Metering calibration method for current tolerance of switch long delay test stand

Abstract

The invention relates to a metering calibration method for a current tolerance of a switch long delay test stand. A switch sample is connected with the switch long delay test stand to respectively test stabilization degrees of the largest output current and the smallest output current of the switch long delay testing stand under the rate output. The test method comprises steps that an effective current value of the test stand is tested at every 30s, the test time is 10 minutes, 20 data are acquired and are marked as x1-x20 respectively, each data is guaranteed to be in a 0-5% scope, and the relative standard deviation value is solved. Through the method, precision of an output current of a long delay release characteristic test stand can be metered and calculated to stay in a scope of 0-5%, so whether the long delay release characteristic test stand satisfies national standards can be determined.

Description

Technical field [0001] The invention belongs to the field of electrical appliance detection equipment, in particular to a measurement calibration method for the current tolerance of a switch long delay test bench. Background technique [0002] The measurement of current tolerance is an important measurement calibration index of the switch action characteristic test bench, which ensures that the long time delay characteristic test bench meets the requirements of the national standard when the circuit breaker and other products are in 3C certification and factory inspection. However, the lack of certain specifications and standardized and unified steps for calibration has caused great obstacles to operators in the actual calibration process, which not only affects work efficiency, but also causes large errors in many test benches, and even damages the test bench. . Therefore, the urgent problem to be solved is to find a measurement calibration method with better applicability for ...

AI Technical Summary

Problems solved by technology

According to the requirements of national standards, it is necessary to measure and evaluate the accuracy of the output current of the long-delay characteristic test bench. The existing measurement and calibration methods for the characteristic test bench are only for the calibration of transformers and display instruments, and cannot accurately evaluate this technology. indicators, and the scientificity of this method is also open to question

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