Unlock instant, AI-driven research and patent intelligence for your innovation.

A microwave and millimeter wave phase noise standard device based on photoelectric fusion technology

A phase noise, optoelectronic fusion technology, applied in measuring devices, parts of electrical measuring instruments, measuring electricity, etc., can solve the problem of low comparison measurement accuracy, no phase noise measurement result accuracy calibration, and inability to immediately obtain measurements. results, etc., to achieve the effect of high dynamic range and high traceability

Active Publication Date: 2019-03-08
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a microwave and millimeter wave phase noise standard device based on photoelectric fusion technology, to solve the problem that the phase noise measurement system in the existing microwave and millimeter wave frequency range cannot be traced back to the source, specifically as follows: 1. Calibrate the accuracy of the phase noise measurement results within the analysis frequency range; 2. The accuracy of the comparison measurement is not high, and the measurement uncertainty is 3dB; 3. The measurement results cannot be obtained immediately. come to conclusion

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A microwave and millimeter wave phase noise standard device based on photoelectric fusion technology

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0023] Such as figure 1 As shown, the microwave and millimeter wave phase noise standard device based on photoelectric fusion technology provided in this embodiment includes: baseband signal generator 1, noise modulator 2, harmonic generator 3 based on optical comb, intermediate frequency generator 4, high Frequency extension module 5, low frequency extension module 6 and local oscillator 7 based on OEO point frequency;

[0024] The output end of the baseband signal generator 1 is connected with the input end of the noise...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a microwave and millimeter wave phase noise standard unit based on a photoelectric fusion technology. The microwave and millimeter wave phase noise standard unit includes a baseband signal generator which outputs frequency fine resolution signal; a noise modulator which performs noise modulation on the frequency fine resolution signal, and generates a baseband phase noise standard after noise modulation; an optical comb-based harmonic generator which outputs a plurality of harmonic signals; an intermediate frequency generator which generate an intermediate frequency signal according to the baseband phase noise standard and the plurality of harmonic signals; an OEO dot frequency-based local oscillator which generates a local oscillator signal; a high-frequency extension module which generates a phase noise standard of high-frequency microwaves and millimeter waves according to the intermediate frequency signal and the local oscillator signal; and a low-frequency extension module which generates a phase noise standard of low-frequency microwaves and millimeter waves according to the intermediate frequency signal and the local oscillator signal. The microwave and millimeter wave phase noise standard unit based on the photoelectric fusion technology is suitable for calibration of a phase noise measurement system in a microwave and millimeter wave frequency range, and can solve the problem that a microwave and millimeter wave phase noise measurement system cannot trace to the source at present.

Description

technical field [0001] The invention relates to a microwave and millimeter wave phase noise standard device. More specifically, it relates to a microwave and millimeter wave phase noise standard device based on photoelectric fusion technology. Background technique [0002] The current phase noise measurement devices on the market mainly include the imported HP3047A, HP3048A, E5500 series and PN9000, etc. The components of these devices mainly include phase detectors, phase-locked loops, low-noise amplifiers, data acquisition and computers. According to the national military standard GJB / G3414-98 "Phase Noise Test System Verification Regulations", some of its indicators can be calibrated / verified, but the accuracy of the phase noise measurement results of the phase noise measurement system cannot be calibrated / verified. At present, only the NIST laboratory has established a microwave and millimeter wave phase noise standard device in the world, which consists of a dielectric...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00G01R1/28
CPCG01R1/28G01R35/007
Inventor 阎栋梁柳丹
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More