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Apparatus and method for static gas mass spectrometry

A technology of mass spectrometry and gas mass spectrometer, applied in the field of static gas mass spectrometry

Active Publication Date: 2017-12-12
THERMO FISHER SCI BREMEN
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Today, this fundamental limitation contributes to one of the major uncertainties in mass spectrometry of passive gas isotope ratios

Method used

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  • Apparatus and method for static gas mass spectrometry
  • Apparatus and method for static gas mass spectrometry
  • Apparatus and method for static gas mass spectrometry

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Embodiment Construction

[0048] In order that the invention can be understood in more detail, embodiments will now be described, by way of example and with reference to the accompanying drawings.

[0049] refer to image 3 , which schematically represents a typical configuration of a static mass spectrometer 200 that can be used in the present invention, including: a sample preparation area 205 , a delivery area 230 , an ion source area 240 and a mass analyzer 250 . The sample preparation area 205 includes a chamber 210 (eg, a boiler or laser radiation chamber) and an optional preparation station 220 . Valves 215 are provided between each of boiler 210 , sample preparation station 220 , transfer region 230 , and ion source region 240 .

[0050] Indirectly enters the static mass spectrometer 200 via the intermediate chamber. A normal application is to determine the isotope ratios of various isotopes of an inert gas in a sample (eg a piece of rock or the like).

[0051] In current instruments, a samp...

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Abstract

A method of static gas mass spectrometry is provided. The method includes the steps of: introducing a sample gas comprising two or more isotopes to be analyzed into a static vacuum mass spectrometer at a time, t0; operating an electron impact ionization source of the mass spectrometer with a first electron energy below the ionization potential of the sample gas for a first period of time that is following t0until a time t1; and operating the electron impact ionization source with a second electron energy at least as high as the ionization potential of the sample gas for a second period of time that is after time t1. The first time period from t0 to t1 is a period corresponding to a period taken for the isotopes of the sample gas to equilibrate in the mass spectrometer. A constant ion source temperature is preferably maintained. Also provided is a static gas mass spectrometer.

Description

technical field [0001] The present invention relates to the field of mass spectrometry. In particular, the invention relates to static gas mass spectrometry, for example, for isotope ratio measurements. The present invention is applicable to inert gases (also known as noble gases or noble gases), namely helium (He), neon (Ne), argon (Ar), krypton (Kr), xenon (Xe) and radon (Rn) and other gases such as CO 2 or N 2 ) stable isotope analysis. Both methods and apparatus. Background technique [0002] Passive gas mass spectrometry is critical for radiometric dating or isotope geochemistry (for example, argon-argon dating and helium or xenon isotope analysis). Inert gas mass spectrometry typically uses a static gas mass spectrometer, where a gaseous sample containing an inert gas or gas of interest is fed into the mass spectrometer and then left in the spectrometer without pumping during mass analysis. A characteristic feature of a static mass spectrometer is therefore that ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/62
CPCG01N27/62H01J49/147H01J49/30H01J49/28H01J49/0422H01J49/0468H01J49/24
Inventor J·施韦特斯D·汉密尔顿
Owner THERMO FISHER SCI BREMEN
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