Figure test method

A test method and graphics technology, applied in the field of testing, can solve the problems of expensive equipment and insufficient resolution of equipment

Active Publication Date: 2016-08-31
HANGZHOU SILAN AZURE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a graphic testing method to solve the problem of insufficient resolution of the equipment required for the existing graphic testing or the problem that the required equipment is expensive

Method used

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  • Figure test method
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Embodiment Construction

[0029] The graphic testing method proposed by the present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0030] Such as figure 2 As shown, the graphic testing method of the present embodiment comprises the following steps:

[0031] Step S1: The light beam emitted by the light source is converted by the optical path conversion system and then incident on a reference sample, and the detector obtains the reflectance of the reference sample according to the reflected light of the reference sample;

[0032] Step S2: The light beam emitted by the light source is converted by the op...

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Abstract

The invention provides a figure test method. The figure test method comprises the following steps: a light beam emitted by a light source is converted by a light path converting system, the converted light beam is incident on a reference sample wafer, and the reflectivity of the reference sample wafer can be obtained through a detector according to the reflected light of the reference sample wafer; a light beam emitted by the light source is converted by the light path converting system, the converted light beam is incident on a sample wafer to be tested, and the reflectivity of the sample wafer to be tested can be obtained through the detector according to the reflected light of the sample wafer to be tested; and the detector compares the reflectivity of the sample wafer to be tested with the reflectivity of the reference sample wafer in order to determine that whether the sample wafer to be tested is abnormal or not. The test method has the advantages of no requirements of the resolution of a test device, simplicity, easy operation, no special skill, and low cost.

Description

technical field [0001] The invention belongs to the testing field, in particular to a graphic testing method. Background technique [0002] LED has the advantages of health, energy saving and environmental protection in lighting applications, so it is widely used in display screens, LCD backlights, traffic lights, outdoor lighting and other fields, and has begun to apply to indoor lighting, automotive lights, stage lights, special lighting Different fields of application and more complex use environments pose higher challenges to the crystal quality, luminous brightness and luminous efficiency of LEDs. With the industrialization of patterned substrates, the crystal quality of the epitaxial layer in light-emitting diodes (LEDs) has been significantly improved, and accordingly, the luminous efficiency of LEDs has been greatly improved. The crystal quality and luminous brightness of LED are closely related to the graphic size of the patterned substrate. With the continuous ad...

Claims

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Application Information

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IPC IPC(8): G01N21/17
CPCG01N21/17
Inventor 李东昇丁海生马新刚
Owner HANGZHOU SILAN AZURE
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