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Method and device for measuring surface reflectance of materials

A technology of surface reflectivity and reflection coefficient, applied in the measurement of scattering characteristics, etc., can solve the problem of cumbersome calculation process, and achieve the effect of increasing flexibility, reducing time and material costs, and ensuring accuracy.

Active Publication Date: 2018-10-16
GUANGXI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In order to calculate the reflectivity of the target model, white aluminum-plastic panels and black aluminum-plastic panels of the same plane size need to be covered in the model area, and the calculation process is very cumbersome

Method used

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  • Method and device for measuring surface reflectance of materials
  • Method and device for measuring surface reflectance of materials

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Embodiment Construction

[0024] The present invention will be further described in detail below in conjunction with the drawings, so that those skilled in the art can implement it with reference to the description.

[0025] It should be noted that the experimental methods described in the following embodiments, unless otherwise specified, are conventional methods, and the reagents and materials, if not otherwise specified, can be obtained from commercial sources; in the description of the present invention, The terms "landscape", "portrait", "top", "bottom", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", The orientation or positional relationship indicated by "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the referred device or element must have Certain orientations, constructed and...

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Abstract

The invention discloses a method and device for measuring material surface reflectivity. The method comprises arranging a pyranometer for receiving sunlight incident quantity Ii and reflection quantity Ir above a material to be detected, recording a vertical distance h between the lower dome of the pyranometer and the material to be detected, arranging a lampshade at the lower dome of the pyranometer, arranging a LED light in the center of the lower dome, turning on the LED light to adjust the size of a reflection aperture of the pyranometer, determining the radius R of the reflection aperture, turning off the LED light, recording sunlight incident quantity Ii, sunlight reflection quantity Ir and a reflection coefficient F, calculating a pavement relative emission rate Rho and calculating reflectivity. The method and device can fast detect reflectivity and save a time cost.

Description

technical field [0001] The invention relates to the technical field of testing devices. More specifically, the present invention relates to a method and apparatus for measuring the reflectivity of a material surface. Background technique [0002] Urban structure, including building walls, roads, etc. in the city. The rapid process of urbanization in my country has caused fundamental changes in the underlying surface of cities and intensified the urban heat island effect. At present, there are many ways to study the suppression of the heat island effect. One of them is to make a model by coating the building walls, roofs, roads, etc. with materials with high reflectivity to study whether the reflectivity of urban structures can be improved to reduce the heat island effect. However, the current instruments that use the reflectance of the receiving target not only need to be fixed in one position, but also include the reflectivity outside the target, which is not flexible eno...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/55
CPCG01N21/55
Inventor 覃英宏蒙德淼谭康豪
Owner GUANGXI UNIV
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