Unlock instant, AI-driven research and patent intelligence for your innovation.
A method of preparing "nose tip" specimen for fib three-dimensional reconstruction
What is Al technical title?
Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A technology of three-dimensional reconstruction and nose tip, which is applied in the direction of material analysis, instruments, and measuring devices using wave/particle radiation, which can solve the problems of high cost, reduce sample preparation costs, promote popularization and application, and shorten the use time.
Active Publication Date: 2021-04-02
UNIV OF SCI & TECH BEIJING
View PDF8 Cites 0 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
[0005] The purpose of the present invention is to provide an innovative method for preparing samples for FIB three-dimensional characterization analysis, which solves the problem that the cost of traditional sample preparation methods is too expensive
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
example 1
[0023] (1) Al-Si alloy ingots are prepared by induction melting;
[0024] (2) The sample is mechanically polished, and the sample area to be tested is marked under an optical microscope;
[0025] (3) if figure 2 As shown in (b), with the area to be tested as the center, leave 0.5mm for the left, right, and front parts respectively, so that the sample is in an "L" shape, and the area to be tested is located at the front end of the "L" shape, and the "L" shaped block is generally Length 4mm, width 3mm, depth 3mm, paste copper tape on the surface of the area to be tested (purpose: to protect the sample to be tested from being polluted by wire cutting oil, and the conduction of copper tape will not affect wire cutting, just remove the copper tape after wire cutting) , use the wire cutting method to cut the sample, and initially form the "nose tip", the width of the "nose tip" is 1mm;
[0026] (4) if figure 2 (d) Polish both sides of the "nose tip" with high-grit sandpaper, fr...
example 2
[0030] (1) Prepare titanium alloy ingot ((Ti-5.5Mo-7.2Al-4.5Zr-2.6Sn-2.1Cr)) by vacuum consumable arc melting; heat treatment at 740°C for 5 hours after forging and solution treatment , water quenching to maintain high temperature microstructure;
[0031] (2) After the sample is mechanically polished, electropolishing is performed to remove the surface layer. Polishing parameters: 25°C, 25V, about 30s, polishing liquid: 6% HClO 4 , 34% CH 3 (CH 2 ) 3 OH and 60% CH 3 OH;
[0032] (3) A sample of 5 mm x 1 mm x 0.5 mm is cut out from the polished sample. Make the area to be measured close to the edge of the sample, and electrochemically polish the sample to a thickness of about 26 μm, such as Figure 5 As shown in (a): Clean the aluminum block with alcohol, and polish the surface of the aluminum block to be glued with sandpaper, stick the sample to the aluminum block with silver glue, and then stick the metal block to the workbench with silver glue, and put it into the vac...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
PUM
Login to View More
Abstract
The invention discloses a method for preparing a ''nasal tip-shaped'' sample used for a FIB three-dimensional reconstruction. The method comprehensively applies means of cutting technique, electrochemical polishing and sanding. The method has the process characteristics that: performing a normal gold phase sample preparation; marking a to-be-detected sample under an optical microscope or a scanning electron microscope; performing rough machining by adopting a cutting technique to cut the sample into a L-shaped or strip-shaped sample, the to-be-detected area is located at the front end of the sample and forming a ''nose tip'' preliminarily, wherein the width of the ''nose tip'' is 1 mm or less; polishing the two sides of the ''nose tip'' by a high-mesh sandpaper or corroding the front end of the sample by means of electrochemical polishing to further reduce the width of the ''nose tip'' to 100 [mu]m or less; and refining the ''nose tip'' into a specified size by adopting an FIB system.The method has the advantages that the sample preparation cost is greatly reduced under a condition that the qualities of an obtained sample is consistent with a prepared sample adopting an FIB traditional hole digging technology, and the popularization and application of the FIB in a three-dimensional characterization analysis are forcefully promoted.
Description
technical field [0001] The invention relates to a sample preparation method for three-dimensional characterization analysis of a focused ion beam (Focused Ion beam, FIB). Background technique [0002] FIB processing is a new technology developed in recent decades. It uses electric lens to focus the ion beam into a very small ion beam bombarding the surface of the material, so as to realize the stripping, deposition, implantation, cutting and modification of the material [Document 1 Han Wei, Xiao Siqun. Focused Ion Beam (FIB) and Its Applications[J]. Progress in Materials in China, 2013,32(12):716-727+751.]. In recent years, with the combination of various advanced signal detection modes and the development of FIB-SEM dual-beam system in terms of resolution and stability [Document 2 Jia Zhihong, Wang Xueli, Xing Yuan, Liu Yingying, Liu Qing. FIB-based 3D characterization analysis technology and application progress[J]. China Materials Progress, 2013,32(12):735-741+751.], FIB...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.
Login to View More 
Login to View More 
