Digital integrated circuit chip testing system

Abstract

The invention provides a test pattern-based testing system for realizing a functional test on a digital integrated circuit. The functional test is mainly used for testing logical functions of a chip under a certain timing sequence, and a basic principle is that the chip is excited by means of test patterns and whether the response of the chip is consistent with expected response is observed. The functional test can cover failure models of extremely high proportion logic circuits. A debugging technology supported one-step testing system comprises two parts, namely test pattern file conversion software applied to a personal computer (PC) and a digital integrated circuit chip testing machine, wherein the digital integrated circuit chip testing machine consists of architectures of a central processing unit (CPU) and a field programmable gate array (FPGA); the CPU is used for storing and converting pattern files, controlling the testing process, communicating with a host, and the like. A pattern controlling logic circuit is realized by an FPGA, the waveform generation, the control of Pattern random access memory (RAM) and sampling control are finished through the FPGA, and a drive and a comparator are controlled so as to test and control a tested object.

Description

technical field [0001] The invention relates to a test system and a test method for a small digital integrated circuit chip. Background technique [0002] The functional test mainly tests the logic function of the chip at a certain timing. The basic principle is to apply stimulus to the chip with the help of vectors and observe whether its response is consistent with the assumption. The functional test can cover the failure model of a very high proportion of logic circuits. No matter how complex the function of the digital integrated circuit is and how complicated the working conditions are, it can be regarded as a binary logic device. Therefore, most of the current test methods, whether it is fault location or functional testing, require the input of test vectors, and the digital integrated circuit test system is actually a platform for vector generation, test vector excitation to the object under test, and test result comparison . [0003] The so-called test vector is a ...

AI Technical Summary

Problems solved by technology

[0004] At present, most of the integrated circuit test systems have complex functions and cumbersome test operations. It is necessary to learn specialized technical knowledge to perform relevant test operations, and it is not easy to understand the test methods and processes.

In addition, the high test cost is also a waste for the test of some small and medium digital chips

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