Test circuit of on-chip multicore processor and design method of testability
A multi-core processor and test circuit technology, applied in the direction of measuring electricity, measuring electrical variables, instruments, etc., can solve the problems of different test excitation and response vectors, increase test overhead and cost, prolong chip test time, etc., to reduce extra costs. Power consumption overhead, reduced test cost, and the effect of shortened test time
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[0045] Example 1
[0046] As shown in Figure 2, Figure 2 is a schematic diagram of the testability design scheme for on-chip multi-core processors provided by the present invention. The circuit includes two components: at least one test shell register for caching the test data of the core to be tested Chain, and the interconnection circuit between the test shell register chain and the core to be tested and the on-chip data path.
[0047] Among them, the test shell register chain used to cache the test data of the core to be tested is generally divided into multiple groups, and the specific number of groups is determined by the core scanning structure. The determination method will be described in detail below, and will be omitted here. The test shell register chain is composed of a plurality of registers connected in series, and the test shell register chain is tested by the interconnection circuit between the test shell register chain and the core to be tested, and the interconne...
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