The invention provides a PCIe exchange
delay testing device and method, and relates to the technical field of PCIe exchange
delay. The testing device mainly comprises a CPU module, an NOC module, a first bridging module, a second bridging module, a
memory module, a local time module, a first
timestamp adding module, a first calculation module, a second
timestamp adding module, a second calculation module, an RC controller module and an EP controller module. According to the scheme, the structure is simple, the operation is convenient, and after the tested PCIe exchange
chip is connected, accurate
delay information of the tested PCIe exchange
chip can be obtained only by writing data into a specified address and then reading the address; according to the scheme, the switching delay measurement of the PCIe switching
chip in two directions from the UP port to the DP port or from the DP port to the UP port can be supported; according to the scheme, the
measurement precision can be further improved by improving the
clock frequency of a counter in the local time module.