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Sample data processing method and device and model training method and equipment

A sample data and data technology, applied in the computer field, can solve problems such as insufficient feature data collection, inaccurate models, and missing feature data.

Active Publication Date: 2019-07-23
ADVANCED NEW TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The second problem is that the feature data is missing, or the feature data collection is not rich enough, that is, the feature data x 1 ~x n In some feature data, some / all attribute feature values ​​are missing
Models trained with incomplete sample data sets are usually not accurate enough

Method used

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  • Sample data processing method and device and model training method and equipment
  • Sample data processing method and device and model training method and equipment
  • Sample data processing method and device and model training method and equipment

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Embodiment Construction

[0029] The subject matter described herein will now be discussed with reference to example implementations. It should be understood that the discussion of these implementations is only to enable those skilled in the art to better understand and realize the subject matter described herein, and is not intended to limit the protection scope, applicability or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as needed. For example, the methods described may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with respect to some examples may also be combined in other examples.

[0030] As used herein, the term "comprising" and its variants represent open terms meaning "including but not limited to". The...

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Abstract

The invention provides a method and a device for sample data expansion processing. The method comprises the steps of obtaining association relationship data among data nodes corresponding to sample data in a sample data set, wherein the association relationship data are used for reflecting association relationship strength among the data nodes; and for each incomplete sample data in the sample data set, performing data expansion on the incomplete sample data at least partially based on the association relationship data between the data nodes corresponding to the incomplete sample data and allthe associated data nodes and the feature data and / or label data of each associated data node.

Description

technical field [0001] The present disclosure generally relates to the field of computer technology, and more specifically, to a method and device for sample data processing and a model training method and device. Background technique [0002] In the era of big data, a large amount of data is usually generated. Data can be divided into two categories according to their nature: label data and feature data. In the field of machine learning, the label data is generally recorded as y, and the feature data is recorded as x. The main task of machine learning is to find the mathematical relationship between x and y, that is, to find a model f such that y=f(x) . Once this model f is found, when any feature data x' of an unknown label appears, the unknown label y', namely y', can be easily inferred based on the model f existing between the feature x and the label y. =f(x'), so as to complete the model prediction. In order to find this model f and make the prediction accuracy of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/35
CPCG06F16/353
Inventor 向彪周俊李小龙
Owner ADVANCED NEW TECH CO LTD