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A kind of X-ray grating phase-contrast imaging device and imaging method

A phase-contrast imaging and X-ray technology, applied in measuring devices, material analysis using radiation, material analysis using radiation diffraction, etc., can solve problems affecting the stability of the light field, grating life, heat vibration, instability, etc. Achieve uniform energy deposition and heat distribution, prolong service life and improve stability

Active Publication Date: 2019-10-22
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

These structures are composed of very small units, each of which has the same size. Generally speaking, the width is small, the height is large, and it has a relatively large aspect ratio. It is extremely unstable. If it is exposed to this for a long time, the absorbing structure will heat up and vibrate. Even deformed, seriously affecting the stability of the light field and the life of the grating

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  • A kind of X-ray grating phase-contrast imaging device and imaging method
  • A kind of X-ray grating phase-contrast imaging device and imaging method
  • A kind of X-ray grating phase-contrast imaging device and imaging method

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Embodiment Construction

[0053] In order to solve the above technical problems, the present invention proposes an X-ray grating phase contrast imaging device, which includes: an X-ray tube, a light source grating, a beam splitting grating, an analysis grating, and an X-ray detector.

[0054] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0055] figure 1 It is a structural schematic diagram of an embodiment of the X-ray phase contrast imaging device of the present invention. Such as figure 1 As shown, the device 10 includes an X-ray tube 11 , a source grating 12 , a sample stage - , a beam splitting grating 13 , an analysis grating 15 , and an X-ray detector 16 . The centers of all components are coaxial in the horizontal (z-axis in the figure), and the distance between the X-ray tube 11 and the so...

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Abstract

The invention discloses an X-ray optical grating phase-contrast imaging device and method. The X-ray optical grating phase-contrast imaging device comprises an X-ray tube (11), a source optical grating (12), a sample table (4), a beam splitting optical grating (13), an analysis optical grating (15) and an X-ray detector (16), wherein the centers of the parts are coaxial in the horizontal direction, the substrate faces of the source optical grating (12), the beam splitting optical grating (13) and the analysis optical grating (15) rightly face the X-ray tube (11). The placement directions of the three optical gratings are turned, a part of energy deposition borne by the absorbing portion absorbing periodic structures of the optical gratings in a traditional method is transferred to the substrate portions without change of existing correction step, acquisition method and information separation method, so that irradiation dose, energy deposition and heat distribution exerted to the substrates are more uniform, heat distribution vibration or even deformation brought by corresponding heat effects is reduced, the stability of a system is improved, and the service life of the optical gratings is prolonged.

Description

technical field [0001] The invention relates to the field of X-ray grating phase-contrast imaging, in particular to an X-ray grating phase-contrast imaging device and an imaging method. Background technique [0002] Compared with the traditional absorption-based imaging method, the X-ray phase contrast imaging method has attracted extensive attention since it was proposed because of its obvious advantages for low atomic number substances such as human soft tissue. Since the 1990s, X-ray phase contrast imaging mainly includes crystal interferometer method, diffraction enhanced method, coaxial method and grating interferometer method. Since the X-ray phase shift detection requires a relatively high coherence of the X-ray source, it was initially done on synchrotron radiation [1]. In 2006, inspired by the phase measurement of visible light, Pfeiffer et al. added a source grating to the original Talbot interferometer based on two gratings, and proposed a Talbot-Lau interferomet...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04G01N23/083G01N23/20
Inventor 刘刚胡仁芳昝贵彬韩华杰高昆陆亚林
Owner UNIV OF SCI & TECH OF CHINA
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