54results about "Static spectrometers" patented technology

Embodiments provide for an ion mass spectrometer. An example ion mass spectrometer includes a laminated collimator, a laminated electrostatic analyzer (ESA) positioned downstream from the laminated collimator, a magnetic sensor analyzer positioned downstream from the laminated ESA, and a position sensitive cross-delay anode (XDL) assembly having a micro-channel plate (MCP) and a cross delay-line (XDL) anode.

A method that includes accelerating ions toward a lattice of carbon fibers and capturing the ions in the lattice of carbon fibers.

The present invention comprises novel methods of continuously monitoring the performance of an atmospheric pressure ionization (API) system. The methods of the invention allow for improved quality monitoring of the processes that leads to the formation of ions at atmospheric pressure. The methods of the invention further allow for continuously monitoring for the quality of the ion formation process in API without the addition of extraneous material (such as labelled compounds or control known compounds) to the system being monitored.

A method is provided for controlling a multi-pole charged particle transmission device having rods spaced apart radially about a central axis extending from a particle inlet at one end of the device to a particle outlet at an opposite end. An AC voltage source is controlled to apply an AC voltage having a frequency, a peak amplitude and a waveform shape to the charged particle transmission device, and a set of charged particles is passed through the device under such conditions. The AC voltage source is then controlled to change at least one of the frequency, peak amplitude or shape of the AC, and another set of the charged particles is then passed through the charged particle transmission device under such conditions.

The present invention discloses an ion source for a rare gas isotope mass spectrometer, comprising a cathode assembly and an electron receiving stage assembly, an ionization box, a repeller, an extraction focusing lens group, and an ion source fixing seat. The cathode assembly and the electron receiving stage assembly are respectively fixed at the upper and lower ends of the ionization box, the repeller is fixed at the rear end of the ionization box, the extraction focusing lens group is at the front end of the ionization box, the extraction focusing lens group is connected to the ionization box via a connecting porcelain column to achieve fixation and insulation, the extraction focusing lens group is composed of a pull-out electrode, a z focusing electrode, a grounding electrode, a y focusing electrode, and an exit slit arranged in sequence, the extraction focusing lens group realizes extraction and focusing of sample ions in the ionization box, the other end of the connecting porcelain column is connected to the ion source fixing seat, the center of the ion source fixing seat has an exit slit, the structure is simple, the number of pole pieces is small, the internal volume is small, and the sensitivity is greatly improved. The repeller and extraction focusing system has high ion extraction efficiency and good focusing effect.

An electrostatic ion trap or an array of electrostatic ion traps having a longitudinal length of no more than 10 mm and / or at least one electrode with a capacitance to ground of no more than 1 pF is provided. First and second sets of planar electrodes may be distributed along the longitudinal axis, at least some of which are configured to receive an electrostatic potential to confine ions received in the space between the first and second sets of planar electrodes. An array may include an inlet for receiving an ion beam configured such that a portion of the ion beam can be trapped in each of the ion traps. Signals indicative of ion mass and charge data may be obtained from multiple electrostatic ion traps in the array.These mass and charge data can be combined to identify components of a mixture of different analyte ions.

A low power mass spectrometer assembly includes at least an ionization component, an electrostatic analyzer, a lens assembly, a magnet assembly and at least one detector located in a same plane as the entrance to the magnet assembly for detecting the deflected sample ions and / or fragments of sample ions, including ions or ion fragments indicative of the Vitamin D metabolite within the sample.

A method of determining an expected response to injecting a beam of ions of a species of interest into a static field mass filter of a mass spectrometer comprising a mass analyser is provided. The method comprises: measuring an intensity of ions injected into the static field mass filter for various combinations of test ion species, test magnetic field strengths, and test electric field strengths; determining electric field strengths corresponding to an intensity equal to a first and a second fraction of the measured peak intensity; based on a predetermined relationship between magnetic field strength, electric field strength and centre mass of the static field mass filter, determining mass values corresponding to the determined electric field strengths; and interpolating, from said mass values and for each ion species and for at least one of the test magnetic field strengths, expected mass values for an ion species of interest.

The gas analyzer system uses an ion source that can be a hot cathode ion source. A positioning magnet assembly is used to define a magnetic field, and the magnet assembly allows the separation of ion components based on the mass-to-charge ratio of their ions. An ion beam deflector, such as a pair of deflection plates, can be used to scan the ion components across the detector. The ion beam deflector defines a deflection electric field across the magnetic field and across the direction of travel of the ions emitted by the ion source.

An optomechanical system for transducing an optical intensity modulation movement including an optical detector and a mechanical sensor including a mobile mass, of which a receiving surface is intended to receive an external mechanical urging, and an excitation device. The excitation device is configured to vibrate the mobile mass along an excitation direction at at least one of its resonance frequencies. The vibration of the mobile mass is disrupted by the external mechanical urging, and modifies an evanescent field of the optical detector. The mobile mass has an interaction region facing the optical detector, as well as a second region, respectively having, projecting along a plane perpendicular to the excitation direction, an interaction surface area S111 and a second surface area S112, with S112<S111.

Static gas mass spectrometry methods, comprising the following steps: Introducing a sample gas containing two or more isotopes to be analyzed into a static vacuum mass spectrometer at time t0; Operating an electron impact ionization source of the mass spectrometer with a first electron energy below the ionization potential of the sample gas for a first period following t0 up to a time t1, wherein the first period from t0 to t1 is based on an equilibration period for equilibrating the sample gas, the equilibration period being determined by a prior measurement of an isotopic ratio of the sample gas against the time following sample gas injection; and Operating the electron impact ionization source with a second electron energy at least equal to the ionization potential of the sample gas for a second period after time t1; where the isotope ratio mass analysis measurements are carried out during the second period, but not during the first period.

The invention discloses a magnetic field scanning device and a magnetic mass spectrometer. The magnetic field scanning device comprises a magnetic assembly and a control assembly. The number of turns of the main coil in the magnetic assembly is smaller than that of the auxiliary coil. The first main coil and the second main coil in the magnetic core unit are connected in series to form a main magnetic unit, and the first auxiliary coil and the second auxiliary coil are connected in series to form an auxiliary magnetic unit. The control assembly is electrically connected with the main magnetic unit and the auxiliary magnetic unit and used for adjusting the current of the main magnetic unit and adjusting the current in the auxiliary magnetic unit so as to adjust the magnetic field intensity of the electromagnetic field between the first end and the second end, and then magnetic field scanning is achieved. According to the magnetic field scanning device, the magnetic field intensity can be rapidly stabilized at a set value required by adjustment through combined control of the main magnetic unit and the auxiliary magnetic unit during rapid magnetic field scanning.

The present application provides a method for ion collection, the method comprising accelerating ions toward a carbon fiber lattice and trapping the ions in the carbon fiber lattice.

Embodiments relate to an apparatus, method, or computer program. A laser may be configured to irradiate a plurality of laser pulses on a target area to ionize a sample placed in the target area into at least one ionized particle. Electrodes at a first end of a flight tube may be configured to accelerate ionized particles into the flight tube. A detector at a second opposite end of the flight tube may independently measure a time of flight of the ionized particles through the flight tube and an intensity of the ionized particles.

A mass spectrometer comprises an ion source 10 (Figure 1), a mass pre‐filter 20 downstream of the ion source, a collision cell 30 (Figure 1), at least one mass filter downstream of the collision cell,

The invention provides a cycloidal mass spectrometer and a method for adjusting resolution thereof. The spectrometer comprises a set of magnets, providing a magnetic field; two sets of electrode arrays, opposing to each other parallelly, each set of the electrode array including a plurality of strip electrodes arranged parallelly; at least one DC power supply, providing DC voltages to each set of the electrode array to form a DC electric field, the direction of the electric field being perpendicular to the direction of the magnetic field, and the electric field and the magnetic field superimposed on each other to form an electric-magnetic cross-field; an ion injection unit, configured to inject ions into the electric-magnetic cross-field. Said ions travel along a cycloidal trajectory in the electric-magnetic cross-field, in which the magnetic field intensity and the electric field intensity decrease simultaneously within at least part of the region in said cycloidal trajectory.

Determining operational parameters of a spectrometer comprising an electron impact ion source. In ON and OFF mode respectively there are a first and a second set of operational parameters The first an

An ion beam filter for receiving, from an ion source, a beam of ions and for transmitting ions selected from the beam of ions, the ion beam filter extending along an ion optical axis. A pair of ion optical devices is spaced along the ion optical axis and comprising a first ion optical device configured to spread the ion beam and a second ion optical device configured arranged downstream of the first ion optical device and arranged to recombine constituents of the spread beam into a single narrowed beam. A mass defining filter aperture (e.g., slit) is located between first and second ion optical devices. An array of ion optical lenses is arranged between the first ion optical device and the mass defining filter aperture (e.g., slit) and arranged between the mass defining aperture (e.g., slit) and the second ion optical device. A first ion optical lens of the array of ion optical lenses is configured to cause the paths of the ions in the beam to become substantially parallel between the first ion optical lens and second ion optical lens at the location of the mass defining filter aperture (e.g., slit).

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

A method that includes accelerating ions toward a lattice of carbon fibers and capturing the ions in the lattice of carbon fibers.

A method of determining an expected response to injecting a beam of ions of a species of interest into a static field mass filter of a mass spectrometer including a mass analyser is provided. The method includes: measuring an intensity of ions injected into the static field mass filter for various combinations of test ion species, test magnetic field strengths, and test electric field strengths; determining electric field strengths corresponding to an intensity equal to a first and a second fraction of the measured peak intensity; based on a predetermined relationship between magnetic field strength, electric field strength and centre mass of the static field mass filter, determining mass values corresponding to the determined electric field strengths; and interpolating, from said mass values and for each ion species and for at least one of the test magnetic field strengths, expected mass values for an ion species of interest.

The invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer, wherein the time-of-flight mass spectrometer is housed within the vacuum chamber. The time-of-flight mass spectrometer comprises a first electrode and a second electrode spaced apart a distance therebetween defining a portion of an ion flight path. The assembly further comprises a first support for supporting the first electrode, the first support being arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to allow relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The invention further relates to a multi-reflecting time-of-flight mass analyzer. The invention further relates to an apparatus for degassing by heating and subsequently cooling a surface within a vacuum chamber to remove contaminants from the surface.

To provide a leak detector which is configured to detect leakage by introducing hydrogen gas leaking form a test piece to an analysis tube and to provide sufficient measurement accuracy in a short time by facilitating stabilization of background and significantly reducing the time required for background recovery.SOLUTION: An analysis tube 100 provided herein comprises an ion source portion 1 for ionizing hydrogen gas introduced thereto to generate hydrogen ions, an ion collector portion 2 for detecting the amount of hydrogen ion current, and re-inflow suppression structures 71, 72, 73 for preventing hydrogen gas generated by the ions by being uncharged by the ion collector portion 2 from reflowing into the ion source portion 1.SELECTED DRAWING: Figure 5

A device includes a first surface, a second surface and a controller. The second surface is adjacent to the first surface. The first and the second surfaces define a first ion channel therebetween. The first ion channel extends along a first direction. The second surface includes a first plurality of electrodes including a first electrode and a second electrode spaced apart from the first electrode along a second direction lateral to the first direction. The first plurality of electrodes extends along the first direction. The first electrode is configured to receive a first voltage signal and generate at least a portion of a pseudopotential that inhibits ions in the first ion channel from approaching the second surface. The second plurality of electrodes is located between the first electrode and the second electrode and arranged along the first direction. The second plurality of electrodes are configured to receive a second voltage signal to generate a first traveling drive potential that travels along the first direction. The first traveling drive potential is configured to guide ions along the first ion channel. The device further includes a controller electrically coupled to the first and the second surface. The controller is configured to generate the first voltage signal and the second voltage signal.

A monitoring system detects and measures a quantity of radical particles within a gas. A test chamber is coupled to a flow channel that transmits a gas. The test chamber defines an aperture connecting the test chamber and the flow channel, and the aperture permits a subset of the gas to enter the test chamber from the flow channel. An ionizer is positioned within the test chamber and generates radical ions from radical particles of the subset of the gas. A mass spectrometer measures a quantity of the radical ions, thereby providing a measurement of the radical particles in the gas.

Provided is a metal purification device and method based on a mass-to-charge ratio difference. The metal purification device includes a vacuum chamber, and an ion excitation chamber and an electromagnetic separation chamber that are arranged in the vacuum chamber. The ion excitation chamber and the electromagnetic separation chamber are arranged side by side. The vacuum chamber is configured to provide a vacuum purification environment or an inert gas-filled purification environment. The ion excitation chamber is configured to excite an impurity-containing metal sample to produce ionized atoms with different mass-to-charge ratios. A plurality of collectors are provided in the electromagnetic separation chamber, and the electromagnetic separation chamber is configured to provide an electric field and a magnetostatic field. Electric field forces generated by the electric field cooperate with Lorentz forces generated by the magnetostatic field to control the ionized atoms with the different mass-to-charge ratios to enter different collectors.

The invention relates to a method for ion collection. The present application provides a method for ion collection, the method comprising accelerating a plurality of ytterbium ions toward a carbon fiber lattice; wherein at least a portion of the plurality of ytterbium ions is a plurality of ytterbium-176 ions; separating the plurality of ytterbium-176 ions from the plurality of ytterbium ions; and trapping the plurality of ytterbium-176 ions in the carbon fiber lattice.

A system for trapping ions for measurement thereof may include an electrostatic linear ion trap (ELIT), a source of ions to supply ions to the ELIT, a processor operatively coupled to ELIT, and a memory having instructions stored therein executable by the processor to produce at least one control signal to open the ELIT to allow ions supplied by the source of ions to enter the ELIT, determine an ion inlet frequency corresponding to a frequency of ions flowing from the source of ions into the open ELIT, generate or receive a target ion charge value, determine an optimum threshold value as a function of the target ion charge value and the determined ion inlet frequency, and produce at least one control signal to close the ELIT when a charge of an ion within the ELIT exceeds the optimum threshold value to thereby trap the ion in the ELIT.

A detection system (1) for determining a semiconductor structure. The detection system has an ion beam source (2) for spatially resolving and displaying the structure to be determined with an ion beam (3). Further, the secondary ion detection device (12) includes a mass spectrometer (13). The mass spectrometer (13) is capable of measuring the mass-to-charge ratio of ions within a given bandwidth.