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Start-up test system and start-up test method

A test method and a test system technology, which are applied in the direction of using power-on test to detect faulty hardware, faulty hardware test method, transmission system, etc., can solve the problems of time waste, long test time, and failure to find smart network card errors in real time, and achieve cyclic testing consistent effect

Active Publication Date: 2022-03-15
INVENTEC PUDONG TECH CORPOARTION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if the test time of the smart network card is long, after the test of the server host is completed, it is necessary to wait for the test of the smart network card to complete.
[0005] As mentioned above, since the operating systems of the two are independent of each other, that is, the test programs of the two do not affect each other, so when an error occurs during the test of the smart network card, the test program of the server host will not appear due to the smart network card. If it stops due to an error, it will continue to restart and cause the test program of the smart network card to restart, so that the smart network card will always re-execute the test program, and it will not be possible to detect the errors that occur when the smart network card executes the test program in real time
[0006] In addition, because the existing test methods cannot guarantee the length of time for the two test programs to run, after each server host test is completed, it is necessary to increase the sleep time to ensure that both tests are completed, resulting in a waste of time
Even when the smart network card crashes during a certain test, not only the crash cannot be retained, but also the number of smart network card test failures will occur, which will cause the cycle test times of the smart network card and the server host to be out of sync.

Method used

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  • Start-up test system and start-up test method

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Embodiment Construction

[0034] see figure 1 , figure 1 A system schematic diagram of a boot-up testing system provided by a preferred embodiment of the present invention is shown. Such as figure 1 As shown, a boot test system 100 includes a server 1 and an iNIC 2 .

[0035] The server 1 includes a startup control module 11 and a server test program execution module 12 . The start-up control module 11 has a first start-up mode and a second start-up mode, the first start-up mode keeps the server 1 in a power-off state under a re-power supply state; the second start-up mode makes the server enter a start-up state under a re-power supply state state, and the startup control module 11 defaults to the first startup mode; in more detail, the first startup mode refers to that the server 1 remains in the shutdown state after being powered on again, that is, the power-off state, and the second startup mode refers to After the server 1 is powered on again, it will enter the power-on state, that is, the powe...

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Abstract

The invention provides a start-up test system and a start-up test method. The boot test system includes a server and an intelligent network card. The described start-up test method is to control the server and the smart network card to execute a server test program and a network card test program respectively, and then when the server test program is tested to be qualified, the server is changed from a default first start-up mode to a second start-up mode, The network card test program is to compare whether the server is in the second startup mode after the test is passed, so as to modify the server from the second startup mode to the first startup mode, and finally re-execute the server test program and the network card test program synchronously.

Description

technical field [0001] The invention relates to a start-up test system and a start-up test method, in particular to a start-up test system and a start-up test method applied to servers and smart network cards. Background technique [0002] In the server manufacturing process, usually after the server is manufactured, the entire manufacturing process is completed after the inspection of the cycle test. In addition to the server host, the existing server will also include a smart network card, which is the finished product of the server. It will contain components such as smart network cards, so when testing the server, it will mainly test the server host and smart network cards. [0003] However, for a general server host and the iNIC, the operating systems of the server host and the iNIC are independent, but the server host also provides power to the iNIC plugged into the server host. Therefore, in the existing test process, the overall power-on test action of the two is us...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G06F9/4401H04L43/0817H04L43/00
CPCG06F11/2273G06F11/2284G06F9/4403G06F9/4416H04L43/0817H04L43/14
Inventor 艾学庭
Owner INVENTEC PUDONG TECH CORPOARTION
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