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Analog quantity merging unit transient state delay test method based on frequency scanning

A technology of frequency scanning and delay testing, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems that cannot meet the requirements of the transient delay test of the merging unit well, so as to eliminate test errors and improve Sampling accuracy, versatile effects

Active Publication Date: 2014-08-27
ELECTRIC POWER RES INST OF GUANGXI POWER GRID CO LTD +2
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Problems solved by technology

Therefore, all the current test methods cannot well meet the requirements of the power system for the transient delay test of the combined unit.

Method used

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  • Analog quantity merging unit transient state delay test method based on frequency scanning
  • Analog quantity merging unit transient state delay test method based on frequency scanning
  • Analog quantity merging unit transient state delay test method based on frequency scanning

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Embodiment Construction

[0023] The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing:

[0024] refer to Figure 1-3 , a method for testing the transient delay of an analog merging unit based on frequency scanning, comprising the following steps:

[0025] A. Determine the starting moment of the entire transient process by real-time discrimination of the received standard source signal and the measured signal for the sudden change;

[0026] B. From the initial moment of the sudden change of the transient current, the waveform signals of the standard source signal and the measured signal are respectively collected according to the duration of the decay time constant;

[0027] The data window of the transient delay test of the merging unit is obtained through the decay constant of the transient current, that is, the waveform of the decay time constant duration is used as the calculation object from the initial moment of the sudden chang...

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Abstract

The invention discloses an analog quantity merging unit transient state delay test method based on frequency scanning. Sudden-change quantities of a received standard source signal and a signal to be measured are judged in real time, a starting moment of a transient state process is determined, waveform signals are collected, the amplitude and the phase angle of each harmonic are calculated, the transient state delay corresponding to each harmonic is calculated, and ultimately, the ultimate transient state delay is calculated according to the amplitude of each harmonic and the transient state delay corresponding to each harmonic. Transient state transmission time is calculated through a weighting coefficient, test currents do not need to be output specially, universality is high, and the method is suitable for all merging units with low-pass filter coefficients, port modes and port protocols currently. A high-precision constant-temperature crystal oscillator is used for controlling timing sequence and eliminating errors, the transient state starting moment of tested data is guaranteed, and sampling precision of higher harmonics is improved by means of a four-step Bessel filter. The analog quantity merging unit transient state delay test method based on frequency scanning can be widely used in the field of relay protection and verification.

Description

technical field [0001] The invention relates to the field of relay protection verification, in particular to a frequency scanning-based transient delay test method for an analog combination unit. Background technique [0002] The analog input merging unit has been widely used in power systems, and its absolute delay test is currently based on the transmission delay test of the steady-state current or steady-state voltage value. They all use the fundamental wave as their transmission reference quantity and use the change of the fundamental wave phase angle to calculate the overall delay according to the frequency. However, when a power system fault occurs, its transient current is not a steady-state process, and its waveform contains a large number of high-order harmonics. The pre-analog acquisition loop of the merging unit is equipped with a low-pass filter, and its low-pass filter parameters are directly The delay characteristic of the transmission and change affecting its...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 黄东山宁文辉周卫陈铭杨理才汤汉松罗强
Owner ELECTRIC POWER RES INST OF GUANGXI POWER GRID CO LTD
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