131 results about "Timing closure" patented technology

A Digital Design Method which may be automated is for obtaining timing closure in the design of large, complex, high-performance digital integrated circuits. The methodincludes the use of a tuner on random logic macros that adjusts transistor sizes in a continuous domain. To accommodate this tuning, logic gates are mapped to parameterized cells for the tuning and then back to fixed gates after the tuning. Tuning is constrained in such a way as to minimize “binning errors” when the design is mapped back to fixed cells. Further, the critical sections of the circuit are marked in order to make the optimization more effective and to fit within the problem-size constraints of the tuner. A specially formulated objective function is employed during the tuning to promote faster global timing convergence, despite possibly incorrect initial timing budgets. The specially formulated objective function targets all paths that are failing timing, with appropriate weighting, rather than just targeting the most critical path. Finally, the addition of multiple threshold voltage gates allows for increased performance while limiting leakage power.

Functionality can be implemented for optimizing connection constraints in an integrated circuit design. A target timing path associated with a first of a plurality of sub-connections of the integrated circuit is determined. A timing probability value and a route probability value associated with the first of the plurality of sub-connections is determined based, at least in part, on the target timing path associated with the first of the plurality of sub-connections. The timing probability value indicates a probability that timing closure is satisfied on the target timing path. The route probability value indicates a probability that a physical routing track on the target timing path associated with the first of the plurality of sub-connections resolves congestion. A current connection constraint associated with the first of the plurality of sub-connections is modified in accordance with a connection constraint model to which the first of the plurality of sub-connections corresponds.

This disclosure relates generally to data decoding, and more particularly to iterative decoders for data encoded with a low-density parity check (LDPC) encoder. LDPC decoders are disclosed that use reduced-complexity circular shifters that may be used to decode predefined or designed QC-LDPC codes. In addition, methods to design codes which may have particular LDPC code performance capabilities and which may operate with such decoders using reduced-complexity circular shifters are provided. The generation of quasi-cyclic low density parity check codes and the use of circular shifters by LDPC decoders, may be done in such a way as to provide increased computational efficiency, decreased routing congestion, easier timing closure, and improved application performance.

In one embodiment, a method of designing an integrated circuit is disclosed, including receiving a first partition block for a top level of a hierarchical design of an integrated circuit; analyzing each pin of the first partition block for an attribute associated with the pin indicating a timing exception; and if a timing exception other than false path is indicated then generating an internal timing pin in a first timing graph model of the first partition block for each timing exception, and adding a timing arc and a dummy arc coupled to the internal timing pin in the first timing graph model of the first partition block. The internal timing pin adds a timing exception constraint for each timing exception. Timing of the top level may then be analyzed with the first timing graph model to determine if timing constraints, including the added timing exception constraints, are met.

A dummy filling method for a semiconductor manufacturing process provides a circuit pattern and generates a density report of the circuit pattern to identify a feasible area for dummy insertion. The method also includes using the density report to simulate a planarization manufacturing process and identifying hot spots on the circuit pattern, filling virtual redundant patterns in the feasible area, and then adjusting the density report. The method simulates the planarization process using the adjusted density report until the hot spot is removed. The invention can reduce the amount of redundant metal in circuit design and save photomask time, CPU time, and signal storage memory. This will help design timing closure (time closure) faster and easier.

A method for performing timing optimization of a detail routed netlist, incorporating statistical variability information, common path pessimism reduction, and capacitative coupling information, in a tightly coupled, incremental manner with minimal perturbations to the placement, routing, and asserted parasitic information. The method corrects violations in a placed and routed design of a VLSI circuit chip, where the design is represented by a netlist describing logical and physical characteristics of the design and by a corresponding timing graph, the method including the steps of: identifying violations in the design; iteratively eliminating the violations by incrementally transforming the logical and the physical characteristics of the design, incorporating in the design only legal placements and routes; and applying incremental timing to evaluate the transformations, and updating the existing timing graphs to reflect changes consisting of the legal placements and routes.

A temperature control for a Structured ASIC chip, manufactured using a CMOS process is shown. A circuit employing temperature feedback using a microprocessor and active heating elements, that in a preferred embodiment uses decoupling cell capacitors, is employed to actively heat a die when the temperature of the die drops below a predetermined minimum temperature, in order to achieve timing closure in the chip.

A selective IPO procedure based on the concept of a “timing violation potential” prioritizes the components and nets in a critical path. User input criteria is used to select the components or nets (or both) which have the larger “timing violation potential;” only those components and nets are then operated on. After a selective IPO step, the total number of critical paths is reduced, as well as the worst negative slacks (WNS) of the critical path compared to the traditional IPO method.

More “timing closure efficient” Timing Driven Placements by implementing our new net weight for negative slack paths to enhance timing closure behavior is provided by a NSRF (Negative Slack Recover Factor). This new weight would not be based on the absolute amount of negative slack in a path, but rather it would be based on the proportion or percentage of the path's total net delay adder that must be recovered in order to achieve timing closure (zero slack). After an initial or previous placement has been created, then a list of paths with timing violations with a Negative Slack Recover Factor (NSRF) is created for each net in each of the timing paths on the list of paths, and then calculating a NSRF net weight factor for use in subsequent placements and also assigning nets in the list of paths with no timing violations a NSRF default value of one.. The NSRF value is calculated as equaling (ZWLM slack value +negative slack value)/ZWLM slack value=(1+(negative slack value/ZWLM slack value)), where ZWLM is a Zero Wire Load Model (ZWLM) value of timing wherein all wire parasitics are removed from consideration in the timing.

A method for performing timing closure on VLSI chips in a distributed environment is described. Abstracting the physical and timing resources of a chip and providing an asynchronous method of updating that abstraction allows multiple partitions of a chip to be optimized concurrently. A global view of physical and timing resources is supplied to local optimizations which are applied concurrently to achieve timing closure. Portions of the hierarchy are optimized in separate processes. Partitioning of the chip is performed along hierarchical lines, with each process owning a single partition in the hierarchy. The processes may be executed by a single computer, or spread across multiple computers in a local network. While optimizations performed by a single process are only applied to its given portion of the hierarchy, decisions are made in the context of the entire hierarchy. These optimizations include placement, synthesis, and routing. The present method can also be expanded to include other resources, such as routing resource, power supply current, power/thermal budget, substrate noise budget, and the like, all of which being able to be similarly abstracted and shared.

The present invention provides a method, system and program product for mitigating effects of interconnect variability during a design stage of a chip. Under the technique of the present invention, a global and detailed routing of interconnects of the chip are determined. Thereafter, a dummy fill estimation and a grid based metal density estimation are performed. Then, based on a CMP model, a variable map of metal thicknesses is obtained. Based on the variable map, wiring nets of the chip that are sensitive to metal variability (e.g., that fail to meet timing closure due to metal thickness loss/gain in the CMP process) are identified. These wiring nets are then re-routed for optimization of the chip.

A system and method of designing an integrated circuit capable of deriving timing constraints for individual block-level circuits of an integrated circuit that are derived from the chip-level timing constraints and analysis. The block-level timing constraints are in the form of one or more logical timing constraint points at the input and output ports of block-level circuits. Each logical timing constraint points specifies a clock source used to clock data through the port, a delay parameter specifying data propagation delay backward from an input port and forward from an output port, and any timing exception associated with the data path. Using the logical timing constraint point, the circuit design system performs independent timing analysis and optimization of each block-level circuit. The system then reassembles the block-level circuits into a modified chip-level circuit for which timing closure can be achieved.

Achieving clock timing closure in designing an integrated circuit involves virtually synthesizing a clock network for the integrated circuit design to generate virtual clock buffering in the clock network before a point in the design flow at which the clock network is actually synthesized and committed to a netlist. Timing violations are determined for clock gates generated by the virtual clock buffering. Clock gating transforms are evaluated for the clock gates having the timing violations, based on recalculated clock and data path delays, to incrementally virtually synthesize the clock network. The clock gating transforms that result in the best timing gains are committed to the netlist. The clock network is then actually synthesized for the integrated circuit design, and design changes, due to the actual clock network synthesis, are committed to the netlist.

A method is taught for determining a calibrated wire load model. The calibrated wire load model can be used to reach timing closure for an integrated circuit. The method includes; determining a reference timing description; determining a wire load model based on synthesis; determining a wire load model based connectivity; comparing the wire load model based on connectivity to the reference timing description. The method teaches adjusting the wire load model based on connectivity to determine a wire load model which faciliates timing closure. The method also teaches comparing the wire load model (based on synthesis) with the reference timing description. The disclosure contemplates a computer program product based upon the method taught. The disclosure further contemplates an integrated circuit designed based on the method taught. In another embodiment a computer system or another electronic system includes an integrated circuit designed by the method taught.