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Microwave dielectric testing of low loss materials te 011 Resonance Mode Identification Method

A microwave dielectric, resonant mode technology, applied in the measurement of resistance/reactance/impedance, measurement device, measurement of electrical variables, etc., can solve problems such as resonant frequency deviation from reality, mode recognition error, low test frequency, etc., to avoid the mode Identifying the wrong effect

Active Publication Date: 2020-10-16
ZHEJIANG UNIV
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Problems solved by technology

This method is more complicated, and because the test frequency of the dielectric constant is several orders of magnitude lower than the microwave frequency band where the resonance is located, the estimated resonance frequency may deviate from the actual, which will also lead to pattern recognition errors

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  • Microwave dielectric testing of low loss materials te <sub>011</sub> Resonance Mode Identification Method
  • Microwave dielectric testing of low loss materials te <sub>011</sub> Resonance Mode Identification Method
  • Microwave dielectric testing of low loss materials te <sub>011</sub> Resonance Mode Identification Method

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Embodiment Construction

[0013] TE 011 The mode is the most commonly used resonant mode in the microwave dielectric performance test of low-loss materials, and its resonant frequency is determined by the dielectric constant and size of the sample placed in the resonator. The sample TE to be tested in the present invention 011 The pattern recognition steps are as follows:

[0014] (1) the diameter D R , thickness H R , dielectric constant ε r,R The reference sample R is placed in the resonator, at this time the resonant system TE 011 Mode resonant frequency f 0,A by D R 、H R , ε r,R Decide. D R , H R , ε r,R get f 0,A . Testing Scattering Parameters Using a Network Analyzer|S 21 |, and at f 0,A Find TE nearby 011 Mode resonance peak, record the measured resonance frequency f 0,1 (like figure 1 shown). f 0,A with f 0,1 The difference does not exceed 1%.

[0015] (2) the diameter D S , thickness H S , dielectric constant ε r,R An unknown sample S to be tested is placed on the re...

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Abstract

The invention relates to a method for identifying a TE011 resonance mode in a low-loss material microwave dielectric test. The method introduces a reference sample having a known dielectric constant.According to the change of the resonance frequency of the TE011 mode when only the reference sample is placed in a resonator and the reference sample and a sample to be tested are placed in the resonator at the same time, the dielectric constant of the sample to be tested can be calculated by a numerical method, and the resonance frequency of the TE011 mode when only the sample to be tested is placed and a microwave dielectric property test is carried out is further calculated. The difference between the calculated value of the resonant frequency and the actual test value is within 1 percent,so that the TE011 mode can be accurately identified from a large number of interference modes. Compared with the previous TE011 resonance mode identification method, the method provided by the invention has the characteristics of accuracy, simplicity and rapidness.

Description

technical field [0001] The invention belongs to the technical field of microwave testing, in particular to the testing technology of microwave dielectric properties of low-loss materials. Background technique [0002] Low-loss dielectric materials are widely used in the field of microwave communication, and the accurate evaluation of their microwave dielectric properties is of great significance to practical applications. The method to accurately evaluate the microwave dielectric properties of low-loss materials is the dielectric resonance method, usually using the TE in the parallel plate and resonant cavity method 011 model. All microwave dielectric resonance systems are multi-mode systems. If the interference mode is used as the required resonance mode in the test, the test results will be completely wrong. Therefore, TE 011 Correct identification of resonance modes is the primary problem to be solved in microwave dielectric testing of low loss materials. So far, TE h...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
CPCG01R27/2623
Inventor 李雷陈湘明
Owner ZHEJIANG UNIV
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