11results about "Static spectrometers" patented technology

A mass spectrometer comprises an ion source 10 (Figure 1), a mass pre‐filter 20 downstream of the ion source, a collision cell 30 (Figure 1), at least one mass filter downstream of the collision cell,

Determining operational parameters of a spectrometer comprising an electron impact ion source. In ON and OFF mode respectively there are a first and a second set of operational parameters The first an

The invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer, wherein the time-of-flight mass spectrometer is housed within the vacuum chamber. The time-of-flight mass spectrometer comprises a first electrode and a second electrode spaced apart a distance therebetween defining a portion of an ion flight path. The assembly further comprises a first support for supporting the first electrode, the first support being arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to allow relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The invention further relates to a multi-reflecting time-of-flight mass analyzer. The invention further relates to an apparatus for degassing by heating and subsequently cooling a surface within a vacuum chamber to remove contaminants from the surface.

To provide a leak detector which is configured to detect leakage by introducing hydrogen gas leaking form a test piece to an analysis tube and to provide sufficient measurement accuracy in a short time by facilitating stabilization of background and significantly reducing the time required for background recovery.SOLUTION: An analysis tube 100 provided herein comprises an ion source portion 1 for ionizing hydrogen gas introduced thereto to generate hydrogen ions, an ion collector portion 2 for detecting the amount of hydrogen ion current, and re-inflow suppression structures 71, 72, 73 for preventing hydrogen gas generated by the ions by being uncharged by the ion collector portion 2 from reflowing into the ion source portion 1.SELECTED DRAWING: Figure 5

To provide an accelerator and a mass spectroscope, which can be miniaturized and manufactured in a low cost, and are available by anyone.SOLUTION: In each of a mass spectroscope and an accelerator, which is structured by a plurality of substrates containing a first main substrate, a first upper substrate adhered onto an upper face of the first main substrate, and a first lower substrate adhered onto a lower face of the first main substrate, a penetration chamber is formed in the first main substrate, and is penetrated to the lower face of the first main substrate from the upper face of the first main substrate, a vertical direction (a Z direction) of the substrate surface is surrounded by an upper substrate and a lower substrate, and both sides which are a right angle direction with the Z direction and of a charged particle and a traveling direction (an X direction) of a charged particle are surrounded by the first main substrate, and both side faces which have a right angle direction (a Y direction) to the Z direction and the X direction are surrounded by the first main substrate. A central hole of a first main substrate side board, which is incident to the charged particle is opened, and the charged particle is incident to a mass analysis chamber or an acceleration chamber from the central hole formed on the first main substrate side board.SELECTED DRAWING: Figure 1

A mass spectrometer comprises an ion source, a static mass pre-filter downstream of the ion source, a collision cell downstream of the static mass pre-filter, at least one mass analyzer downstream of the collision cell, and at least one ion detector downstream of the at least one mass analyzer. The static mass pre-filter (20) comprises a first magnetic sector unit (21) for separating ions into partial ions beams (2), a second magnetic sector unit (22) for merging the partial ion beams, and a slit (23) arranged between the first magnetic sector unit and the second magnetic sector unit for selectively passing partial ion beams (2). The partial ion beams (2) may be symmetric relative to a plane (S) perpendicular to the partial ion beams.

A method of determining an expected response (e.g. a transmission or bandpass characteristics) of a mass filter disclosed. The mass filter may be a static field mass filter comprising two Wien filters

This invention discloses an electrical control system for a dual-focusing mass spectrometer and the spectrometer itself, including a control computer and a power supply module. The control computer sends setting commands to the power supply module, which includes an analytical electromagnet power supply unit and an electrostatic analyzer power supply unit. The analytical electromagnet power supply unit converts external power into a corresponding drive current and supplies it to the analytical electromagnet according to the setting commands from the control computer, and adjusts the drive current according to the actual magnetic field strength of the analytical electromagnet. The electrostatic analyzer power supply unit converts external power into a corresponding set voltage and supplies it to the electrostatic analyzer according to the setting commands from the control computer, and adjusts the set voltage according to the actual electric field strength of the electrostatic analyzer. This invention at least solves the problem of low stability and reliability of the electrical control system in dual-focusing mass spectrometers in related technologies.

The invention relates to the technical field of magnetic deflection mass spectrometers and magnetic analyzers, and discloses a high-resolution magnetic deflection mass spectrometer magnetic analyzer which comprises an analyzer shell, and a vacuum cavity for ion movement is formed in the analyzer shell. According to the high-resolution magnetic deflection mass spectrometer magnetic analyzer, through the inlet slit, the middle slit and the outlet slit which are sequentially arranged along an ion deflection track, an ion beam firstly passes through the narrower inlet slit, ions with smaller spatial dispersity are preliminarily screened out, and then the ions enter the magnetic field; the ions pass through a middle slit and an outlet slit which are also narrower to complete a 180-degree semicircular deflection track and then reach a receiver, and inlet-middle-outlet three-stage cooperative limiting holes jointly form three-stage space screening, so that the ions which deviate from an ideal track due to energy and angle dispersion can be gradually filtered in stages; ions deviating from an ideal track due to energy and angle dispersion are effectively filtered out, and compared with single screening of a traditional design, the mass resolution of an instrument is effectively improved.

An apparatus includes a first surface, a second surface, and a controller. The first and second surfaces define a first ion channel between them. The second surface includes a first plurality of electrodes having spaced-apart first and second electrodes, and is configured to receive a first voltage signal and generate a pseudopotential to inhibit ions in the first ion channel from approaching the second surface. The second plurality of electrodes are located between the first and second electrodes and are configured to receive a second voltage signal to generate a first travel drive potential configured to guide ions along the first ion channel. The controller is configured to generate the first and second voltage signals.

A device and method for recording spectral information of charged particle beams, such as ion beams, or of light beams, at a high resolution. Specifically, a mass spectrometer having a focal plane detector. The device and method enable the recording of mass spectral data at both high mass resolving power and mass accuracy, during parallel acquisition of potentially the entire spectrum of a sample beam.