Electronic device, multi-qualification interface Mock test method and storage medium
A technology of electronic devices and testing methods, applied in electrical components, digital transmission systems, transmission systems, etc., can solve problems such as test obstruction and unstable test environment, and achieve the effect of improving test efficiency and solving test obstruction.
Inactive Publication Date: 2019-08-30
ONE CONNECT SMART TECH CO LTD SHENZHEN
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Problems solved by technology
With the increase of capital, in the process of multiple capital interface testing, the test environment is often unstable or some capital responds wrongly, which leads to the test being blocked
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[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0035] It should be noted that the descriptions involving "first", "second", etc. in the present invention are only for descriptive purposes, and should not be understood as indicating or implying their relative importance or implicitly indicating the number of indicated technical features . Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one...
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The invention relates to a function test, and provides a multi-qualification interface Mock test method, which comprises the following steps: receiving a qualification interface Mock test request sentby a test terminal, the qualification interface Mock test request comprising qualification interface Mock test information; generating a Mock request message to be processed according to the qualification interface Mock test information, wherein the Mock request message comprises a task identifier; matching a corresponding interface Mock object from a built-in Mock object set according to a taskidentifier in the Mock request message; and simulating and processing the interface Mock test request based on the interface Mock object to obtain a Mock response, and returning the Mock response to the test terminal. The problem that the multi-qualification interface test is blocked can be solved, and the test efficiency is improved. In addition, the invention further provides an electronic device and a storage medium.
Description
technical field [0001] The invention relates to the field of interface testing, in particular to an electronic device, a mock testing method for a multi-capital interface and a storage medium. Background technique [0002] In the process of development and growth, financial enterprises usually need to interact with multiple capital parties. For example, in the loan process, they usually need to connect with multiple capital systems, which requires testing the interface performance of the capital system. With the increase of capital, in the process of multi-funder interface testing, there will often be problems such as unstable test environment or wrong response from capital, which will lead to test obstruction. Therefore, how to solve the obstruction of multi-party interface testing and improve the testing efficiency is an urgent problem to be solved. Contents of the invention [0003] In view of this, the present invention proposes an electronic device, a method for mock...
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IPC IPC(8): H04L12/26
CPCH04L43/50H04L43/10
Inventor 杨晓琪
Owner ONE CONNECT SMART TECH CO LTD SHENZHEN