26results about "Static spectrometers" patented technology

Embodiments provide for an ion mass spectrometer. An example ion mass spectrometer includes a laminated collimator, a laminated electrostatic analyzer (ESA) positioned downstream from the laminated collimator, a magnetic sensor analyzer positioned downstream from the laminated ESA, and a position sensitive cross-delay anode (XDL) assembly having a micro-channel plate (MCP) and a cross delay-line (XDL) anode.

A method that includes accelerating ions toward a lattice of carbon fibers and capturing the ions in the lattice of carbon fibers.

Embodiments relate to an apparatus, method, or computer program. A laser may be configured to irradiate a plurality of laser pulses on a target area to ionize a sample placed in the target area into at least one ionized particle. Electrodes at a first end of a flight tube may be configured to accelerate ionized particles into the flight tube. A detector at a second opposite end of the flight tube may independently measure a time of flight of the ionized particles through the flight tube and an intensity of the ionized particles.

A mass spectrometer comprises an ion source 10 (Figure 1), a mass pre‐filter 20 downstream of the ion source, a collision cell 30 (Figure 1), at least one mass filter downstream of the collision cell,

Determining operational parameters of a spectrometer comprising an electron impact ion source. In ON and OFF mode respectively there are a first and a second set of operational parameters The first an

An ion beam filter for receiving, from an ion source, a beam of ions and for transmitting ions selected from the beam of ions, the ion beam filter extending along an ion optical axis. A pair of ion optical devices is spaced along the ion optical axis and comprising a first ion optical device configured to spread the ion beam and a second ion optical device configured arranged downstream of the first ion optical device and arranged to recombine constituents of the spread beam into a single narrowed beam. A mass defining filter aperture (e.g., slit) is located between first and second ion optical devices. An array of ion optical lenses is arranged between the first ion optical device and the mass defining filter aperture (e.g., slit) and arranged between the mass defining aperture (e.g., slit) and the second ion optical device. A first ion optical lens of the array of ion optical lenses is configured to cause the paths of the ions in the beam to become substantially parallel between the first ion optical lens and second ion optical lens at the location of the mass defining filter aperture (e.g., slit).

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

A method of determining an expected response to injecting a beam of ions of a species of interest into a static field mass filter of a mass spectrometer including a mass analyser is provided. The method includes: measuring an intensity of ions injected into the static field mass filter for various combinations of test ion species, test magnetic field strengths, and test electric field strengths; determining electric field strengths corresponding to an intensity equal to a first and a second fraction of the measured peak intensity; based on a predetermined relationship between magnetic field strength, electric field strength and centre mass of the static field mass filter, determining mass values corresponding to the determined electric field strengths; and interpolating, from said mass values and for each ion species and for at least one of the test magnetic field strengths, expected mass values for an ion species of interest.

The invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer, wherein the time-of-flight mass spectrometer is housed within the vacuum chamber. The time-of-flight mass spectrometer comprises a first electrode and a second electrode spaced apart a distance therebetween defining a portion of an ion flight path. The assembly further comprises a first support for supporting the first electrode, the first support being arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to allow relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The invention further relates to a multi-reflecting time-of-flight mass analyzer. The invention further relates to an apparatus for degassing by heating and subsequently cooling a surface within a vacuum chamber to remove contaminants from the surface.

To provide a leak detector which is configured to detect leakage by introducing hydrogen gas leaking form a test piece to an analysis tube and to provide sufficient measurement accuracy in a short time by facilitating stabilization of background and significantly reducing the time required for background recovery.SOLUTION: An analysis tube 100 provided herein comprises an ion source portion 1 for ionizing hydrogen gas introduced thereto to generate hydrogen ions, an ion collector portion 2 for detecting the amount of hydrogen ion current, and re-inflow suppression structures 71, 72, 73 for preventing hydrogen gas generated by the ions by being uncharged by the ion collector portion 2 from reflowing into the ion source portion 1.SELECTED DRAWING: Figure 5

Provided is a metal purification device and method based on a mass-to-charge ratio difference. The metal purification device includes a vacuum chamber, and an ion excitation chamber and an electromagnetic separation chamber that are arranged in the vacuum chamber. The ion excitation chamber and the electromagnetic separation chamber are arranged side by side. The vacuum chamber is configured to provide a vacuum purification environment or an inert gas-filled purification environment. The ion excitation chamber is configured to excite an impurity-containing metal sample to produce ionized atoms with different mass-to-charge ratios. A plurality of collectors are provided in the electromagnetic separation chamber, and the electromagnetic separation chamber is configured to provide an electric field and a magnetostatic field. Electric field forces generated by the electric field cooperate with Lorentz forces generated by the magnetostatic field to control the ionized atoms with the different mass-to-charge ratios to enter different collectors.

A system for trapping ions for measurement thereof may include an electrostatic linear ion trap (ELIT), a source of ions to supply ions to the ELIT, a processor operatively coupled to ELIT, and a memory having instructions stored therein executable by the processor to produce at least one control signal to open the ELIT to allow ions supplied by the source of ions to enter the ELIT, determine an ion inlet frequency corresponding to a frequency of ions flowing from the source of ions into the open ELIT, generate or receive a target ion charge value, determine an optimum threshold value as a function of the target ion charge value and the determined ion inlet frequency, and produce at least one control signal to close the ELIT when a charge of an ion within the ELIT exceeds the optimum threshold value to thereby trap the ion in the ELIT.

The objective of the present invention is to manufacture an acceleration device and a mass analysis device inexpensively and with a compact size, enabling them to be used by any person. The mass analysis device (300) is configured from a plurality of substrates, including a first main substrate (301), a first upper substrate (302) adhered to the upper surface of the first main substrate (301), and a first lower substrate (303) adhered to the lower surface of the first main substrate (301). A mass analysis chamber (308) is a passage formed in the first main substrate (301) and running from the upper surface of the first main substrate (301) to the lower surface of the first main substrate (301), and enclosed in the direction perpendicular to the substrate surfaces (the Z direction) by the upper substrate (302) and the lower substrate (303), enclosed on both sides in the direction (the direction X) which is orthogonal to the Z direction and is the direction of advance of charged particles (318) by first main substrate side plates (301-4, 301-5), and enclosed on both side surfaces in the direction (the Y direction) orthogonal to the Z direction and the X direction by the first main substrate (301). A center hole (310-4) is opened in the first main substrate side plate (301-4) to which the charged particles (318) are incident, and the charged particles (318) enter the mass analysis chamber (308) from the center hole (310-4) formed in the first main substrate side plate (301-4).

To provide an accelerator and a mass spectroscope, which can be miniaturized and manufactured in a low cost, and are available by anyone.SOLUTION: In each of a mass spectroscope and an accelerator, which is structured by a plurality of substrates containing a first main substrate, a first upper substrate adhered onto an upper face of the first main substrate, and a first lower substrate adhered onto a lower face of the first main substrate, a penetration chamber is formed in the first main substrate, and is penetrated to the lower face of the first main substrate from the upper face of the first main substrate, a vertical direction (a Z direction) of the substrate surface is surrounded by an upper substrate and a lower substrate, and both sides which are a right angle direction with the Z direction and of a charged particle and a traveling direction (an X direction) of a charged particle are surrounded by the first main substrate, and both side faces which have a right angle direction (a Y direction) to the Z direction and the X direction are surrounded by the first main substrate. A central hole of a first main substrate side board, which is incident to the charged particle is opened, and the charged particle is incident to a mass analysis chamber or an acceleration chamber from the central hole formed on the first main substrate side board.SELECTED DRAWING: Figure 1

A mass spectrometer comprises an ion source, a static mass pre-filter downstream of the ion source, a collision cell downstream of the static mass pre-filter, at least one mass analyzer downstream of the collision cell, and at least one ion detector downstream of the at least one mass analyzer. The static mass pre-filter (20) comprises a first magnetic sector unit (21) for separating ions into partial ions beams (2), a second magnetic sector unit (22) for merging the partial ion beams, and a slit (23) arranged between the first magnetic sector unit and the second magnetic sector unit for selectively passing partial ion beams (2). The partial ion beams (2) may be symmetric relative to a plane (S) perpendicular to the partial ion beams.

The application discloses a magnetic field scanning device and a magnetic mass spectrometer. The magnetic field scanning device comprises a magnetic assembly and a control assembly. The number of turns of a main coil in the magnetic assembly is less than the number of turns of an auxiliary coil. A first main coil and a second main coil in a magnetic core unit are connected in series, which are a main magnetic unit. A first auxiliary coil and a second auxiliary coil are connected in series, which are an auxiliary magnetic unit. The control assembly is electrically connected with the main magnetic unit and the auxiliary magnetic unit respectively. The control assembly is used for adjusting the current of the main magnetic unit and adjusting the current in the auxiliary magnetic unit, so as to adjust the magnetic field intensity of the electromagnetic field between the first end and the second end, and then realize the magnetic field scanning. When the magnetic field is rapidly scanned, the combination control of the main magnetic unit and the auxiliary magnetic unit can make the magnetic field intensity rapidly and stably reach the required setting value.

A method of determining an expected response (e.g. a transmission or bandpass characteristics) of a mass filter disclosed. The mass filter may be a static field mass filter comprising two Wien filters

This invention discloses an electrical control system for a dual-focusing mass spectrometer and the spectrometer itself, including a control computer and a power supply module. The control computer sends setting commands to the power supply module, which includes an analytical electromagnet power supply unit and an electrostatic analyzer power supply unit. The analytical electromagnet power supply unit converts external power into a corresponding drive current and supplies it to the analytical electromagnet according to the setting commands from the control computer, and adjusts the drive current according to the actual magnetic field strength of the analytical electromagnet. The electrostatic analyzer power supply unit converts external power into a corresponding set voltage and supplies it to the electrostatic analyzer according to the setting commands from the control computer, and adjusts the set voltage according to the actual electric field strength of the electrostatic analyzer. This invention at least solves the problem of low stability and reliability of the electrical control system in dual-focusing mass spectrometers in related technologies.

The invention relates to the technical field of instruments and meters, in particular to a small-sized double-focusing mass spectrum imaging system for space and a use method, the system comprises an ion source, a coding plate, an electrostatic analyzer, a magnetic analyzer and an FOP detector, the ion source adopts a symmetrical magnetic field structure, and a cathode emission device and a hot filament are respectively located at two ends of the ion source; the coding plate is arranged right in front of the ion source; the electrostatic analyzer is composed of two coaxial cylindrical electrodes; the magnetic field structure of the magnetic analyzer is a direct asymmetric fan-shaped magnetic field; the electrostatic analyzer and the magnetic analyzer are combined in a reverse serial connection manner; the FOP detector adopts a micro-channel plate + fluorescent screen + CMOS camera imaging mode. According to the invention, the limitation of large sizes of ion beams and imaging light spots thereof under a conventional single-slit outlet structure of a mass spectrometer is overcome by adopting a coding aperture mode, so that the mass resolution of the mass spectrum imaging device is remarkably improved, the sensitivity is high, the imaging speed is high, the signal-to-noise ratio is high, and the detection of lower-content substances is realized.

The invention relates to the technical field of magnetic deflection mass spectrometers and magnetic analyzers, and discloses a high-resolution magnetic deflection mass spectrometer magnetic analyzer which comprises an analyzer shell, and a vacuum cavity for ion movement is formed in the analyzer shell. According to the high-resolution magnetic deflection mass spectrometer magnetic analyzer, through the inlet slit, the middle slit and the outlet slit which are sequentially arranged along an ion deflection track, an ion beam firstly passes through the narrower inlet slit, ions with smaller spatial dispersity are preliminarily screened out, and then the ions enter the magnetic field; the ions pass through a middle slit and an outlet slit which are also narrower to complete a 180-degree semicircular deflection track and then reach a receiver, and inlet-middle-outlet three-stage cooperative limiting holes jointly form three-stage space screening, so that the ions which deviate from an ideal track due to energy and angle dispersion can be gradually filtered in stages; ions deviating from an ideal track due to energy and angle dispersion are effectively filtered out, and compared with single screening of a traditional design, the mass resolution of an instrument is effectively improved.

An apparatus includes a first surface, a second surface, and a controller. The first and second surfaces define a first ion channel between them. The second surface includes a first plurality of electrodes having spaced-apart first and second electrodes, and is configured to receive a first voltage signal and generate a pseudopotential to inhibit ions in the first ion channel from approaching the second surface. The second plurality of electrodes are located between the first and second electrodes and are configured to receive a second voltage signal to generate a first travel drive potential configured to guide ions along the first ion channel. The controller is configured to generate the first and second voltage signals.

The application discloses a neutral atom detection device suitable for a wide energy range, which comprises: an ionization deflection system for ionizing neutral atoms incident from space into positively charged ions, capable of shielding charged particles incident from space, the ionization deflection system having a first detection channel and a second detection channel arranged at intervals along a first direction; the first detection channel and the second detection channel are both arranged as gaps formed by a set of oppositely arranged deflection plates; the voltage polarity of adjacent deflection plates between the two sets of deflection plates is the same; and an electrostatic analyzer comprising an outer hemisphere and an inner hemisphere, the outer hemisphere and the inner hemisphere having a third channel therebetween, the third channel being used for the deflection movement of the entering positively charged ions, and the voltage applied by the inner hemisphere being used for the energy analysis of the positively charged ions entering the third channel; the energy range of the neutral atoms suitable for detection by the first detection channel is below 5keV, and the energy range of the neutral atoms suitable for detection by the second detection channel is below 30keV.

A device and method for recording spectral information of charged particle beams, such as ion beams, or of light beams, at a high resolution. Specifically, a mass spectrometer having a focal plane detector. The device and method enable the recording of mass spectral data at both high mass resolving power and mass accuracy, during parallel acquisition of potentially the entire spectrum of a sample beam.

A cleanliness monitor, an evaluation system, and a method. The cleanliness monitor can include a first vacuum chamber, a second vacuum chamber, a molecular collector, a release unit, a mass spectrometer, a manipulator configurable to move the molecular collector from a first position to a second position, and an analyzer. The mass spectrometer can have a line of sight to an interior space of the second vacuum chamber. The mass spectrometer can be configured to monitor the interior space of the second vacuum chamber and generate a detection signal indicative of contents of the interior space of the second vacuum chamber. A first subset of the detection signal can be indicative of a presence of at least a subset of the released organic molecules. The analyzer can be configured to determine a cleanliness of at least one of (a) the first vacuum chamber and (b) a vacuum chamber under test based on the detection signal. The vacuum chamber under test is fluidically coupled to the first vacuum chamber.

The mass spectrometer includes an ion source, a static mass prefilter downstream of the ion source, a collision cell downstream of the static mass prefilter, at least one mass analyzer downstream of the collision cell, and at least one ion detector downstream of the at least one mass analyzer. The static mass prefilter (20) comprises a first magnetic sector unit (21) for separating ions into partial ion beams (2), a second magnetic sector unit (22) for combining partial ion beams, and a slit (23) disposed between the first magnetic sector unit and the second magnetic sector unit for selective passage of partial ion beams (2). The partial ion beam (2) may be symmetrical with respect to a plane (S) perpendicular to the partial ion beam.