Lidar based 3-d imaging with structured light and integrated illumination and detection

Abstract

Methods and systems for performing three dimensional LIDAR measurements with multiple illumination beams scanned over a three dimensional environment by one or more optical phase modulation devices are described herein. In one aspect, illumination light from each LIDAR measurement channel is emitted to the surrounding environment in a different direction by an optical phase modulation device. Theoptical phase modulation device also directs each amount of return measurement light onto a corresponding photo detector. The illumination pulse output of each LIDAR measurement channel is synchronized with commanded changes of state of each corresponding optical phase modulation device. In some embodiments, each optical phase modulation device is associated with a single LIDAR measurement channel. In some embodiments, multiple LIDAR measurement channels are associated with a single modulation device. In some embodiments, a one dimensional optical phase modulation device is employed. In otherembodiments, a two dimensional optical phase modulation device is employed.

Description

[0001] Cross references to related applications [0002] This patent application requires priority in accordance with the U.S. patent application titled "LIDAR-based 3-D imaging with structured light and integrated lighting and detection", serial number 15 / 926,095 filed on March 20, 2018 In accordance with the requirements of Article 119 of Chapter 35 of the United States Code, the latter required a sequence filed on March 20, 2017 entitled "LIDAR-based 3-D imaging with structured light and integrated lighting and detection" Priority of US Provisional Patent Application No. 62 / 473,628, the subject matter of each of which is incorporated herein by reference in its entirety. Technical field [0003] The described embodiment relates to a LIDAR-based 3-D point cloud measurement system. Background technique [0004] The LIDAR system uses light pulses to measure the distance to an object based on the time of flight (TOF) of each light pulse. Light pulses emitted from the light source of...

AI Technical Summary

Problems solved by technology

This leads to optomechanical design complexity and alignment difficulties

[0011] Additionally, mechanical devices employed to scan the illumination beam in different directions may be sensitive to mechanical vibrations, inertial forces, and general environmental conditions

These mechanisms can degrade without proper design, resulting in loss of performance or failure

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