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Mass spectroscope and mass calibration method for mass spectroscope

A technique for mass spectrometry analysis and calibration methods, which is applied in the field of mass spectrometry analysis devices and mass calibration of mass spectrometry devices, and can solve problems such as mass deviations

Pending Publication Date: 2020-09-18
SHIMADZU SEISAKUSHO CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, in TOFMS (MALDI-TOFMS) equipped with a MALDI ion source, the flight distance also changes due to the inclination of the sample plate on which the sample is placed or the unevenness of the sample surface, resulting in mass deviation.

Method used

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  • Mass spectroscope and mass calibration method for mass spectroscope
  • Mass spectroscope and mass calibration method for mass spectroscope
  • Mass spectroscope and mass calibration method for mass spectroscope

Examples

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Embodiment Construction

[0067] Hereinafter, an imaging mass spectrometry system as an embodiment of the mass spectrometry apparatus according to the present invention will be described with reference to the attached drawings.

[0068] figure 1 It is a structural diagram of the main part of the imaging mass spectrometry system of this embodiment.

[0069] The imaging mass spectrometry system of this embodiment includes a measurement unit 1, a data processing unit 3, a control unit 4, an input unit 5, a display unit 6, and the like.

[0070] The measurement unit 1 includes: a sample stage 10 for placing the sample 11; a stage drive unit 12 that moves the sample stage 10 along the directions of the X and Y axes orthogonal to each other; and a laser irradiation unit 13. It is used to perform ionization based on the MALDI (Atmospheric Pressure MALDI) method; a mass separation section 14 which separates the ions generated from the sample 11 based on the mass-to-charge ratio; and a detection section 15 which sequ...

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PUM

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Abstract

A matrix derived peak information acquisition unit (31) creates a peak list summarizing various species of matrix derived ions and their theoretical m / z values on the basis of results of analyzing samples only of the matrix and stores the same in a matrix derived peak information storage unit (32). If an actually measured mass spectrum for target samples is obtained, a standard peak detection unit(33) for mass calibration uses the peak list corresponding to the matrix used in the analysis to identify matrix derived ion peaks appearing in the actually measured mass spectrum. A mass calibrationinformation calculation unit (35) finds mass calibration information from the m / z values actually measured for identified peaks and the theoretical m / z values, and a mass calibration processing unit(37) uses the mass calibration information to correct the m / z values for the target compound derived peaks in the actually measured mass spectrum. Thus, it is possible to perform accurate mass calibration without using reference substances or even when ions derived from reference substances cannot be measured at sufficient intensities.

Description

Technical field [0001] The present invention relates to a mass spectrometry device and a mass correction method of the mass spectrometry device, and more specifically, to a mass spectrometry device equipped with an ion source and a mass correction method of such a mass spectrometry device, wherein the ion The source adds a matrix as an ionization auxiliary agent to the sample by matrix-assisted laser desorption ionization (MALDI) method or the like or attaches the matrix to the sample to perform ionization. Background technique [0002] In the mass spectrometer, due to various reasons, there is a difference between the mass obtained by actually measuring a certain compound and the theoretical mass, that is, a mass deviation occurs. In the case of a time-of-flight mass spectrometer (TOFMS), the change in the extraction voltage of ions used to introduce ions into the flight space, the change in the flight distance caused by the expansion or contraction of the device with temperatur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/06G01N27/62H01J49/40
CPCH01J49/0036H01J49/164G01N27/623H01J49/0004
Inventor 池上将弘
Owner SHIMADZU SEISAKUSHO CO LTD
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