The present invention provides a PCIe exchange
delay test device and method, which relates to the field of PCIe exchange
delay technology. The test device mainly includes a CPU module, a NOC module, a first bridge module, a second bridge module, a
memory module, a local time module, a first
timestamp adding module, a first calculation module, a second
timestamp adding module, a second calculation module, an RC controller module and an EP controller module. The scheme has a simple structure and is easy to operate. After connecting the PCIe exchange
chip to be tested, it only needs to write data to the specified address and then read the address to obtain the accurate
delay information of the PCIe exchange
chip to be tested; the scheme can support the exchange delay measurement of the PCIe exchange
chip from the UP port to the DP port or from the DP port to the UP port in two directions; the scheme can also further improve the measurement accuracy by increasing the
clock frequency of the counter in the local time module.