etc., can solve the problem of difficulty in replacing light source components, and achieve the effect of easy replacement work.

Active Publication Date: 2016-03-09
SYSMEX CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] According to U.S. Patent Application Publication No. 2010 / 0290952, since the light source part is installed inside the main body of the detection part, it is difficult to replace the light source part, and users want to improve it.

Method used

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  • Sample analyzer and method for replacing light source unit
  • Sample analyzer and method for replacing light source unit
  • Sample analyzer and method for replacing light source unit

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Embodiment Construction

[0035] Refer below Figure 1~Figure 5 The configuration of the sample analyzer 10 according to one embodiment will be described.

[0036] figure 1 The sample analysis device 10 shown is a device for optically measuring a sample for analysis (hereinafter referred to as a sample) prepared by mixing a sample and a reagent. The sample analysis device 10 analyzes the sample components based on the optical information obtained by the measurement.

[0037] The sample analyzer 10 is composed of a transport device 10a and a measurement device main body 10b. The sample analyzer 10 has a transport device 10a on the Y2 side and a measurement device main body 10b on the Y1 side. The transport device 10 a transports the sample rack 500R on which the sample container 500 is mounted. The measurement device main body 10b measures the sample in the sample container 500 set on the sample rack 500R transported by the transport device 10a. In addition, in the present specification, "the front...

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Abstract

Disclosed is a sample analyzer including: a transport apparatus configured to transport a sample rack holding a sample container; and a measurement apparatus body configured to measure a sample in the sample container held in the sample rack having been transported by the transport apparatus, wherein the transport apparatus includes light source holding means for detachably holding a light source unit, and the measurement apparatus body includes detection means for detecting, via an analysis specimen containing the sample, light emitted from the light source unit held in the light source holding means.

Description

technical field [0001] The invention relates to a sample analysis device and a method for replacing a light source part of the sample analysis device. Background technique [0002] There is a sample analysis device equipped with a light source unit (for example, refer to US Patent Application Publication No. 2010 / 0290952). [0003] US Patent Application Publication No. 2010 / 0290952 discloses a sample analysis device including a transport member for transporting a rack accommodating sample containers, and a detection unit host for optically measuring a sample supplied by the transport member. The conveying member part is arranged in front of the main machine of the detecting member part. The main body of the detection component part has a casing. The housing includes a light source unit, a light source housing unit for detachably housing the light source unit, and a detection unit for detecting light irradiated by the light source unit from an analytical sample containing t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01
CPCG01N35/04G01N2035/00306G01N2035/00326G01N2035/0415G01N21/01
Inventor 松浦泰幸
Owner SYSMEX CORP