Test circuit of on-chip multicore processor and design method of testability

A multi-core processor and test circuit technology, applied in the direction of measuring electricity, measuring electrical variables, instruments, etc., can solve the problems of different test excitation and response vectors, increase test overhead and cost, prolong chip test time, etc., to reduce extra costs. Power consumption overhead, reduced test cost, and the effect of shortened test time
CN101183140AActive Publication Date: 2008-05-21INST OF COMPUTING TECHNOLOGY - CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN ยท China
Current Assignee / Owner
INST OF COMPUTING TECHNOLOGY - CHINESE ACAD OF SCI
Publication Date
2008-05-21

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Abstract

The present invention provides a testing circuit and a testability design method thereof for an on-chip multinuclear processor; wherein, the testing circuit comprises a testing shell register chain, a chip core connecting circuit waiting to be tested, an on-chip data path connecting circuit and a control logic circuit. The chip core connecting circuit waiting to be tested is an interconnection circuit, which is connected between the testing shell register chain and the chip core waiting to be tested. The on-chip data path connecting circuit is the interconnection circuit which is connected between the testing shell register chain and the on-chip data path. The control logic circuit controls the data flow direction of the chip core connecting circuit waiting to be tested and the on-chip data path connecting circuit. The present invention conducts an optimum design according to the characteristics of the on-chip multinuclear processor. The bandwidth of the on-chip data path is fully used. The testing cost is reduced and the amount of a transmission data packet in the on-chip data path is reduced. So an extra power spending caused by mass active data packet is greatly reduced and the testing time is greatly shortened.
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Description

technical field

[0001] The invention belongs to the technical field of testability design of large-scale integrated circuit chips, in particular, the invention relates to a test case circuit and a design method thereof. Background technique

[0002] With the driving of applications and the advancement of technology and materials, the system structure of high-performance computing is facing another major change. ITRS (International Technology Roadmap for Semiconductors: International Technology Roadmap for Semiconductors) predicts that in order to further improve circuit integration and performance, device size, transistor threshold voltage and oxide thickness will be further reduced to meet future development needs. These changes will increase the leakage current exponentially and bring about large deviations in on-chip and inter-chip device parameters. The number of devices per chip will rise from about 200 million to tens of billions in the next ten years.

[0003] Tradi...

Claims

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