Multi-stress-based rail transit electronic control device service life evaluation method and device

An electronic control device and life evaluation technology, applied in electrical digital data processing, instruments, geometric CAD, etc., can solve the problems of low evaluation accuracy, complex implementation process, low efficiency, etc., to improve evaluation accuracy, reduce test costs, Guaranteed effect of reliability
CN112214827APending Publication Date: 2021-01-12CSR ZHUZHOU ELECTRIC LOCOMOTIVE RES INST

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
CSR ZHUZHOU ELECTRIC LOCOMOTIVE RES INST
Publication Date
2021-01-12

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Abstract

The invention discloses a multi-stress-based rail transit electronic control device service life evaluation method and device, and the method comprises the following steps: S1, building an acceleration model between various types of sensitive stress and the service life of an electronic control device, and building a service life estimation model of the electronic control device according to the acceleration model; s2, executing a plurality of groups of accelerated life tests on the to-be-evaluated electronic control device, wherein each group of accelerated life tests respectively correspondsto combinations of different sensitive stress levels; s3, performing parameter solving on the constructed life estimation model according to the life test results of each group of sensitive stress levels to obtain a life estimation model after parameter solving; and S4, obtaining each sensitive stress of the to-be-evaluated electronic control device under a normal operation condition, and obtaining a service life evaluation result of the to-be-evaluated electronic control device according to the service life estimation model after parameter solving. The invention has the advantages of being simple in implementation method, high in evaluation efficiency and reliability and the like.
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Description

technical field

[0001] The invention relates to the technical field of rail transit electronic control devices, in particular to a method and device for evaluating the life of rail transit electronic control devices based on multiple stresses. Background technique

[0002] As a vehicle-mounted device that integrates functions such as control, network communication, and fault diagnosis, the electronic control device for rail transit is crucial to the stability and reliability of the train network system for its life and reliability. In order to quickly evaluate the reliability and life level of rail transit electronic control devices and reduce test costs, it is usually necessary to use accelerated stress tests such as accelerated life tests for test evaluation. However, the traditional accelerated life test can generally only realize the product life evaluation of a single environmental stress (such as temperature, etc.), while rail transit electronic devices will be subject...

Claims

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