Efficient high/low temperature aging oven
A high-low temperature, aging box technology, used in measuring devices, instruments, scientific instruments, etc., can solve the problems of affecting the test efficiency, time-consuming and laborious, and achieve the effect of low cost and easy realization.
Inactive Publication Date: 2018-12-07
宁国市中英橡胶有限公司
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Problems solved by technology
For the parts and materials of various equipment, electronics, chemical and other related products, test their various performance indicators under the condition of high temperature and low temperature (alternating) cycle changes. The existing ordinary high and low temperature aging boxes can only be used for single The temperature test is time-consuming and labor-intensive, which seriously affects the test efficiency. Therefore, this field needs an efficient high-low temperature aging box that can avoid the above problems
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[0015] Below in conjunction with accompanying drawing and embodiment, further elaborate the present invention. In the following detailed description, certain exemplary embodiments of the invention are described by way of illustration only. Needless to say, those skilled in the art would realize that the described embodiments can be modified in various different ways, all without departing from the spirit and scope of the present invention. Accordingly, the drawings and description are illustrative in nature and not intended to limit the scope of the claims.
[0016] Such as figure 1 As shown, a high-efficiency high-low temperature aging box of this embodiment includes a box body 1, a heating chamber 3 and a refrigeration chamber 4, and the middle of the box body 1 is divided into a heating chamber 3 and a refrigeration chamber 4 by a partition plate 2. A fan 5 is provided, and the two ends of the fan 5 are provided with a ventilation pipe 6 connecting the heating chamber 3 a...
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The invention relates to an efficient high / low temperature aging oven which comprises an oven body, a heating room and a refrigerating room. The oven body is characterized by being divided into the heating room and the refrigerating room through a partition plate, a fan is arranged on the partition plate, ventilating pipes communicating to the heating room and the refrigerating room are arranged at two ends of the fan, and valves are separately arranged on two sides of the partition plate on the ventilating pipes; material racks are separately arranged in the heating room and the refrigeratingroom, clamps are arranged on the material racks, breather pipes are arranged on the top of the oven body on the heating room and the refrigerating room, and valves are arranged on the outer side of the oven body on the breather pipes. The efficient high / low temperature aging oven can be used for high / low temperature tests at the same time, and is safe, efficient, low in cost and easy to implement.
Description
technical field [0001] The invention relates to the technical field of high and low temperature aging boxes, in particular to an efficient high and low temperature aging box. Background technique [0002] The high and low temperature test chamber is used for high temperature and low temperature reliability tests of industrial products. For the components and materials of various equipment, electronics, chemical and other related products, test their various performance indicators under the condition of high temperature and low temperature (alternating) cycle changes. The existing ordinary high and low temperature aging boxes can only be used for single The temperature test is time-consuming and labor-intensive, which seriously affects the test efficiency. Therefore, this field needs a high-efficiency high-low temperature aging box that can avoid the above problems. Contents of the invention [0003] The purpose of the present invention is to provide an efficient high and ...
Claims
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CPCG01N17/002
Inventor 徐英木
Owner 宁国市中英橡胶有限公司