Semiconductor component appearance inspection equipment and its optical path structure
A technology of appearance inspection and optical path, which is applied in the direction of optical testing for defects/defects, material analysis through optical means, scientific instruments, etc., and can solve the problems of increasing manufacturers' troubles, increasing equipment installation and proofreading time, etc.
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[0036] The implementation of the present invention will be described in more detail below in conjunction with the accompanying drawings and reference numerals, so that those who understand the art can implement it after studying this specification.
[0037] Such as image 3 Shown is a perspective view of the semiconductor component appearance inspection equipment of the present invention. The appearance inspection equipment of the semiconductor component of the present invention is that a transfer track 21, a carrier 22, a traverse track 23, a pick-and-place mechanism 3 and an appearance inspection area 4 are installed on the base 2, and the carrier 22 is installed on the mobile On the loading track 21, a carrier plate 24 can be carried for linear movement in the first direction, wherein the carrier plate 24 is used to place the semiconductor components to be tested; , the pick-and-place mechanism 3 is installed on the traversing track 23 and can move in a second direction, w...
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