38results about "Static spectrometers" patented technology

Embodiments provide for an ion mass spectrometer. An example ion mass spectrometer includes a laminated collimator, a laminated electrostatic analyzer (ESA) positioned downstream from the laminated collimator, a magnetic sensor analyzer positioned downstream from the laminated ESA, and a position sensitive cross-delay anode (XDL) assembly having a micro-channel plate (MCP) and a cross delay-line (XDL) anode.

A method that includes accelerating ions toward a lattice of carbon fibers and capturing the ions in the lattice of carbon fibers.

The present invention discloses an ion source for a rare gas isotope mass spectrometer, comprising a cathode assembly and an electron receiving stage assembly, an ionization box, a repeller, an extraction focusing lens group, and an ion source fixing seat. The cathode assembly and the electron receiving stage assembly are respectively fixed at the upper and lower ends of the ionization box, the repeller is fixed at the rear end of the ionization box, the extraction focusing lens group is at the front end of the ionization box, the extraction focusing lens group is connected to the ionization box via a connecting porcelain column to achieve fixation and insulation, the extraction focusing lens group is composed of a pull-out electrode, a z focusing electrode, a grounding electrode, a y focusing electrode, and an exit slit arranged in sequence, the extraction focusing lens group realizes extraction and focusing of sample ions in the ionization box, the other end of the connecting porcelain column is connected to the ion source fixing seat, the center of the ion source fixing seat has an exit slit, the structure is simple, the number of pole pieces is small, the internal volume is small, and the sensitivity is greatly improved. The repeller and extraction focusing system has high ion extraction efficiency and good focusing effect.

A method of determining an expected response to injecting a beam of ions of a species of interest into a static field mass filter of a mass spectrometer comprising a mass analyser is provided. The method comprises: measuring an intensity of ions injected into the static field mass filter for various combinations of test ion species, test magnetic field strengths, and test electric field strengths; determining electric field strengths corresponding to an intensity equal to a first and a second fraction of the measured peak intensity; based on a predetermined relationship between magnetic field strength, electric field strength and centre mass of the static field mass filter, determining mass values corresponding to the determined electric field strengths; and interpolating, from said mass values and for each ion species and for at least one of the test magnetic field strengths, expected mass values for an ion species of interest.

The gas analyzer system uses an ion source that can be a hot cathode ion source. A positioning magnet assembly is used to define a magnetic field, and the magnet assembly allows the separation of ion components based on the mass-to-charge ratio of their ions. An ion beam deflector, such as a pair of deflection plates, can be used to scan the ion components across the detector. The ion beam deflector defines a deflection electric field across the magnetic field and across the direction of travel of the ions emitted by the ion source.

Embodiments relate to an apparatus, method, or computer program. A laser may be configured to irradiate a plurality of laser pulses on a target area to ionize a sample placed in the target area into at least one ionized particle. Electrodes at a first end of a flight tube may be configured to accelerate ionized particles into the flight tube. A detector at a second opposite end of the flight tube may independently measure a time of flight of the ionized particles through the flight tube and an intensity of the ionized particles.

A mass spectrometer comprises an ion source 10 (Figure 1), a mass pre‐filter 20 downstream of the ion source, a collision cell 30 (Figure 1), at least one mass filter downstream of the collision cell,

The invention provides a cycloidal mass spectrometer and a method for adjusting resolution thereof. The spectrometer comprises a set of magnets, providing a magnetic field; two sets of electrode arrays, opposing to each other parallelly, each set of the electrode array including a plurality of strip electrodes arranged parallelly; at least one DC power supply, providing DC voltages to each set of the electrode array to form a DC electric field, the direction of the electric field being perpendicular to the direction of the magnetic field, and the electric field and the magnetic field superimposed on each other to form an electric-magnetic cross-field; an ion injection unit, configured to inject ions into the electric-magnetic cross-field. Said ions travel along a cycloidal trajectory in the electric-magnetic cross-field, in which the magnetic field intensity and the electric field intensity decrease simultaneously within at least part of the region in said cycloidal trajectory.

Determining operational parameters of a spectrometer comprising an electron impact ion source. In ON and OFF mode respectively there are a first and a second set of operational parameters The first an

An ion beam filter for receiving, from an ion source, a beam of ions and for transmitting ions selected from the beam of ions, the ion beam filter extending along an ion optical axis. A pair of ion optical devices is spaced along the ion optical axis and comprising a first ion optical device configured to spread the ion beam and a second ion optical device configured arranged downstream of the first ion optical device and arranged to recombine constituents of the spread beam into a single narrowed beam. A mass defining filter aperture (e.g., slit) is located between first and second ion optical devices. An array of ion optical lenses is arranged between the first ion optical device and the mass defining filter aperture (e.g., slit) and arranged between the mass defining aperture (e.g., slit) and the second ion optical device. A first ion optical lens of the array of ion optical lenses is configured to cause the paths of the ions in the beam to become substantially parallel between the first ion optical lens and second ion optical lens at the location of the mass defining filter aperture (e.g., slit).

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

A method that includes accelerating ions toward a lattice of carbon fibers and capturing the ions in the lattice of carbon fibers.

A method of determining an expected response to injecting a beam of ions of a species of interest into a static field mass filter of a mass spectrometer including a mass analyser is provided. The method includes: measuring an intensity of ions injected into the static field mass filter for various combinations of test ion species, test magnetic field strengths, and test electric field strengths; determining electric field strengths corresponding to an intensity equal to a first and a second fraction of the measured peak intensity; based on a predetermined relationship between magnetic field strength, electric field strength and centre mass of the static field mass filter, determining mass values corresponding to the determined electric field strengths; and interpolating, from said mass values and for each ion species and for at least one of the test magnetic field strengths, expected mass values for an ion species of interest.

The invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer, wherein the time-of-flight mass spectrometer is housed within the vacuum chamber. The time-of-flight mass spectrometer comprises a first electrode and a second electrode spaced apart a distance therebetween defining a portion of an ion flight path. The assembly further comprises a first support for supporting the first electrode, the first support being arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to allow relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The invention further relates to a multi-reflecting time-of-flight mass analyzer. The invention further relates to an apparatus for degassing by heating and subsequently cooling a surface within a vacuum chamber to remove contaminants from the surface.

To provide a leak detector which is configured to detect leakage by introducing hydrogen gas leaking form a test piece to an analysis tube and to provide sufficient measurement accuracy in a short time by facilitating stabilization of background and significantly reducing the time required for background recovery.SOLUTION: An analysis tube 100 provided herein comprises an ion source portion 1 for ionizing hydrogen gas introduced thereto to generate hydrogen ions, an ion collector portion 2 for detecting the amount of hydrogen ion current, and re-inflow suppression structures 71, 72, 73 for preventing hydrogen gas generated by the ions by being uncharged by the ion collector portion 2 from reflowing into the ion source portion 1.SELECTED DRAWING: Figure 5

Provided is a metal purification device and method based on a mass-to-charge ratio difference. The metal purification device includes a vacuum chamber, and an ion excitation chamber and an electromagnetic separation chamber that are arranged in the vacuum chamber. The ion excitation chamber and the electromagnetic separation chamber are arranged side by side. The vacuum chamber is configured to provide a vacuum purification environment or an inert gas-filled purification environment. The ion excitation chamber is configured to excite an impurity-containing metal sample to produce ionized atoms with different mass-to-charge ratios. A plurality of collectors are provided in the electromagnetic separation chamber, and the electromagnetic separation chamber is configured to provide an electric field and a magnetostatic field. Electric field forces generated by the electric field cooperate with Lorentz forces generated by the magnetostatic field to control the ionized atoms with the different mass-to-charge ratios to enter different collectors.

The invention relates to a method for ion collection. The present application provides a method for ion collection, the method comprising accelerating a plurality of ytterbium ions toward a carbon fiber lattice; wherein at least a portion of the plurality of ytterbium ions is a plurality of ytterbium-176 ions; separating the plurality of ytterbium-176 ions from the plurality of ytterbium ions; and trapping the plurality of ytterbium-176 ions in the carbon fiber lattice.

A system for trapping ions for measurement thereof may include an electrostatic linear ion trap (ELIT), a source of ions to supply ions to the ELIT, a processor operatively coupled to ELIT, and a memory having instructions stored therein executable by the processor to produce at least one control signal to open the ELIT to allow ions supplied by the source of ions to enter the ELIT, determine an ion inlet frequency corresponding to a frequency of ions flowing from the source of ions into the open ELIT, generate or receive a target ion charge value, determine an optimum threshold value as a function of the target ion charge value and the determined ion inlet frequency, and produce at least one control signal to close the ELIT when a charge of an ion within the ELIT exceeds the optimum threshold value to thereby trap the ion in the ELIT.

The objective of the present invention is to manufacture an acceleration device and a mass analysis device inexpensively and with a compact size, enabling them to be used by any person. The mass analysis device (300) is configured from a plurality of substrates, including a first main substrate (301), a first upper substrate (302) adhered to the upper surface of the first main substrate (301), and a first lower substrate (303) adhered to the lower surface of the first main substrate (301). A mass analysis chamber (308) is a passage formed in the first main substrate (301) and running from the upper surface of the first main substrate (301) to the lower surface of the first main substrate (301), and enclosed in the direction perpendicular to the substrate surfaces (the Z direction) by the upper substrate (302) and the lower substrate (303), enclosed on both sides in the direction (the direction X) which is orthogonal to the Z direction and is the direction of advance of charged particles (318) by first main substrate side plates (301-4, 301-5), and enclosed on both side surfaces in the direction (the Y direction) orthogonal to the Z direction and the X direction by the first main substrate (301). A center hole (310-4) is opened in the first main substrate side plate (301-4) to which the charged particles (318) are incident, and the charged particles (318) enter the mass analysis chamber (308) from the center hole (310-4) formed in the first main substrate side plate (301-4).

To provide an accelerator and a mass spectroscope, which can be miniaturized and manufactured in a low cost, and are available by anyone.SOLUTION: In each of a mass spectroscope and an accelerator, which is structured by a plurality of substrates containing a first main substrate, a first upper substrate adhered onto an upper face of the first main substrate, and a first lower substrate adhered onto a lower face of the first main substrate, a penetration chamber is formed in the first main substrate, and is penetrated to the lower face of the first main substrate from the upper face of the first main substrate, a vertical direction (a Z direction) of the substrate surface is surrounded by an upper substrate and a lower substrate, and both sides which are a right angle direction with the Z direction and of a charged particle and a traveling direction (an X direction) of a charged particle are surrounded by the first main substrate, and both side faces which have a right angle direction (a Y direction) to the Z direction and the X direction are surrounded by the first main substrate. A central hole of a first main substrate side board, which is incident to the charged particle is opened, and the charged particle is incident to a mass analysis chamber or an acceleration chamber from the central hole formed on the first main substrate side board.SELECTED DRAWING: Figure 1

A method for generating a mass spectrum of sample ions using a multi-collector mass spectrometer, the mass spectrometer comprising a spatially dispersive mass analyzer for directing the sample ions into a detector chamber (326), the method comprising: (a) Generating sample ions of a first ion species A with a mass-to-charge ratio (m / z) A , a second ion species B with a mass-to-charge ratio (m / z) B , and a third ion species C with a mass-to-charge ratio (m / z) C , wherein the ions of species A have a different nominal mass than the ions of species B and C, and further wherein the ions of species B have the same nominal mass as the ions of species C; (b) directing the sample ions of species A, B and C to move through the mass analyzer and towards the detectors (330) in the detector chamber (326), the sample ions being deflected during their movement; (c) scanning the ions of species B and C through a main aperture (520) defined in a main mask (518) of a main detector (505), while the ions of species A pass through a guide aperture (514) defined in a guide mask (512) of a guide detector (500); and (d) generating a guide signal (700) representing the ion intensity received at the guide detector (500) from the ions of species A, and generating a main signal (710) representing the ion intensity received at the main detector (505) while the ions of species B and C are scanned via the main aperture (520); wherein ions of species A are detected by the guide detector (500) during the scanning, i) while ions of species B, but not C, ii) subsequently both species B and species C, and subsequently species C but not B are detected by the main detector (505).

A mass spectrometer comprises an ion source, a static mass pre-filter downstream of the ion source, a collision cell downstream of the static mass pre-filter, at least one mass analyzer downstream of the collision cell, and at least one ion detector downstream of the at least one mass analyzer. The static mass pre-filter (20) comprises a first magnetic sector unit (21) for separating ions into partial ions beams (2), a second magnetic sector unit (22) for merging the partial ion beams, and a slit (23) arranged between the first magnetic sector unit and the second magnetic sector unit for selectively passing partial ion beams (2). The partial ion beams (2) may be symmetric relative to a plane (S) perpendicular to the partial ion beams.

The invention provides a device and method for recording spectral information of charged particle beams, such as ion beams, or of light beams, at a high resolution. Specifically, a mass spectrometer having a focal plane detector is disclosed. The invention enables the recording of mass spectral data at both high mass resolving power and mass accuracy, during parallel acquisition of potentially the entire spectrum of a sample beam.

The application discloses a magnetic field scanning device and a magnetic mass spectrometer. The magnetic field scanning device comprises a magnetic assembly and a control assembly. The number of turns of a main coil in the magnetic assembly is less than the number of turns of an auxiliary coil. A first main coil and a second main coil in a magnetic core unit are connected in series, which are a main magnetic unit. A first auxiliary coil and a second auxiliary coil are connected in series, which are an auxiliary magnetic unit. The control assembly is electrically connected with the main magnetic unit and the auxiliary magnetic unit respectively. The control assembly is used for adjusting the current of the main magnetic unit and adjusting the current in the auxiliary magnetic unit, so as to adjust the magnetic field intensity of the electromagnetic field between the first end and the second end, and then realize the magnetic field scanning. When the magnetic field is rapidly scanned, the combination control of the main magnetic unit and the auxiliary magnetic unit can make the magnetic field intensity rapidly and stably reach the required setting value.

The present invention provides devices and methods for recording spectral information of charged particle beams, such as ion beams, or of light beams with high resolution. In particular, a mass spectrometer having a focal plane detector is disclosed. The present invention enables recording of mass spectral data with both high mass resolution and mass accuracy while acquiring, in some cases, the entire spectrum of the sample beam in parallel.

A method of ion mobility and / or mass spectrometry is disclosed in which the ion mobility and / or mass to charge ratio of an ion is determined using an algorithm or relationship that relates the transit time or average ion velocity of the ion through an ion separation device in which one or more time-varying electric field is used to separate ions passing therethrough to one or more parameters for the device, the mass to charge ratio of the ion and the ion mobility of the ion.

A method of determining an expected response (e.g. a transmission or bandpass characteristics) of a mass filter disclosed. The mass filter may be a static field mass filter comprising two Wien filters

This invention discloses an electrical control system for a dual-focusing mass spectrometer and the spectrometer itself, including a control computer and a power supply module. The control computer sends setting commands to the power supply module, which includes an analytical electromagnet power supply unit and an electrostatic analyzer power supply unit. The analytical electromagnet power supply unit converts external power into a corresponding drive current and supplies it to the analytical electromagnet according to the setting commands from the control computer, and adjusts the drive current according to the actual magnetic field strength of the analytical electromagnet. The electrostatic analyzer power supply unit converts external power into a corresponding set voltage and supplies it to the electrostatic analyzer according to the setting commands from the control computer, and adjusts the set voltage according to the actual electric field strength of the electrostatic analyzer. This invention at least solves the problem of low stability and reliability of the electrical control system in dual-focusing mass spectrometers in related technologies.

The invention relates to the technical field of instruments and meters, in particular to a small-sized double-focusing mass spectrum imaging system for space and a use method, the system comprises an ion source, a coding plate, an electrostatic analyzer, a magnetic analyzer and an FOP detector, the ion source adopts a symmetrical magnetic field structure, and a cathode emission device and a hot filament are respectively located at two ends of the ion source; the coding plate is arranged right in front of the ion source; the electrostatic analyzer is composed of two coaxial cylindrical electrodes; the magnetic field structure of the magnetic analyzer is a direct asymmetric fan-shaped magnetic field; the electrostatic analyzer and the magnetic analyzer are combined in a reverse serial connection manner; the FOP detector adopts a micro-channel plate + fluorescent screen + CMOS camera imaging mode. According to the invention, the limitation of large sizes of ion beams and imaging light spots thereof under a conventional single-slit outlet structure of a mass spectrometer is overcome by adopting a coding aperture mode, so that the mass resolution of the mass spectrum imaging device is remarkably improved, the sensitivity is high, the imaging speed is high, the signal-to-noise ratio is high, and the detection of lower-content substances is realized.

A device that includes a first surface, a second surface and a controller. The second surface is adjacent to the first surface and the surfaces define at least one ion channel. The second surface includes a first electrode, a second electrode and a third electrode, each electrode being segmented along the first direction. The second and third electrodes are spaced apart from the first electrode along a second direction lateral to the first direction with the second electrode being positioned between the first and third electrodes. Alternating segments of the first electrode, second electrode and third electrode receive a first voltage signal and the remaining segments receive a second voltage signal; the first voltage signal being a first RF voltage signal and the second voltage signal is a second RF voltage signal, a DC voltage signal or is connected to a ground reference voltage.