Elliptic cone and ellipsoid parameter extraction method based on Levenberg-Marquardt method

Abstract

The invention discloses an elliptic cone and ellipsoid parameter extraction method based on the Levenberg-Marquardt method. The method comprises the following steps: firstly, obtaining point cloud data of a measured model by using a three-dimensional scanner; then, causing a vertex of the point cloud of the measured model to coincide with the origin of the coordinate by translation transformation;dividing the point cloud obtained in the step 2 by using a threshold-based clustering method to obtain base point cloud and composition curved surface point cloud; then importing a variable characterizing the included angle between a bottom surface half axis of the measured model and a coordinate axis according to a rotation transformation matrix to eliminate an elliptic cone equation or an ellipsoid equation of the offset to obtain a curved surface model equation; and finally, fitting the points in the curved surface point cloud with the curved surface model equation as a fitting target by using the Levenberg-Marquardt method to obtain parameters in the curved surface model equation, that is, the included angle between the bottom surface half axis of the measured model and the coordinateaxis and related parameters. The extraction of the elliptic cone and ellipsoid parameters is achieved, and conditions are provided for more accurate extraction.

Description

【Technical field】 [0001] The invention relates to the field of reverse engineering, in particular to a method for extracting parameters of an ellipse cone and an ellipsoid based on the Levenberg-Marquardt method. 【Background technique】 [0002] With the continuous development of the economy and the continuous expansion of the market scale, the extraction of surface geometric features is becoming more and more important in the field of reverse engineering and intelligent processing. According to statistics, the surfaces of most industrial parts are composed of quadric surfaces. It can be seen that quadric surfaces are an indispensable part of reverse engineering and intelligent manufacturing. When producing and processing such objects, it is necessary to accurately represent the quadric surface on the surface of such objects in the form of geometric parameters. Therefore, in the intelligent processing industry, designers will use measurement technology to measure objects in ...

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Problems solved by technology

[0005] The purpose of the present invention is to: extract the relevant parameters of the ellipse cone or ellipsoid to overcome the problem that the signal processing method cannot solve the problem in the actual application process of the prior art. The problem of effective use

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