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A Fitting Measurement Method of Multiplied CCD Multiplied Gain

A measurement method and gain control technology, applied in TV, electrical components, image communication, etc., can solve problems such as large deviation of test results and poor stability

Inactive Publication Date: 2021-09-14
HARBIN ENG UNIV
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Problems solved by technology

In the identification test, the existing gain test method of EMCCD has problems such as large deviation of test results and poor stability. It is necessary to improve the existing method for the corresponding problems, and design a higher precision and stronger stability. test method

Method used

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  • A Fitting Measurement Method of Multiplied CCD Multiplied Gain
  • A Fitting Measurement Method of Multiplied CCD Multiplied Gain
  • A Fitting Measurement Method of Multiplied CCD Multiplied Gain

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Embodiment Construction

[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0027] The invention relates to a multiplication gain measurement method of a multiplication CCD (EMCCD) image sensor, which belongs to the technical field of electronic component testing.

[0028] This method is based on the photoelectric conversion theory and the linear model of the image sensor:

[0029] The imaging area, storage area and readout register of EMCCD are the same as the traditional frame transfer CCD structure, but a series of gain register structures are added between the readout register and the output amplifier. Based on the structure and working method of EMCCD, attached figure 2 The information flow diagram of EMCCD is given, where the system gain K includes the multiplication gain and output amplifier gain of EMCCD. Through literature research and mathematical modeling, making full use of existing research and experimental conclusion...

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Abstract

The invention relates to the technical field of testing electronic components, in particular to the field of a multiplied CCD (EMCCD) multiplied gain fitting measurement method. The method comprises the steps of: setting the multiplication gain control register to be 0, and the EMCCD obtains a group of mean values ​​of the image grayscale signal for different exposure times under flat field light and dark field; setting the multiplication gain control register to be x, and the EMCCD A set of mean values ​​of image grayscale signals were obtained for different exposure times under flat field light and dark field respectively; two straight lines were fitted by the least square method, and the ratio of the slope of the straight line to the slope of the straight line was the current multiplication gain of the EMCCD. The method has the beneficial effect of providing an EMCCD multiplication gain measurement method based on multiple sets of data. Compared with the existing method, it can obtain more accurate multiplication gain, is stable and reliable, and is suitable for engineering applications.

Description

technical field [0001] The invention relates to the technical field of testing electronic components, in particular to the field of a multiplied CCD (EMCCD) multiplied gain fitting measurement method. Background technique [0002] EMCCD is an electron multiplier CCD, which is a high-end photoelectric detection product with extremely high sensitivity in the detection field. With the rapid development of EMCCD, it has been widely used in military, astronomical and other fields, and gradually penetrated into all aspects of people's daily life. EMCCD has high quantum efficiency and strong detection efficiency for low-light images, and is an all-solid-state electron multiplier device. Its manufacturing cost is low, its lifespan is long, its stability is high, and its multiplier gain can be adjusted to meet the application requirements of all-weather and large dynamic range. In the identification test, the existing gain test method of EMCCD has problems such as large deviation o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 温强金敬文朱垚鑫
Owner HARBIN ENG UNIV
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