Method for calibrating temperature adjustment in thermal analysis of samples
A thermal analysis and sample cavity technology, applied in the field of calibrating equipment for thermal analysis of samples, to achieve the effect of simple calibration
Active Publication Date: 2018-03-30
NETZSCH GERATEBAU GMBH
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Problems solved by technology
[0014] Disadvantages in the known calibration methods of this kind are for example the degree of complexity associated therewith and the limitation to a fully defined "calibration temperature" in which the melting takes place or another phase transition can be easily detected
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Embodiment Construction
[0054] figure 1 An apparatus 10 for thermal analysis of a sample is schematically shown.
[0055] The device 10 comprises a sample chamber 12 having a plurality (here four) of sample holders 14-1, 14-2, 14-3 and 14-4, the sample holders being correspondingly configured to hold a sample .
[0056] The arrangement of several sample holders advantageously enables the simultaneous conditioning and inspection of several samples, which in practice means a considerable saving of time. exist figure 1 exemplarily shows four samples P1, P2, P3 and P4, the four samples are each positioned on one of the sample holders 14-1 to 14-4 and thus for example in a unique "temperature program" The thermal analysis set by the device 10 may be subjected to during operation.
[0057] Here, a temperature program is understood to mean determining the temperature in the interior of the sample chamber 12 and the sample (in figure 1 Middle: Time-dependent trend of temperature from P1 to P4).
[0058...
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The invention relates to a method for calibrating equipment (10) for performing temperature analysis on samples (P1 to P4). The method according to the invention comprises the steps of performing optothermal measurement on one determined sample or a plurality of samples of the same kind, wherein the determined sample is successively kept in the plurality of sample holding members (14-1 to 14-4) inthe equipment (10) and optothermal measurement is performed respectively, or the plurality of samples of the same kind are respectively kept in the plurality of sample holding members (14-1 to 14-4)and optothermal measurement is performed respectively, wherein an electromagnetic exciting pulse is used for irradiating the first side of the related sample in optothermal measurement, and thermal radiation radiated from a second side which faces the first side of the sample because of the exciting pulse is detected; comparing optothermal measurement results of the plurality of sample holding members (14-1 to 14-4); based on the comparing result, respectively obtaining at least one correcting parameter for each sample holding members (14-1 to 14-4); and calibrating temperature measuring devices (26-1 to 26-4) for the equipment (10) and / or temperature regulating device (16-1 to 16-4) of the equipment (10) based on the obtained correcting parameter.
Description
technical field [0001] The invention relates to a method for calibrating a device for thermal analysis of samples according to the preamble of claim 1 . Background technique [0002] In thermal analysis, the properties of a material are examined as a function of temperature from a sample made of the material of interest. For this, correct thermometry, that is, correct measurement of the temperature of the sample, is important. [0003] Devices known from the prior art for thermal analysis of samples are, for example, temperature sensors in the form of thermocouples or resistance thermometers, which can be arranged, for example, in thermal contact with the sample in order to measure the temperature during the test. [0004] However, this measurement can be more or less erroneous, for example because such temperature sensors do not measure the temperature inside the sample but for example at the edge of the sample. This measurement error is even more insignificant for common...
Claims
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IPC IPC(8): G01N25/20
CPCG01N25/20G01N25/18
Inventor M·布鲁纳A·林德曼
Owner NETZSCH GERATEBAU GMBH