245results about How to "Reduce test cost" patented technology

The invention provides a test system and test method of a radio frequency identification index. The test system comprises a shielding box used for placing equipment to be tested, a test antenna is arranged in the shielding box, the test antenna is connected with a radio frequency parameter tester, the radio frequency parameter tester is connected with a computer, and the computer is further connected with the equipment to be tested. Test signals of the test method are sent through the equipment to be tested, the radio frequency parameter tester receives the test signals through the test antenna, the test signals are coupled with the test antenna through the antenna of the equipment to be tested to be transmitted to the radio frequency parameter tester to complete test analysis. According to the test system and test method, a test process and the test method are simplified, production cost of a test fixture is eliminated, test cost is saved, test operation is easy to achieve, and a test controller can be familiar with the test process conveniently; the test speed is high, test efficiency is improved, and a test result is stable and reliable.

A process for manufacturing a plurality of leadless semiconductor packages includes an electrically testing step to test encapsulated chips in a matrix of a leadless leadframe. Firstly, a leadless leadframe having at least a packaging matrix is provided. The packaging matrix defines a plurality of units and a plurality of cutting streets between the units. The leadless leadframe has a plurality of leads in the units and a plurality of connecting bars connecting the leads along the cutting streets. A plated metal layer is formed on the upper surfaces of the leads and the upper surfaces of the connecting bars. After die-attaching, wire-bonding connection, and encapsulation, the leadless leadframe is etched to remove the connecting bars, then two sawing steps are performed. During the first sawing step, the plated metal layer on the upper surface of the connecting bars is cut out to electrically isolate the leads. Therefore, a plurality of chips sealed by an encapsulant on the packaging matrix can be electrically tested by probing which is performed between the first sawing and the second sawing. Thereafter, the encapsulant is cut to form a plurality of individual package bodies of the leadless semiconductor packages during the second sawing.

The invention discloses a method and a system for testing the performance of a distributed file system (DFS). The method comprises the following steps of: receiving a performance test parameter input by a test user, generating a test scene table, and generating a test program corresponding to each test scene in the test scene table according to the test scene table; creating a virtual machine (VM) corresponding to each test client according to the platform types and maximum number of the test clients, which are set in the performance test parameter, and configuring a network parameter for the created VM; automatically installing a test client program for the created VM; sequentially loading the VM and a storage node which are required by each test scene in the test scene table, and starting a test; and acquiring test data of a running test of the storage node, and generating a test result report. By the method and the system, test efficiency can be improved, and test cost can be reduced.

The invention discloses an integrated tester for low-light image intensifier and a test method of the tester. The integrated tester comprises a light source, a neutral color filter, an integrating sphere, a diaphragm, a conjugate lens, a camera obscura, a parallel light pipe and a replaceable movable part; and parts except a resolution test assembly, a brightness gain assembly and a signal to noise ratio test assembly of the whole tester are shared. During parameter test, a corresponding parameter assembly is pushed into a guiding block of guide rails, so that the two guide rails are in seamless butt joint. According to the tester and test method, integrated design is used, and three technical indexes including the signal to noise ratio, the brightness gain and the resolution of the low-light image intensifier are tested in one set of instruments, namely the tester.

The embodiment of the invention discloses a system and method for testing radio frequency (RF) of a long term evolution (LTE) base station. The system comprises a signal generator, a spectrum analyzer, a control personal computer (PC), an internal local area network (LAN), a circulator, an RF switch, a remote radio unit (RRU) and an auxiliary control unit. The signal generator, the spectrum analyzer, the control PC, the circulator, the RF switch, the RRU and the sub-control unit are connected to the internal LAN by network cables and used for interacting orders and data by the internal LAN. According to the embodiment of the application, automatic RF test demands of an LTE system can be met.

The invention discloses a chip testing method and a chip. The method includes the steps that a JTAG pin and a functional pin are reused, the JTAG pin which is reused is used for configuring a control signal of a self-defined register in a TAP, the control signal is used for controlling a specific testing signal gated by a MUX, the functional pin which is reused is used for outputting a testing signal, the self-defined register is added to the inner portion of the TAP, and the self-defined register is used for generating a corresponding control signal according to the configuration of the JTAG pin which is reused and controlling the specific testing signal gated by the MUX. The chip testing method is suitable for debugging an internal signal of the chip.

The present invention provides a testing circuit and a testability design method thereof for an on-chip multinuclear processor; wherein, the testing circuit comprises a testing shell register chain, a chip core connecting circuit waiting to be tested, an on-chip data path connecting circuit and a control logic circuit. The chip core connecting circuit waiting to be tested is an interconnection circuit, which is connected between the testing shell register chain and the chip core waiting to be tested. The on-chip data path connecting circuit is the interconnection circuit which is connected between the testing shell register chain and the on-chip data path. The control logic circuit controls the data flow direction of the chip core connecting circuit waiting to be tested and the on-chip data path connecting circuit. The present invention conducts an optimum design according to the characteristics of the on-chip multinuclear processor. The bandwidth of the on-chip data path is fully used. The testing cost is reduced and the amount of a transmission data packet in the on-chip data path is reduced. So an extra power spending caused by mass active data packet is greatly reduced and the testing time is greatly shortened.

The invention discloses an automatic television circuit board function testing method and an automatic television circuit board function testing system. The system consists of a test board for arranging a television circuit board to be tested, a signal conversion and controller module, a control computer and a signal generator which are sequentially connected, wherein the output end of the signalgenerator is connected with the input end of the test board. In the method and the system, test data is transmitted to a computer for comparison test in a network transmission way by adopting a conventional television scheme with network and high-definition multimedia interface (HDMI) functions in combination with a signal conversion and control system consisting of a micro control unit (MCU) to cancel an image acquisition card and save test cost. The scheme provided by the invention supports multi-path HDMI input and further supports the simultaneous test of a plurality of platforms without additional system platforms, so system test difficulties and system cost are reduced.

The invention discloses a wireless sensor network remote protocol conformance testing system which comprises at least one client terminal, a front-end testing device and a remote protocol conformance testing server. A user applies a testing request to the remote protocol conformance testing server through a Web browser of the client terminal. The remote protocol conformance testing server intelligently processes the testing request through a protocol demand model and an executable testing set can be automatically generated. The remote protocol conformance testing server is connected with the front-end testing device through the Internet, transmits a test configuration order, remotely controls the front-end testing device to receive the test configuration order in a dispatched mode, stimulates a measured device and acquires information of the measured network and the measured device. The remote protocol conformance testing server carries out protocol analysis on the obtained information according to an internal protocol analysis model in the remote protocol conformance testing server and a protocol conformance test report is generated. The wireless sensor network remote protocol conformance testing system can solve the problems that an existing protocol conformance testing system is small in test control distance range and low in automation level.

The invention discloses a differential testing method of power density distribution of an electron beam. The differential testing method comprises the following steps: firstly arranging a testing system; designing a Faraday cup sensor; enabling the electron beam to move along a path which is parallel to the length direction of a slit, wherein the path is a forward stroke scanning path, and signals acquired during the process are effective signals and are used for follow-up processing; enabling the electron beam to move in reverse direction after the electron beam completely passes through theslit, wherein the path is a reverse stroke scanning path, and the signals acquired during the process are invalid signals and are not stored; repeating the steps and enabling projection spots of the electron beam on a tungsten sheet to move from one side to the other side of the slit; setting a current density distribution function of the electron beam as f(x,y), and then getting a power density distribution function g(x,y) which equals f(x,y)*Ua; and performing forward stroke scanning n times during the whole deflection scanning, then getting n fi(x)s, using computer software to draw the n fi(x)s into a current density distribution graph and finally getting a power density distribution graph and the diameter. The differential testing method disclosed by the invention does not need to usea new metal test sample to measure power density distribution every time, thereby saving the testing cost.

The invention provides a testing system and method for an ultrahigh sound velocity two-dimensional plasma sheath, and is used for measuring electromagnetic scattering parameters of the ultrahigh soundvelocity plasma sheath. The system comprises a plasma generator, an antenna, a vector network analyzer, a programmable power system and a plasma density diagnosis system. The method comprises the following steps: arranging the plasma generator of the ultrahigh sound velocity plasma sheath on a rotary table; arranging the 1-8 GHz antenna on one side of the generator; calibrating the antenna through the vector network analyzer; recording and processing emitted and received signals of the antenna through a port, so as to obtain scattering parameters; diagnosing plasma produced in the plasma generator through a spectrograph; and controlling plasma related important parameters through a computer. The system fills the gap of the measurement of parameters of the ultrahigh sound velocity two-dimensional plasma sheath, provides an experimental evidence for the research of plasma sheath electromagnetic simulation, and lays a foundation for exploration and solving the problem of communication blackout of aircrafts.

A bending test method for a flexible screen, comprising: connecting a flexible screen (300) to an installation device (100); conducting a mechanical extrusion test on the flexible screen (300), so that the flexible screen (300) is bent, an extrusion point of the mechanical extrusion test deviating from a connection point of the flexible screen (300) and the installation device (100); and conducting bending property detection on the flexible screen (300). The bending property of the flexible screen (300) is tested by way of simulating the operating environment of the flexible screen (300) through the mechanical extrusion test, and compared with a traditional bending test method and device for a flexible screen, the present invention has a simple and convenient operation and low test costs. Also provided is a bending test system for a flexible screen.

The invention discloses a radiation anti-interference test monitor system for an automotive electronic control unit. The system comprises a transmitting antenna and an electronic control unit to be detected, which are arranged within an EMC (electro magnetic compatibility) darkroom, and signal imitation equipment, a protocol signal receiving and dispatching module and a control master machine, which are arranged outside the EMC darkroom,. The control master machine controls the protocol signal receiving and dispatching module and the signal imitation equipment to generate protocol input signals and non-protocol input signals required for imitating the working condition of a whole automobile, the protocol input signals and the non-protocol input signals are transmitted to the electronic control unit to be detected through an optical fiber, and an output signal generated by the electronic control unit to be detected is timely monitored, so that the aim of test can be achieved. The signal transmission among the signal imitation equipment, the protocol signal receiving and dispatching module and the electronic control unit to be detected is realized by the optical fiber, so that the influence of the veracity of a test result caused by electromagnetic interference when the signal is transmitted can be avoided; and therefore, a real test result can be obtained.

The invention provides an automatic parking simulation test method and system which are used to reduce testing cost and increase work efficiency. In the invention, an animation simulation platform isused to build a test scene, and an automatic test platform is used to build a test script. In an automatic testing phase, the automatic test platform is used to control the operating parameters of a vehicle dynamics model through a human-computer interaction platform according to the test script and the vehicle control command of a parking controller, and generate a test report so as to realize the automation of simulation testing. In the technical scheme, a real vehicle does not need to participate, and a testing process is automatically executed by the automatic test platform so that test cost is reduced and work efficiency is increased.

The invention relates to a card reader testing tool. The card reader testing tool is connected with a computer through a card reader and comprises a microcontroller and a storing device chip, wherein the microcontroller is used for receiving a sensing command sent by the computer through an interface, recognizing the type of the interface connected with the card reader after the sensing command is received, analyzing the communication protocol of the interface and switching to the mode of the analyzed communication protocol so that data transmission complies with the criterion of the analyzed communication protocol, and the storing device chip is used for generating a read-write command in order to read and write the data on the storing device and sending the data read and written from the storing device to the computer according to the criterion of the communication protocol in order to judge whether the card reader is qualified or not.

The invention relates to the detection of tripolycyanamide, in particular to a method and a device for detecting tripolycyanamide. The method comprises: preprocessing a sample to be detected to remove proteins; allowing obtained clear liquid to pass through an anionic and cationic ion exchange series column at a constant flow rate; transferring the clear liquid to be detected and buffer solution into a cell for samples to be detected; inserting an ion selective electrode modified by a molecular imprinted polymer into the cell; generating an electric potential signal; and determining the tripolycyanamide content of the sample to be detected by using an electric potential value according to a standard curve. In the device, one end of the anionic and cationic ion exchange series column, a second flow injection device and a container for the samples to be detected are connected with a three-way valve respectively; the other end of the anionic and cationic ion exchange series column is connected with an ultramicropore protein filter through a first flow injection device; and the second flow injection device is connected with a buffer solution tank; and the ion selective electrode modified by the molecular imprinted polymer is inserted into the container for the samples to be detected. The method and the device have the advantages of high flexibility, low operation cost, suitability for in-situ monitoring and the like in the detection of tripolycyanamide.

The invention discloses a testing device and method for a digital semiconductor device; the testing device comprises a time series generator module, an algorithm vector generator module, a programmable data selector module and a testing module, wherein the testing module comprises a logic testing module, a waveform format controller module, a base pin circuit module and a digital comparing module; the logic testing module receives a main clock signal and a first testing vector and simultaneously sends a second testing vector to the waveform format controller module; the first testing vector is transmitted to the logic testing module and is stored before testing begins; and when testing begins, the logic testing module selects the stored first testing vector, forms and transmits the second testing vector to the waveform format controller module. The testing device intensifies the functions of a tester of the traditional memory so that the tester not only has the powerful testing function of the traditional memory, but also has the testing capability of a complex logic device; and simultaneously the very strong simultaneous testing capability of the tester is beyond that of the traditional logic tester, thereby effectively reducing the testing cost and saving the testing time.

The invention discloses an electromechanical system equipment health assessment method, and the method comprises the following steps: carrying out the structure and function decomposition of an electromechanical system; obtaining historical operation parameters of all sub-parts; carrying out an extension failure mode and impact analysis based on a decomposition result, and determining representation parameters for representing a fault; determining a key feature factor set affecting the health of the system, and constructing multi-dimensional space parameters representing early state mode recognition indexes; obtaining a sensor signal, and carrying out fault abnormality detection according to the multi-dimensional space parameters. The method is low in testing cost, is weaker in background noises, is complete in state information, and can meet the information demands for equipment health management.

The invention provides a terminal product driver loading stability testing method, which includes the steps: firstly, starting remote wakeup support in a BIOS (basic input/output system) of a terminal to be tested, writing a countdown automatic shutdown script and placing the script in a startup folder; and secondly, setting a remote wakeup program in a server, establishing a remote wakeup batch processing file and a vbs (visual basic script) file for realizing automatic looping execution of the remote wakeup batch processing file, automatically operating the remote wakeup batch processing file after operating the vbs file, realizing automatic looping boot of the terminal to be tested, reading driver information from the BIOS, automatically operating the countdown automatic shutdown script prior to shutting down the terminal to be tested after completely loading a driver, and clearing the loaded driver information. By the aid of the method, automatic repeated driver loading for the terminal to be tested is realized, terminal driver loading stability is reflected more really and accurately, manual operation and watching are omitted in the whole testing process, and testing cost is reduced.

The invention discloses a port-environment-oriented man-machine hybrid automatic driving test method and a test platform thereof. On the basis of SCANeR, a vehicle driving environment required by a test is created; a vehicle model is established according to vehicle parameters, the detection of a simulation sensor is far away from a virtual vehicle-mounted sensor system, and whether the vehicle model can sense the road environment, plan a driving route automatically, and control the vehicle to reach a predetermined target through the vehicle-mounted sensor system of the vehicle model is detected in a virtual vehicle driving environment, and the boundary of the automatic driving function is verified. The vehicle model and the vehicle-mounted sensing system are virtualized, and virtual testing is firstly carried out; in a virtual test, real-time man-machine switching driving modes can be realized through a driving simulator, so that the vehicle driving safety is improved. Moreover, automatic driving trajectory planning, trajectory tracking and execution controller performance of the vehicle model under different traffic scenes can be virtualized according to test requirements in thevirtual test, so that the test cost is effectively reduced, and test efficiency is improved.

The invention discloses a method to take multi-chip parallel testing by using synchronous communication chip. It includes the following steps: connecting plural chips on silicon slice by shift register, outputting the testing signal to tested chips by the method of series to parallel, inputting the output data to I/O pins of tester from plural chips by the method of parallel to series, and reading the data and taking data process to gain the PASS/FAIL result of the chips. The invention could improve testing efficiency of testing chip and lower testing time and cost.

The invention relates to an ageing test device and method of an integrated circuit chip on the basis of daughter boards and a mother board. The device comprises a universal ageing mother board and a plurality of ageing daughter boards, wherein the universal ageing mother board is provided with a plurality of stations, and the stations are provided with a plurality of spring needles arranged in an array; the ageing daughter boards can be installed on one station of the universal ageing mother board; the front side of each ageing daughter board is provided with a chip installation part and is integrated with a peripheral application circuit; the back side of each ageing daughter board is provided with a plurality of metal contacts arranged in an array, wherein one part of the plurality of metal contacts is connected with the pin of a chip to be tested, and the other part is connected with the peripheral application circuit; a contact pin on each station is matched and is in contact with each metal contact on the back side of each ageing daughter board so as to connect the ageing daughter boards into the general ageing mother board. The invention also provides the test method. The ageing test device and method can be suitable for various types of integrated circuit chips to carry out ageing experiments and aged performance tests, test cost is effectively saved, and a test period is shortened.

The invention relates to an FPGA single event upset fault simulation test system and method. The method comprises the steps that S1, a reference configuration file and a new configuration file are generated by a configuration file generation and comparison module, and the upset digits of the two files are obtained through comparison; S2, the reference configuration file and the new configuration file are respectively injected into the monitored FPGA in an FPGA configuration program on-orbit monitoring platform via a configuration file injection module, and a frequency division signal is generated; S3, the tested on-orbit monitoring module in the FPGA configuration program on-orbit monitoring platform is started, the upset digits of the reference configuration file and the new configuration file are obtained through comparison, and the file data in the monitored FPGA are refreshed; and S4, an on-orbit monitoring verification result is obtained via a fault analysis module. Accuracy of an FPGA on-orbit monitoring function can be guaranteed; and test coverage is great, cost is low, time consumption is low, realization technical difficulty is low in engineering, and implementation of debugging verification in the early phase of the project is facilitated.

The invention relates to the oil field sludge component detection technology and in particular to an oil field sludge multicomponent testing method. The oil field sludge multicomponent testing method can measure the content of water, oil, residue, asphalt, saturates, aromatics, colloid and paraffin in oily sludge in oil field simultaneously, has low requirement for testing instruments, has low testing cost, and can be operated simply, conveniently and rapidly; in a testing process, a dewaxing reagent and a cold bath method are used to make the testing precision of paraffin be high and achieve low toxicity and high safety for testing personnel; and besides, according to the method, a slow crystallization process in which the cooling speed of paraffin crystals is controlled is used to prolong the growth time of the paraffin crystals, so that large paraffin crystal grains can be obtained, suction filtration loss is avoided and the measurement precision is improved.

The invention discloses a method for testing vertical three zone heights of a stope cover rock based on high level borehole flow. High level boreholes of which the trends are obliquely intersected are constructed from entity coal in a working face coal roadway to a side unloading area of a goaf; the heights of a caving zone and a diversion fissure zone of the stope cover rock are judged and tested by using drainage data of the high level boreholes of which the trends are obliquely intersected. The method disclosed by the invention is relatively low in test cost, simple in operation and reliable in result. By fully utilizing existing technical equipment and conditions of coal mines, the vertical three zone heights of the stope cover rock can be simply and quickly determined by using flow change of the high level boreholes.

The invention provides an IPMI-based DC automatic test method and system. The method comprises the steps that a client is adopted to carry out DC testing on a to-be-tested server; The client controlsthe to-be-tested server BMC to perform a DC startup and shutdown test through the IPMI command; The method comprises the steps that a to-be-tested server runs a first test script, collects informationof a to-be-tested server system and equipment and then is shut down; The client runs the second test script; The client circularly runs the IPMI command to read the power state of the server to be tested; The client judges whether the to-be-tested server is shut down or not; If yes, after the first waiting time period, the client starts the to-be-tested server through the IPMI command; After theto-be-tested server is started, the first test script is operated to obtain information of the to-be-tested server system and equipment, the information is compared with information collected for thefirst time for detection, a comparison result is output, and error information is stored; The to-be-tested server judges whether the DC test is completed or not; If not, the to-be-tested server is shut down; Return to boot step.

The invention discloses a test method for performing DC restarting on a server based on an ipmi service, and belongs to the technical field of server stability testing. The test method for performing the DC restarting on the server based on the ipmi service comprises the steps of copying a DC-reboot.bat test script to a server-side machine, modifying a BMC IP address and a lan port IP address of a to-be-tested client-side machine in DC-reboot.bat, and presetting a restarting frequency; and executing the DC-reboot.bat test script to check a power switch state of the client-side machine. According to the test method for the DC restarting, the test cost can be reduced, the test efficiency can be improved, the practicality is high, and the automation degree is high; and the method has very high popularization and application values.

The invention discloses a radio-frequency mixed signal integrated circuit test system and test method. An automatic test unit, a test interface unit, an off-chip interface unit and a control host formthe test system. The control host software controls the automatic test unit to take action and a test report is outputted; the automatic test unit generates an excitation signal and a desired signal,captures a response signal, and returns a comparison result to the control host; the test interface unit connects the automatic test unit and integrates all types of signal interfaces into a low-density simple-docking-process standard external interface capable of distinguishing signal types so as to transmit the excitation and response signals in a bidirectional manner; and the calibration module of the off-chip interface unit is used for realizing radio frequency error separation of the test interface unit and the off-chip interface unit and a to-be-tested circuit is connected to the standard external interface through the off-chip interface unit to input an excitation signal and output a response signal. Therefore, universal high-performance high-efficiency and low-cost integrated testing of the radio-frequency mixed signal integrated circuit from the 0.1GHz to 12GHz is realized.

The invention discloses an ATE (automatic test equipment)-based MCU (microprogrammed control unit)/SOC (system on chip) test method. The method is characterized in that the ATE is taken as a basic platform, and the reliable communication of the ATE and other devices is realized through a self-defined communication protocol. After a test is started, the ATE sends an instruction 1 and an incentive 1 to a device to be tested through a protocol, test data 1 is automatically recorded, an instruction 2 and an incentive 2 are sent to the device to be tested, test data 2 is automatically recorded, and the process is carried out until all item tests are finished. According to the method, the ATE and the MCU/SOC can keep free communication to accurately and reliably connect with external equipment, all manual operations are omitted, test data quantities are increased, and meanwhile, chip test time is greatly shortened.

The invention discloses a regression test case selection method based on an improved harmony search algorithm. The regression test case selection method includes the steps: firstly, screening a test case of a sensitivity function covering modification from a selected test case set; secondly, selecting a proper case selection mathematical model according to the selected test case; thirdly, optimally selecting the test case by the improved harmony search algorithm with an excellent harmony element database EEL. The excellent harmony element database EEL is updated once every a certain search algebra and stores excellent harmony elements, and the excellent harmony elements include intersection of sets comprising overall goal optimal harmony elements and suboptimal harmony elements, and intersection of sets comprising sub-goal optimal harmony elements and suboptimal harmony elements.