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Large-scale spacecraft structure deformation measurement test system in vacuum and low temperature environment

A spacecraft structure, vacuum cryogenic technology, applied to measuring devices, instruments, scientific instruments, etc.

Active Publication Date: 2019-09-10
BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] However, there is no reliable micro-deformation measurement method and test system for large-scale spacecraft structures using photogrammetry technology in a vacuum and low-temperature environment in China.

Method used

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  • Large-scale spacecraft structure deformation measurement test system in vacuum and low temperature environment
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  • Large-scale spacecraft structure deformation measurement test system in vacuum and low temperature environment

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Embodiment Construction

[0029] The following introduces the specific implementation mode as the content of the present invention, and the content of the present invention will be further clarified through the specific implementation mode below. Of course, the following specific embodiments are described only to illustrate different aspects of the present invention, and should not be construed as limiting the scope of the present invention.

[0030] figure 1 It is a schematic diagram of the composition of the large-scale spacecraft structure deformation measurement test system in the vacuum and low temperature environment of the present invention. Among them, the large-scale spacecraft structure deformation measurement test system in the vacuum low-temperature environment includes a vacuum low-temperature test container 1, and the vacuum low-temperature test container 1 is a bedroom container with an inner diameter of Φ10m, which can provide a vacuum degree of 6× for large-scale spacecraft structures ...

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Abstract

The invention discloses a test system for deformation measurement of a large spacecraft structure under a vacuum and low-temperature environment. The test system includes a vacuum and low-temperature container, a portal supporting mechanism, a low-temperature cantilever moving mechanism, photogrammetry CCD camera and protection cabin assemblies, a test piece supporting mechanism, a low-temperature reference meter, a temperature and air pressure control system, a motion control system, and a measurement data acquisition and processing system; two sets of photogrammetry CCD camera and protection cabin assemblies are symmetrically hung at two ends of the low-temperature cantilever moving mechanism, and 3m-rotation radius and + / -360-degree-reciprocating rotary movement photographing can be realized under the vacuum and low-temperature environment so as to realize the deformation measurement of the large spacecraft structure. With the test system of the invention adopted, the thermal deformation measurement of a certain 5m large umbrella antenna can be completed under a simulated space environment by using photogrammetric techniques, and the repeatability precision of the measurement of spatial point positions can achieve 20 microns.

Description

technical field [0001] The invention belongs to the field of spacecraft micro-deformation measurement test in a simulated space environment, and in particular relates to a system for measuring thermal deformation of a large spacecraft structure in a vacuum and low-temperature environment. Background technique [0002] When a spacecraft is in orbit, the space environment changes drastically periodically, which will bring thermal deformation to the spacecraft structure. In addition, the release of gravity in the orbital environment of the spacecraft will also bring micro deformation to the spacecraft. For components that have high requirements for their own structural stability, this deformation will definitely affect their working performance, such as antennas, space telescopes, solar panels, etc. [0003] Taking the antenna as an example, to achieve high resolution, not only the area of ​​the antenna is large, the surface precision of the reflective surface is high, but also...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16G01N25/00
Inventor 张鹏嵩蒋山平杨林华张博伦王丹艺向艳红李竑松
Owner BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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