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System for optical detection of parameters

A technology of parameter detection and light source, applied in the field of parameter detection, can solve problems such as influence, change of refractive index transmittance, etc.

Active Publication Date: 2018-09-28
SCHOTT GLASS TECH (SUZHOU) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Even though this is not a problem in some optical systems, in coated systems a change in the index of refraction can cause a change in transmission
These changes can have a large impact when considering the many parametric detection systems making very fine-grained measurements

Method used

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  • System for optical detection of parameters
  • System for optical detection of parameters
  • System for optical detection of parameters

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0091] Example glass substrates and example filters were fabricated and some properties were measured. The compositions of the glasses tested can be found in Table 1 below.

[0092] Composition example

[0093] Table 1 below shows exemplary glass compositions (in cat.-%) for use as compositions of the substrate glasses of the present invention. The glasses shown in Table 1 contain only oxides as anionic components, ie the glasses are oxides.

[0094] Table 1

[0095]

[0096]

[0097] The above composition is the final composition of the glass measured. Those skilled in the art know how to obtain these glasses by melting the necessary raw materials.

[0098] Manufacturing glass substrates

[0099] Glasses were made using suitable raw materials to obtain the final compositions shown in Table 1 . Raw materials are melted in a melting crucible. After melting, the glass is formed into a thin glass article with a thickness of about 0.3 mm.

[0100] All of the glasses ...

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Abstract

A parameter detection system, an infrared band pass filter, and a glass substrate for the infrared band pass filter as well as a method for detecting parameters are disclosed. The system, filter and substrate may be used in a number of devices, including smart phones, portable computers, computer watches, tablet computers, gaming devices, TV sets, personal computers, intercommunication systems, home automation systems, automotive security systems, 3D imaging systems, gesture control systems, touch sensors, fingerprint sensors, diagnostic systems, gaming devices, interactive displays, 3D sensing systems, home appliances, display devices, iris recognition systems and others. The system, filter and substrate may be used for a number of purposes including but not limited to iris recognition, 3D scanning, interactive display, biometric detection or measurement of biometric data, gesture control, gaming, fingerprint detection.

Description

technical field [0001] The invention relates to a parameter detection system, an infrared bandpass filter, a glass substrate for the infrared bandpass filter, and a parameter detection method. The system can be used, for example, to detect individual parameters such as iris recognition, 3D scanning, touch sensors, biometrics, interactive displays, games and gesture control. [0002] For the purposes of the present invention, a "parameter detection system" is generally an electronic system capable of measuring at least one parameter of at least one individual or subject. The measured parameter can be selected from any parameter that can be measured using optical methods. "Detection" includes the identification and / or quantification of various parameters. Background technique [0003] Gesture control devices, iris scanners and other related parameter detection devices are themselves prior art. These devices generally have an infrared light source (illumination unit) for ill...

Claims

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Application Information

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IPC IPC(8): H04N5/30G02B5/28
CPCG02B5/285G07C9/37H04W12/06G06V40/18H04N23/10G02B5/208G06F21/32H04L63/0861H04N5/33
Inventor 井口一行
Owner SCHOTT GLASS TECH (SUZHOU) CO LTD