Optical Device Spectral Response Measurement Method and Measurement Device Based on Double Sideband Modulation and Stimulated Brillouin Scattering Effect

Abstract

The invention discloses an optical device spectrum response measurement method based on double sideband modulation and stimulated Brillouin scattering effect, comprising steps of dividing an optical carrier wave which is outputted by a light source into two paths, performing frequency-beating in a photoelectric detector by a scanning frequency double sideband signal and a carrier having the frequency shifted after the signal passes through the optical device to be detected, obtaining two radio frequency signals which have two different frequencies and carry spectral response information of the optical device to be detected at the scanning frequency double sideband signal frequency position, using a radio frequency amplitude phase extraction module to respectively extract amplitude phase information of two radio frequency signals to obtain an amplitude-frequency response and a phase frequency response of the optical device to be detected at the optical detection signal frequency, changing the wavelength of the optical detection signal and repeating the above process to obtain the spectral vector response information of the optical device to be detected. The invention also discloses an optical device spectrum response measurement device based on the double sideband modulation. Compared with the prior art, the optical device spectrum response measurement method and measurement device greatly improve the measurement range and the measurement efficiency.

Description

technical field [0001] The invention relates to a method for measuring an optical device, in particular to a method and device for measuring the spectral response of an optical device based on double sideband modulation and stimulated Brillouin scattering effect, and belongs to the technical fields of optical device measurement and microwave photonics. Background technique [0002] The measurement of amplitude-frequency response and phase-frequency response (spectral response) of photonic devices is very critical for device manufacturing and system design. In recent years, with the rapid development of laser technology, photonic systems have been widely used, such as ultra-high-precision optical fiber sensing, long-distance optical fiber communication, etc. However, the development of optical measurement technology has stagnated, which not only makes it difficult to develop and manufacture high-precision optical devices, but also makes it impossible for existing optical devi...

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Problems solved by technology

However, the disadvantage of this method is that it can only measure the amplitude-frequency response, not the phase-frequency response.

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