Unlock instant, AI-driven research and patent intelligence for your innovation.

Cluster failover performance test method and device, and storage medium

A failover and testing method technology, applied in the direction of digital transmission systems, electrical components, transmission systems, etc., can solve the problems of inability to achieve the rigor of the test work, the transparency of the test process, and the difficulty of observing the process of failover, so as to achieve the test Rigorous process and convincing effect

Inactive Publication Date: 2020-05-19
INSPUR SUZHOU INTELLIGENT TECH CO LTD
View PDF2 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the master-slave node alternation time is very short, it is difficult to observe the failover process when the functional test is performed only by manual operation, and the rigor of the test work and the transparency of the test process cannot be achieved.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Cluster failover performance test method and device, and storage medium
  • Cluster failover performance test method and device, and storage medium
  • Cluster failover performance test method and device, and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0046] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

[0047] According to one aspect of the present invention, an embodiment of the present invention proposes a method for testing the failover function of a cluster, such as figure 1 As shown, it may include steps: S1, establishing a connection with the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a cluster failover performance test method and device. The method comprises the following steps of: establishing connection with a main node in a cluster; writing data to the main node; in response to prompt of disconnection in the data writing process, pausing writing data to the main node in the cluster and then shutting down the main node to disconnect the main node; after a preset time period, judging whether connection with the main node in the cluster can be established or not; and in response to the fact that the connection with the main node in the cluster cannot be established, prompting that a failover function of the cluster is invalid. The invention further discloses computer equipment and a readable storage medium. According to the scheme provided by the invention, the data is continuously written into the main node, and the error prompt is output when the main node fails, so that the whole process of cluster failover can be clearly observed, the automatic failover test becomes visual and transparent, and the whole test process is more rigorous and persuasive.

Description

technical field [0001] The invention relates to the field of testing, in particular to a testing method, equipment and storage medium for the failover function of a cluster. Background technique [0002] In an available cluster, the high availability achieved by Redis is compared with the high availability achieved by Sentinel. Redis emphasizes data fragmentation or node scalability. If the corresponding slave nodes are added to the master node of the cluster, the cluster It can automatically fail over, which has a great advantage over Sentinel. [0003] The automatic failover of Redis Cluster means that when the master node is down, the slave node will be upgraded to the master node within 1 second to replace it to provide external services, making the application completely unaware, and when the master node restarts, it will automatically become Slave nodes, so as to achieve high availability of the cluster. Because the master-slave node alternation time is very short, i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/24H04L29/08
CPCH04L41/0663H04L41/22H04L67/10
Inventor 崔新辉
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com