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Thin formation identification method and device based on high-density vsp data

Active Publication Date: 2019-09-10
BC P INC CHINA NAT PETROLEUM CORP +1
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Problems solved by technology

Therefore, it is still very difficult to distinguish geological bodies smaller than 1 / 4 wavelength
Even if the limit resolution is satisfied under the limited conditions, the improvement is very limited.

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  • Thin formation identification method and device based on high-density vsp data
  • Thin formation identification method and device based on high-density vsp data
  • Thin formation identification method and device based on high-density vsp data

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Embodiment Construction

[0052]In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0053] VSP high-density acquisition is currently rarely studied by scholars. In theory, this method can identify infinitely thin strata. However, because the picking accuracy of the time-depth relationship curve cannot be infinite, the goal of identifying infinitely thin strata cannot be realized. In fact, the pick-up accuracy of 0.1ms (us...

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Abstract

The embodiment of the invention provides a method and a device for thin stratum identification based on high-density VSP (Vertical Seismic Profiling) data. The method comprises the steps of: obtainingVSP data with an assigned collection density of a target area, and performing preprocessing of the VSP data; obtaining a VSP frequency spectrum curve and a first arrival amplitude derivative curve ofthe VSP data after preprocessing; multiplying the VSP frequency spectrum curve by the first arrival amplitude derivative curve, and obtaining a combined curve; and obtaining a stratum identificationresult of the target area according to the combined curve. According to the embodiment of the invention, the resolution of thin stratum identification can be improved.

Description

technical field [0001] The present application relates to the technical field of thin layer identification, in particular to a thin layer identification method and device based on high-density VSP (Vertical Seismic Profiling, vertical seismic profile) data. Background technique [0002] Thin layer identification is an important and difficult topic in seismic exploration. How to improve the vertical resolution of seismic data and distinguish the thickness of thinner layers has always been one of the goals pursued by the field of geophysics. [0003] The earlier discussion of vertical resolution gave a definition of the limiting resolution of 1 / 4 wavelength. Since then, the research on improving the resolution has never stopped, among which the more representative ones are: using two opposite reflection coefficients to define the limit resolution as 1 / 8 wavelength; from the perspective of geological models, using the tuning amplitude and thickness According to the change law,...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V1/30
Inventor 蔡志东张庆红李彦鹏彭继新王艳华
Owner BC P INC CHINA NAT PETROLEUM CORP
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