High-speed original cable electrical integrity test fixture

Abstract

A high-speed original cable electrical integrity test fixture comprises a lower shell, a PCB, an upper shell, an original cable, a pair of connectors, a pressing block and a rotating arm, wherein a top of the lower shell is provided with a plate groove; the PCB is connected into the plate groove, and a pair of signal lines extending from one end of the PCB to the other end of the PCB is arrangedon the PCB; the upper shell is connected to the top of the lower shell, and a pressing block groove is arranged in the upper shell; the original cable is connected to one end of the PCB, the originalcable includes a pair of wire ends, and each conductive end is electrically connected to one signal line; the pair of connectors is connected to the other end of the PCB, and each connector is electrically connected to one signal line; one end of the pressing block is rotatably connected into the pressing block groove, and the other end of the pressing block is used for pressing the pair of wire ends; and the rotating arm is rotatably connected to the top of the upper shell and is used for pressing the pressing block so as to press the pair of wire ends. The high-speed original cable electrical integrity test fixture provided by the invention is good in impedance continuity, avoids parameter distortion, and can be applied to tests of the original cables up to 20 GHz to 60 GHz.

Description

technical field [0001] The invention belongs to the technical field of electrical testing, and more specifically relates to a high-speed original cable electrical integrity testing fixture. Background technique [0002] With the storage and transmission of large data and the doubling of the data rate of modern high-speed cables, the manufacture and testing of high-speed bulk cables has become particularly important. [0003] At present, the test of high-speed original cables has been plagued by various high-speed cable manufacturers, making the improvement of the rate performance of high-speed cables a major problem. When the frequency of the test is as high as 20GHz, especially the single-channel rate is as high as 25.89GbpsEthernet, 28Gbps For NRZ, 56Gbps PAM4, 112Gbps PAM4, and even 200Gbps PAM4, due to the limitation of the test fixture performance, such as the discontinuity of the characteristic impedance, the distortion and resonance of the test signal are easy to occu...

AI Technical Summary

Problems solved by technology

[0003] At present, the test of high-speed original cables has been plagued by various high-speed cable manufacturers, making the improvement of the rate performance of high-speed cables a major problem. When the frequency of the test is as high as 20GHz, especially the single-channel rate is as high as 25.89GbpsEthernet, 28Gbps For NRZ, 56Gbps PAM4, 112Gbps PAM4, and even 200Gbps PAM4, due to the limitation of the test fixture performance, such as the discontinuity of the characteristic impedance, the distortion and resonance of the test signal are easy to occur. Impedance discontinuity, insertion loss test curve resonance, S-parameter distortion and other testing technical problems, so high-speed cable manufacturers cannot accurately control the improvement of high-speed cable manufacturing capabilities

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