Multi-stress-based rail transit electronic control device service life evaluation method and device

Abstract

The invention discloses a multi-stress-based rail transit electronic control device service life evaluation method and device, and the method comprises the following steps: S1, building an acceleration model between various types of sensitive stress and the service life of an electronic control device, and building a service life estimation model of the electronic control device according to the acceleration model; s2, executing a plurality of groups of accelerated life tests on the to-be-evaluated electronic control device, wherein each group of accelerated life tests respectively correspondsto combinations of different sensitive stress levels; s3, performing parameter solving on the constructed life estimation model according to the life test results of each group of sensitive stress levels to obtain a life estimation model after parameter solving; and S4, obtaining each sensitive stress of the to-be-evaluated electronic control device under a normal operation condition, and obtaining a service life evaluation result of the to-be-evaluated electronic control device according to the service life estimation model after parameter solving. The invention has the advantages of being simple in implementation method, high in evaluation efficiency and reliability and the like.

Description

technical field [0001] The invention relates to the technical field of rail transit electronic control devices, in particular to a method and device for evaluating the life of rail transit electronic control devices based on multiple stresses. Background technique [0002] As a vehicle-mounted device that integrates functions such as control, network communication, and fault diagnosis, the electronic control device for rail transit is crucial to the stability and reliability of the train network system for its life and reliability. In order to quickly evaluate the reliability and life level of rail transit electronic control devices and reduce test costs, it is usually necessary to use accelerated stress tests such as accelerated life tests for test evaluation. However, the traditional accelerated life test can generally only realize the product life evaluation of a single environmental stress (such as temperature, etc.), while rail transit electronic devices will be subject...

AI Technical Summary

Problems solved by technology

However, the traditional accelerated life test can generally only realize the product life evaluation of a single environmental stress (such as temperature, etc.), while rail transit electronic devices will be subjected to various environmental stresses (such as temperature, humidity, vibration, etc.) in actual operation. Stress will directly affect the service life of the device. A single environmental stress cannot truly reflect the working state of the rail transit electronic control device in the actual operation process, so it cannot accurately simulate the real environmental stress condition of the rail transit electronic control device on site. The evaluation accuracy of the above-mentioned life evaluation method based on a single environmental stress is not high

Even if multiple environmental stresses are considered, at present, the device life assessment is usually based on each single environmental stress first, and then the final evaluation results are obtained by combining the assessment results. The evaluation method still cannot accurately reflect the working status of the rail transit electronic control device in the actual operation process, and the evaluation accuracy is still not high

Images