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Exposure delay measurement method, device and storage medium

A measurement method and technology of exposure time, which are applied to TV, color TV parts, TV system parts, etc., can solve the problem of inability to accurately measure the change of exposure delay of industrial cameras, and the inability to determine the target exposure time interval of industrial cameras. And other issues

Active Publication Date: 2021-05-11
SHENZHEN YANMADE TECH CO LTD
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  • Summary
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  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of this, the embodiment of the present application provides an exposure delay measurement method, device and storage medium to solve the problem that in the prior art, it is impossible to accurately measure the change of the exposure delay of an industrial camera under different exposure conditions, and it is impossible to determine the exposure delay. Describe the problem of the stable target exposure time interval of industrial cameras

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  • Exposure delay measurement method, device and storage medium
  • Exposure delay measurement method, device and storage medium
  • Exposure delay measurement method, device and storage medium

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Embodiment Construction

[0052] In order to make the purpose, features and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the following The described embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0053] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other features. , whole, step, operation, element, component and / or the presence or...

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Abstract

The present application belongs to the technical field of industrial photographing, and in particular relates to an exposure delay measurement method, device and storage medium. The method includes: obtaining the exposure time of the industrial camera; obtaining the exposure delay change interval of the industrial camera; determining the target exposure time interval according to the exposure time and the exposure delay change interval, wherein the The target exposure time interval is a time interval in which the shutter of the industrial camera is always open. Through the embodiments of the present application, it is possible to quickly and accurately measure the variation of the exposure delay of the industrial camera under different exposure conditions, and then determine the stable target exposure time interval of the industrial camera.

Description

technical field [0001] The present application belongs to the technical field of industrial photographing, and in particular relates to an exposure delay measurement method, device and storage medium. Background technique [0002] With the rapid development of industrial technology, the demand for machine vision is growing. At present, in many industrial application scenarios, high-speed "flying photography" is required. In order to avoid smear, the exposure time of industrial cameras needs to be reduced to the "microsecond" level, such as 15us. [0003] However, in the related art, there is no method for accurately measuring the change of the exposure delay of the industrial camera under different exposure conditions. [0004] It should be noted that the information disclosed in the above background technology section is only used to enhance the understanding of the background of the application, and therefore may include information that does not constitute prior art kno...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00H04N5/235
CPCH04N17/002H04N23/73
Inventor 陈忠权
Owner SHENZHEN YANMADE TECH CO LTD