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ICT test fixture

A test fixture and bottom frame technology, which is applied in the direction of electronic circuit testing, measuring device casing, etc., can solve the problem of high cost and achieve the effect of reducing cost

Pending Publication Date: 2019-05-28
SHANGHAI VISTEON AUTOMOTIVE ELECTRONICS SYST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This new testing device allows for better control over electrical performance on multiple types of printed circuit board (PCB) devices without requiring expensive equipment like an oscilloscope. It uses two probe-and-orifice arrangements that are designed specifically for each type of component being tested. By selecting this arrangement based upon its specific needs, it saves money compared to traditional methods such as adding extra components at once.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving on traditional methods used during printing circuit boards (PCB) manufacturing processes that involve manual tests or expensive automated tools such as X-rays.

Method used

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  • ICT test fixture
  • ICT test fixture
  • ICT test fixture

Examples

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Embodiment Construction

[0020] Such as figure 1 As shown, an ICT test fixture includes a box body 110 , a cover body 120 hinged to the box body 110 , and a protective cover 130 for covering the tested pcb board 2 .

[0021] Such as figure 2 As shown, the bottom of the box body 110 has a plurality of first probes 111 that pass through from the front to the back to form a test interface that is compatible with the tester, and the bottom of the box body 110 has a first probe that is used to connect with vacuum equipment. an interface 112 .

[0022] In this embodiment, a hydraulic rod 140 is provided between the box body 110 and the cover body 120 to support when the cover body 120 is opened, so as to facilitate inspection and maintenance.

[0023] To facilitate transportation, handles 113 are provided on both sides of the box body 110 .

[0024] Such as Figure 1-4 As shown, the cover body 120 includes a bottom frame 121 and a carrier plate 122 that moves up and down.

[0025] The carrier board 12...

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PUM

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Abstract

The invention relates to an ICT test fixture, which comprises a box body and a cover body hinged with the box body, wherein the bottom of the box body is provided with a plurality of first probes penetrating from the front side to the back side to form a test interface matched with a tester; the bottom of the box body is provided with a first interface used for being connected with a vacuumizing device; the cover body comprises a bottom frame and a carrier plate moving up and down; the carrier plate is fixed to a bottom frame, a self-restoring piece fixed on the bottom plate is supported on anupper opening of the bottom frame to form a cavity; a sealing ring is arranged between the bottom frame and the carrier plate; the bottom frame is provided with a plurality of second probes penetrating through the bottom plate; the second probes and the first probes are matched and connected through a connecting wire; the back surface of the bottom frame is provided with a second interface communicated with the cavity, the second interface and the first interface are connected through a pipe body, the carrier plate is provided with a plurality of orifices which the plurality of second probesextend in after the cavity forms negative pressure. The test fixture reduces the cost.

Description

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Claims

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Application Information

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Owner SHANGHAI VISTEON AUTOMOTIVE ELECTRONICS SYST
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