School teaching quality big data analysis system

A technology of teaching quality and analysis system, which is applied in the field of analysis system, can solve the problems of heavy workload, difficult implementation, and teachers' inability to know the teaching quality intuitively, so as to achieve the effect of improving the teaching quality

Inactive Publication Date: 2017-06-27
SHANGHAI YIDIAN XINSEN TECH DEV CO LTD
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AI Technical Summary

Problems solved by technology

[0002] Teachers in existing schools have different explanation methods for different knowledge points, but teachers cannot intuitively know their own teaching quality, and thus cannot use appropriate teaching methods to improve teaching results;
[0003] Existing schools use the test paper review system to review test papers. Although teachers can artificially count the knowledge points that students generally fail to answer correctly in the test papers and test questions, and then know their own teaching quality, the workload is too heavy and it is not easy to implement

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  • School teaching quality big data analysis system
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Embodiment Construction

[0042] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific diagrams.

[0043] see figure 1, the school teaching quality big data analysis system, including a test paper review system, a knowledge point classification system, a wrong question statistics system, a teaching quality evaluation system; The title of the test question is used as the wrong title; and the error rate of each wrong title extracted is counted from all student test papers; the knowledge point classification system is set with a list of test question categories, and the test question labels based on the same knowledge point are classified in the test question classification In a knowledge point item in the category list; the wrong question statistics system adds up the error rates of all test titles in a knowledge point item to obtain the overall err...

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Abstract

The invention relates to the electronic technology field. The school teaching quality big data analysis system comprises a test paper review system, a knowledge point classification system, a wrongly-answered question statistics system and a teaching quality evaluation system, wherein the test paper review system is used for extracting mark numbers of wrongly-answered questions of each student test paper, statistics of all the student test papers is carried out, and an error rate of each wrongly-answered question mark number is extracted; the knowledge point classification system is provided with a question classification category list, and question mark numbers based on one knowledge point are classified to one knowledge point item of the question classification category list; the wrongly-answered question statistics system is used for summing error rates of all the question mark numbers of one knowledge point item to acquire a total error rate of the knowledge point item; the teaching quality evaluation system is used for evaluating teaching quality of each knowledge point explained by a teacher. The system is advantaged in that teaching quality of a certain knowledge point explained by the teacher can be visually known by the teacher, an explanation mode of the teaching for explaining the knowledge point can be changed at the next time, and the teacher is facilitated to improve teaching quality.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to an analysis system. Background technique [0002] Teachers in existing schools have different explanation methods for different knowledge points, but teachers cannot intuitively know their own teaching quality, and thus cannot use appropriate teaching methods to improve teaching results; [0003] Existing schools use the test paper review system to review test papers. Although teachers can artificially count the knowledge points that students generally fail to answer correctly in the test papers and test questions, and then know their own teaching quality, the workload is too heavy and it is not easy to implement. Contents of the invention [0004] The purpose of the present invention is to provide a school teaching quality big data analysis system to solve at least one of the above technical problems. [0005] The technical problem solved by the present invention can adop...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q50/20
Inventor 刘峻范梦君陈修明姚海琪
Owner SHANGHAI YIDIAN XINSEN TECH DEV CO LTD
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