An infrared thermal image defect feature extraction method based on multi-objective optimization

A multi-objective optimization and feature extraction technology, applied in image enhancement, image analysis, image data processing, etc., can solve problems such as lack of accuracy, inaccuracy, and incomplete information representation

Active Publication Date: 2019-03-29
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

In this process, the representative temperature points of each category are obtained by using the correlation between different categories, but the similarity between the representative temperature points and the same temperature points is not studied, and the selected representative temperature points are not enough to characterize the characteristics of this category, so Goals that need to consider both differences and similarities
In addition, the method is to search for a regionally representative thermal response temperature point in each category, which is the distance from other cluster centers and the largest thermal response data in the corresponding category, and the thermal response data of the representative temperature points of all categories The response data constitutes a two-dimensional matrix, and these representative temperature points are incomplete for the information representation of the corresponding category, so the defect features extracted after linear transformation are inaccurate, thus failing to achieve a certain accuracy

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  • An infrared thermal image defect feature extraction method based on multi-objective optimization
  • An infrared thermal image defect feature extraction method based on multi-objective optimization
  • An infrared thermal image defect feature extraction method based on multi-objective optimization

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[0098] In this embodiment, there are two kinds of defects on the test piece, namely defect 1 not filled with any material and defect 2 filled with material with poor thermal conductivity.

[0099] In this embodiment, the results of classifying the selected transient thermal responses using fuzzy C-means clustering are shown in figure 2 shown.

[0100] Three known temperature points are directly extracted from the thermal image sequence of the specimen, namely, the transient thermal response curves of the temperature point of the material itself, the temperature point of defect 1, and the temperature point of defect 2, respectively denoted as Bac POINT, Def1 POINT and Def2 POINT, such as image 3 , 4 , 5 shown.

[0101] Using the existing method of selecting transient thermal response representatives based on differences, three transient thermal response representatives are obtained: A NFCM 19 , B NFCM 1 as well as c NFCM 12 , they respectively correspond to the tem...

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Abstract

The invention discloses an infrared thermal image defect feature extraction method based on multi-objective optimization. The method includes: selecting the transient thermal response of pixel pointsin the thermal image sequence transformation step, and classified by FCM, obtaining the category of transient thermal response of each pixel point, and then considering the pixel value (temperature value) similarity of each class pixel point and the pixel point of the same kind, considering the difference between the pixel point (temperature point) and the pixel point (temperature point) of different types, constructing the corresponding multi-objective function, and obtaining the dimension reduction result of thermal image sequence by using the multi-objective evolutionary algorithm based ondecomposition; Finally, carrying out the feature extraction of infrared thermal image by using pulse coupled neural network, and extracting the defect features of infrared thermal image. Through the above steps, the accurate selection of representative pixel points (temperature points) is realized, and the precision of defect feature extraction is ensured.

Description

technical field [0001] The invention belongs to the technical field of defect detection, and more specifically relates to a method for extracting defect features of infrared thermal images based on multi-objective optimization. Background technique [0002] Infrared thermal image detection technology obtains structural information on and below the surface of the material by controlling the thermal excitation method and measuring the temperature field change on the surface of the material, so as to achieve the purpose of detection. When acquiring structural information, infrared thermal imaging cameras are often used to record the temperature field information of the surface or subsurface of the specimen over time, and convert it into a sequence of thermal images for presentation. Due to the huge amount of data and strong noise interference of the thermal image sequence obtained by the infrared thermal imager, in order to obtain better detection results, it is necessary to ex...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/13
CPCG06T7/0004G06T2207/10048G06T2207/20081G06T2207/20084G06T7/13
Inventor 程玉华殷春薛婷张昊楠黄雪刚陈凯石安华
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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