367 results about "Digital integrated circuits" patented technology

A Digital Design Method which may be automated is for obtaining timing closure in the design of large, complex, high-performance digital integrated circuits. The methodincludes the use of a tuner on random logic macros that adjusts transistor sizes in a continuous domain. To accommodate this tuning, logic gates are mapped to parameterized cells for the tuning and then back to fixed gates after the tuning. Tuning is constrained in such a way as to minimize “binning errors” when the design is mapped back to fixed cells. Further, the critical sections of the circuit are marked in order to make the optimization more effective and to fit within the problem-size constraints of the tuner. A specially formulated objective function is employed during the tuning to promote faster global timing convergence, despite possibly incorrect initial timing budgets. The specially formulated objective function targets all paths that are failing timing, with appropriate weighting, rather than just targeting the most critical path. Finally, the addition of multiple threshold voltage gates allows for increased performance while limiting leakage power.

A non-volatile memory array includes memory cells connected in a common source arrangement and formed in columns of isolated well regions so that Fowler-Nordheim tunneling is used for both write and erase operations of the memory cells. The memory arrays can be formed as NOR arrays or NAND arrays. In one embodiment, the memory array of the present invention is formed as a byte alterable EEPROM with parallel access. In another embodiment, an insulated gate bipolar transistor (IGBT) is coupled to the memory cells to increase the cell read current of the memory array. When the memory array incorporates IGBTs on the bitlines, the cell read current becomes independent of the wordline voltages. Thus, the memory array of the present invention can be operated at low voltages. The use of IGBTs in the memory array of the present invention enables formation of embedded non-volatile memories in low-voltage digital integrated circuits.

The invention discloses a low power consumption and rapid oscillation starting crystal oscillator module with a transposable start oscillation condition, which consists of an inverting amplifier, an inverting reshaper chain, an automatic gain control loop (AGC), a feedback resistor, a power limitation resistor, and an external passive crystal oscillator and an external load capacitor. The inverting amplifier is provided with a transposable feedback resistor R1, and the transposable start oscillation condition of the crystal oscillator is realized; and the automatic gain control loop (AGC) is inserted between an input end and a bias end of the inverting amplifier, and the contradiction between the oscillation starting time and power consumption is solved. The invention also provides a highresistor realizing IC (integrated circuit) by adopting a transconductance amplifier of micro current source, and a transposable feedback resistor R1 for the oscillator amplifier branch circuit and a high resistor in a pi-shaped filter. The resistance value of the high resistance can be controlled by programming, the start oscillation condition of the oscillator can be adjusted through adjusting the feedback resistance R1, and reliable and quick start oscillation of the oscillator can be realized; and lower phase noise can be realized through adjusting the high resistor in the pi-shaped filter. The crystal oscillator circuit has the characteristics of low power consumption and rapid start oscillation, and can be used for the digital integrated circuit, such as a base band of various of satellite navigation allocation receptors, real time clocks (RTC).

The invention provides a real-time video defogging system which belongs to the field of image processing and is characterized by being realized in a digital integrated circuit and comprising a data reading unit, a judgment unit, a sky brightness estimation unit, an atmosphere illumination white balance unit, an atmosphere dissipation image estimation unit and a clear scene recovery unit. As for the former K frames in the current lens of a video to be processed, the sky region thereof is estimated so that the sky brightness value is calculated; then the atmosphere illumination color of an image to be processed is corrected according to the sky brightness value by utilizing a white balance algorithm and a white balance image is normalized, the minimum values, minimum values of various colorcomponent are solved out so as to serve as rough estimated image; and based on the minimum values, an refined atmosphere dissipation image is calculated by utilizing an edge maintained flatting method, and the atmosphere scene albedo is calculated based on the atmosphere dissipation image, so that defogging recovery processing is carried out. As for a common-intermediate-format (CIF) video with the resolution of 288*352, the processing speed can be up to 60 fps (frames per second); and as for a D1-format video with the resolution of 578*720, the processing speed can be up to 15 fps, thus the system provided by the invention can be applied to monitoring systems and meet the requirement on real-time performance.

The invention provides a test pattern-based testing system for realizing a functional test on a digital integrated circuit. The functional test is mainly used for testing logical functions of a chip under a certain timing sequence, and a basic principle is that the chip is excited by means of test patterns and whether the response of the chip is consistent with expected response is observed. The functional test can cover failure models of extremely high proportion logic circuits. A debugging technology supported one-step testing system comprises two parts, namely test pattern file conversion software applied to a personal computer (PC) and a digital integrated circuit chip testing machine, wherein the digital integrated circuit chip testing machine consists of architectures of a central processing unit (CPU) and a field programmable gate array (FPGA); the CPU is used for storing and converting pattern files, controlling the testing process, communicating with a host, and the like. A pattern controlling logic circuit is realized by an FPGA, the waveform generation, the control of Pattern random access memory (RAM) and sampling control are finished through the FPGA, and a drive and a comparator are controlled so as to test and control a tested object.

The invention discloses an automatic test system for a digital integrated circuit. The automatic test system is composed of a tested chip, a test interface board, an integration module, a test module, a control module, a display module and an upper computer. The control module is connected with the upper computer. The test module is connected with the control module. A base pin of the tested chip is connected with the test interface board which is connected with the test module. The integration module is connected with the test module and the upper computer. The display module is connected with the control module and displays a waveform after final comparison by the aid of upper computer software, so that the automatic test for functions and performance of the chip is completed. The automatic test system is low in cost, easy to implement under laboratory conditions, easy and convenient to operate, high in development rate and capable of meeting the test requirements of small-batch products. According to the system, through an automatic test, the problem that operation is complex due to the fact that the number of test items is large in a manual test is solved, the test efficiency is enhanced, a misjudgment caused by artificial factors in the manual test is avoided, and therefore test quality is improved.

A method for configuring a signal path within a digital integrated circuit. The method includes transmitting an output from a first logic module, receiving the output at a second logic module, and conveying the output from the first logic module to the second logic module by using a configurable signal path. The configurable signal path is variable by selectively including at least one latch.

The disclosure relates to the acquisition of a binary analog signal at input of a digital integrated circuit after its range of voltage variation has been matched with that acceptable by the digital integrated circuit by means of a resistive divider bridge. It is usual to define the architecture of an ASIC digital integrated circuit on the basis of libraries of pre-characterized cells. The disclosed device is designed to increase the possibilities of choice open to the integrated circuit designer, in enabling him to one pre-characterized cell of a Schmitt trigger for its top switching threshold and another for its bottom switching threshold. It consists of a circuit comprising, at input, a bank of Schmitt triggers of different types, followed by a discrete-rendering logic circuit deducing the logic state of the binary input analog signal of the combination of the output states of the input Schmitt triggers.

The present invention pertains to an automated method for designing a integrated circuit (IC) design-specific cell, the method includes the steps of receiving a design specification for the design-specific cell, mapping a transistor-level representation of the design-specific cell, wherein the mapping is based on at least one, but perhaps plural design specifications, and evaluating the transistor-level representation of the design-specific cell for satisfaction of the design specification.

The invention relates to a system and method for the online testing of a radiation effect of a modular digital integrated circuit, and the system enables all needed function circuits in the effect testing to be divided into relatively independent modules on the basis of summarizing the similarities and differences of conventional digital integrated circuit radiation effect online testing systems. The electrical and mechanical connection among the modules, the design in the modules and the mechanical structure of a system board respectively employ conventional industrial standards, thereby achieving a purpose that a system can employ a commercial module or an independently developed modular for quick connection, enabling the system to be better in expandability, and saving the design time and cost of hardware. The method can be used for the majority of the online testing of the radiation effect of digital integrated circuits of bullets and satellites. The system plays an important role in standardizing a national radiation effect online testing system.

A controller and method for a switched-mode power converter adaptively provides overcurrent protection by detecting a current in the power converter exceeding a current limit during substantially a minimum on time of a power switch. A count N is computed for the number of consecutive active switching cycles that a current exceeds a current limit during substantially the minimum on time of the power switch. Conduction of the power switch is inhibited for a number of cycles that is a function of the count N, which is an increasing function of N. The function of the count N is preferably the function 2^N−1. The count N is reset to zero if the current in the power converter does not exceed the current limit substantially during the minimum on time of the power switch. The controller can be easily implemented with a digital integrated circuit for a wide range of applications.

The invention discloses a device for detecting power equipment discharge based on an ultraviolet method, comprising a sensor unit, a signal processing unit, a processor unit and a power supply unit, wherein the sensor unit comprises a front-end light-filtering device and a photomultiplier which are correspondingly arranged; the signal processing unit comprises a front-end amplifying circuit, a wave-filtering adjustment circuit, a post amplifying circuit, a pulse discriminating circuit and a digital integrating circuit; the power supply unit comprises a high-voltage power supply module and a circuit power supply module; the high-voltage power supply module is connected with the power end of the photomultiplier; and the circuit power supply module is connected with the related power ends of the signal processing unit and the processor unit. The device not only can qualitatively analyze the discharge condition, but also can quantitatively detect the discharge capacity of the equipment, is convenient for the operators to understand the discharge trend of the equipment and simultaneously provides the basis for evaluating the insulation state of the operating equipment. The device adopts non-contact measurement, thereby greatly improving the security of power detection.

The present invention relates to a digitally-controlled crystal oscillator (DCXO) circuit having control circuitry, an active core, and a pair of thermometer-coded switched-capacitor circuits (TCSCCs), each of which is coupled to the active core and to a crystal. The active core, the crystal, and the pair of TCSCCs form a DCXO, which provides an output signal having an output frequency. Each TCSCC includes multiple capacitive elements, which are selected by a respective control signal from the control circuitry to control the output frequency. The DCXO circuit may be integrated into a digital integrated circuit (IC) without need for a digital-to-analog converter (DAC), and may be used with a wide range of crystal types. By using thermometer-coding, the pair of TCSCCs provides monotonic frequency tuning behavior. Further, by utilizing different types of tuning steps, the DCXO may have a wide tuning range with high resolution.

The invention discloses a time parameter measurement system for digital integrated circuits. The system is implemented by converting a to-be-measured signal IN into a time interval start signal Start and a stop signal Stop as well as pulse signals RStart and RStop by a channel circuit unit; then, the four signals are respectively provided for an accurate time measurement unit and a coarse time measurement unit to carry out measurement, wherein the accurate time measurement unit is composed of a multi-stage delay line and a calibration unit, and used for carrying out measurement under the condition that the rising edge of the to-be-measured signal is steep; and the coarse time measurement unit is composed of a jittering shielding circuit, a counter 1 and a counter 2 (the operating frequencies of the counter 1 and the counter 2 are complementary), and used for carrying out measurement under the condition that the rising edge of the to-be-measured signal is slow. By using the system disclosed by the invention, the difficulty of improving the resolution ratio of a time parameter measurement system for high-precision digital integrated circuits in the prior art is overcome, and the technical difficulty that the measurement bandwidth of a time parameter measurement system is limited caused by the jitter of output signals of a comparator for channel circuits.

The invention discloses a wiring judgement control machine for a wiring simulation system for verification on a power transformer. The wiring judgement control machine is composed of a drive output module, an acquisition input module, a polarity and signal discrimination module, an RS232 transceiver, an MCU (microprogrammed control unit) module, a power supply unit, etc; the MCU module is in one-way connection with the drive output module, the acquisition input module, and the polarity and signal discrimination module, and is in two-way connection with the RS232 transceiver; and the whole controller adopts a digital integrated circuit, and is used for rapidly judging the wiring relationships of 48 connecting wires under the management of embedded software, and uploading the result to an upper PC (personal computer) continuously and in real time, so as to perform further processing such as a judgement about right or wrong. Via the wiring judgement control machine disclosed by the invention, an effective solution is provided for a wiring judgement for the conductor terminal of each simulator in the wiring simulation system for verification on the power transformer.

A disk drive having a motor and a velocity control loop, which includes a frequency detector and a filter. The filter includes a filter section and an accumulator. The filter is programmable in that filter coefficient(s) are dynamically received by the filter section. One embodiment of the filter section is an infinite impulse response filter. One embodiment of the filter is a digital integrated circuit. A method for compensating a control loop by infinite impulse response filtering and accumulating. The control loop may be a position, velocity, acceleration or force control loop. A programmable digital integrated circuit for compensating a velocity control loop having a filter section cascaded with an accumulator. The integrated circuit may include memory for storing filter coefficient(s) for the filter section, thereby not requiring external components.

A design method of high reliability digital circuit, convert netlist into hypergraph after getting netlist documents using traditional EDA design flow, a fine-grained division method based on hypergraph, allow designers describe circuit only through traditional EDA method, and allocate all kinds of fault defense technologies and all kinds of reliability index, namely add specified fault defense technology to the circuit automatically in order to get a digital integrated circuits of high reliability fault-tolerant circuit.

An electronic tester with digital, and analog, and memory test circuitry on a single platform. A test head is coupled to a device under test. The device under test can be a system-on-a-chip integrated circuit, a mixed signal integrated circuit, a digital integrated circuit, or an analog integrated circuit. Digital test circuitry applies digital test signals to the device under test coupled to the test head and receives digital outputs from the device under test in response to the digital test signals. Analog test circuitry applies analog test signals to the device under test coupled to the test head and receives analog outputs from the device under test in response to the analog test signals. Memory test circuitry applies memory test patterns to the device under test coupled to the test head and receives memory outputs from the device under test in response to the memory test patterns. A tester computer supervises the application of digital, analog, and memory test signals from the digital, analog, and memory test circuitry to the device under test such that signals applied to the device under test can be solely digital test signals, solely analog test signals, solely memory test signals, or mixed digital, analog, and memory test signals. The test head, the digital test circuitry, the analog test circuitry, the memory test circuitry, and the computer are operable as a single platform.

A method and apparatus is described which allows efficient optimization of integrated circuit designs. By performing a global analysis of the circuit and identifying bottleneck nodes, optimization focuses on the nodes most likely to generate the highest return on investment and those that have the highest room for improvement. The identification of bottleneck nodes is seamlessly integrated into the timing analysis of the circuit design. Nodes are given a bottleneck number, which represents how important they are in meeting the objective function. By optimizing in order of highest bottleneck number, the optimization process converges quickly and will not get side-tracked by paths that cannot be improved.

The invention discloses a voltage reference source capable of compensating in a full-temperature range, which particularly comprises a start-up circuit, a first-order temperature-compensation circuit, a proportional superposition output circuit and a current bias circuit, and is characterized by further comprising a low-temperature high-order compensation circuit, a high-temperature high-order compensation circuit and a negative feedback circuit. The voltage reference source adopts index curvature compensation at the low temperature, adopts piecewise linear curvature compensation at the high temperature, has extremely good temperature stability and extremely low temperature coefficient and can be applied to an analogue integrated circuit, a high-precision digital-to-analogue conversion circuit and a pure digital integrated circuit.

The invention discloses a resetting method and a resetting control device of a register inside a chip based on a scanning chain. The resetting method comprises the steps of: 1) respectively building at least one scanning chain for the register according to a resetting value 0 or 1 in a chip design stage; and 2) setting a scanning enabling signal of each register as valid and writing the resetting value into a head of the scanning chain in a chip use stage. The resetting control device comprises a scanning chain enabling control unit, a scanning chain clock control module and an input data selector which respectively outputs test data or the resetting value to the head of the scanning chain. The input terminal of the resetting control device comprises a test enabling terminal, a resetting signal input end, a test scanning enabling signal/work clock/resetting clock/test clock input end and a plurality of test data input terminals. According to the invention, the inner register of the chip can be efficiently reset so that influence on the performance of a digital integrated circuit chip is low, and the resetting method and the resetting control device have the advantages of high stability, small power consumption, simple structure and is convenient to implement.