Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for analyzing and quantitatively scoring wrong question

A technology of wrong questions and scoring values, applied in the field of online teaching, can solve problems such as inefficiency, untargeted wrong questions, and ineffective rapid improvement of students' academic performance and learning efficiency, so as to improve academic performance and learning efficiency Effect

Inactive Publication Date: 2020-01-14
JIANGSU QUSU EDUCATION TECH
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the existing technology, it is impossible to distinguish which wrong questions are easier to get scores through practice. Through a large number of wrong question sets, the review and preparation for high school entrance examinations are not precisely targeted to students' wrong questions. The sea of ​​questions is adopted. A lot of time is spent on inefficient, repetitive exercises and reviews, which will not effectively improve students' academic performance and learning efficiency quickly

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for analyzing and quantitatively scoring wrong question
  • Method and system for analyzing and quantitatively scoring wrong question

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] For an embodiment of the present invention's method for analyzing and quantifying scoring of wrong questions, see figure 1 , figure 1 It is a flow chart of the method for analyzing and quantifying the wrong questions of the present invention. The method for analyzing and quantifying the wrong questions includes:

[0039] Step 101, collect the data of each examination that all students participate in, including: examination time, examination questions, examination papers and examination results, and the examination papers include: examination paper name, examination questions full marks and knowledge points included in examination questions;

[0040] Step 102, according to collecting the data of each examination that the student participates in, the scoring value of the wrong question is obtained;

[0041] The wrong title scoring value a in step 102 is obtained by step 103:

[0042] Step 103, said wrong question scoring value a is obtained by the following method:

[...

Embodiment 2

[0056] An embodiment of the system for analyzing and quantifying the wrong questions in this application, please refer to figure 2 , figure 2 It is a module block diagram of the system for analyzing and quantifying the wrong questions of the present invention. The system for analyzing and quantifying the wrong questions includes: an acquisition module 1, a data processing module 2, a wrong question scoring module 3 and a test question recommendation module 4;

[0057] The collection module 1 is coupled with the data processing module 2, and is used to collect the data of each examination that all students participate in, and send it to the data processing module 2;

[0058] Collect the data of each test that all students participate in, including: test time, test questions, test papers and test results. The test papers include: test paper name, full score of test questions and knowledge points included in test questions;

[0059] The data processing module 2 is coupled with...

Embodiment 3

[0072] This embodiment is another embodiment of the method for analyzing and quantifying the wrong questions;

[0073] Step 301, collecting student test data:

[0074] Collect the test data that students participate in, including test time, test questions, test papers, student test scores, etc.

[0075] Step 302, extracting student examination data, examination question data and examination paper data;

[0076] Examination paper data extraction: the examination paper ID of the examination, the number of examination papers, and the name of the examination paper

[0077] Exam question data extraction: the ID of the test question contained in the test paper, the full score value of the test question, the degree of differentiation of the test question, and the scoring rate of the test question. The degree of differentiation c of the test question is obtained by the following method:

[0078] c=(v1-v2) / b,

[0079] Wherein, v1 is the average score of the test scores in the top 27...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and a system for analyzing and quantitatively scoring wrong questions, and the method comprises the steps: collecting the data, including the examination time, examination questions, examination papers and examination scores, of each examination participated by all students, and the examination papers comprising the names of the examination papers, the full score values of the examination questions and the knowledge points included in the examination questions; obtaining a wrong question score value according to the collected data of each test in which the student participates; and setting a wrong question scoring value threshold, and recommending the test questions of which the wrong question scoring values are not lower than the wrong question scoring value threshold to the students. The invention provides a method and a system for analyzing and quantitatively scoring wrong questions. The student examination data can be collected and calculated to obtain the wrong question score value, the wrong question score value is the value quantification of one wrong question value for student practice, the test question which is the most easily scored can be pushed to the student through the wrong question score value, and the student can quickly improve the learning performance and learning efficiency of the student.

Description

technical field [0001] This application relates to the field of network teaching, in particular to a method and system for analyzing and quantifying grading of wrong questions. Background technique [0002] In the existing teaching practice, teachers will customize test papers according to certain goals, organize tests, analyze students' test scores, and automatically generate students' wrong question sets. However, in the existing technology, it is impossible to distinguish which wrong questions are easier to get scores through practice. Through a large number of wrong question sets, the review and preparation for high school entrance examinations are not precisely targeted to students' wrong questions. The sea of ​​questions is adopted. A lot of time is spent on inefficient, repetitive exercises and reviews, which will not effectively improve students' academic performance and learning efficiency quickly. Contents of the invention [0003] This application discloses a m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06Q50/20G09B7/04
CPCG06Q10/06393G06Q50/205G09B7/04
Inventor 郭晨阳李可佳陈丽华陈冬雪
Owner JIANGSU QUSU EDUCATION TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com