Method and device for detecting glass stress defects
A detection method and defect technology, applied in measuring devices, force/torque/work measuring instruments, optical testing flaws/defects, etc., can solve the problems of poor reliability, low efficiency and poor repeatability of stress lines, and achieve fast and reliable Detection, elimination of dust interference, good repeatability
Active Publication Date: 2019-12-03
SHENZHEN JPT OPTO ELECTRONICS CO LTD
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However, due to the interference of dust or blemishes on the surface of the sample, the reliability of the determination of st
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[0049] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.
[0050] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of descr...
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The invention relates to a method and device for detecting glass stress defects. The method comprises the following steps that linearly polarized light sequentially passes through a glass sample, a quarter-wave plate and an analyzer, wherein the polarization direction of the linearly polarized light is orthogonal to the polarization axis of the analyzer; when the optical axis of the quarter-wave plate is at a first angle, a first image of the glass sample is acquired, wherein the first angle is an angle of the optical axis of the quarter-wave plate relative to a 45-degree angle bisector of thepolarization direction of linearly polarized light and the polarization axis of the analyzer; a second image of the glass sample is acquired when the optical axis of the quarter-wave plate is at a second angle, wherein the second angle is equal to the first angle in magnitude and opposite in sign; a gray value of the first image and a gray value of the second image are acquired; and whether the glass sample has stress defects or not is determined according to the gray value of the first image and the gray value of the second image. The method and the device disclosed by the invention can reduce or even eliminate the interference of flaws or dust on the surface of the glass, and can quickly and reliably detect the stress defects of the glass.
Description
technical field [0001] The invention relates to the field of stress detection, in particular to a method and device for detecting stress defects in glass. Background technique [0002] Usually, due to the impact of various processes in the processing process, there will be residual stress in the glass plate, and the magnitude of the stress is an important criterion for measuring the quality of the glass; if the stress is large, it will have a negative impact on the performance and safety of the glass plate. Clearly serious effects. Therefore, the stress detection of glass is particularly important. [0003] At present, the detection of glass stress defects is mainly carried out by the following method: make linearly polarized light pass through the sample, quarter-wave plate and analyzer in sequence, and then rely on human eyes or computer image recognition to determine the stress inside the sample. The detection principle is: if there is a stress defect in the sample, the...
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Login to View More IPC IPC(8): G01N21/23G01N21/88G01N21/95G01L5/00
CPCG01N21/23G01N21/8851G01N21/8806G01N21/95G01L5/0047G01N2021/8848G01N2021/8887
Inventor 黄继欣王昌奇王大鹏
Owner SHENZHEN JPT OPTO ELECTRONICS CO LTD