Modulation profile measurement system and method based on inclined focusing and rotary scanning
A technology of contour measurement and rotary scanning, which is applied in the field of optical measurement, can solve problems such as complex devices, small measurement range, and harsh measurement conditions, and achieve the effect of expanding the measurement depth and flexible measurement system
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[0040]DETAILED DESCRIPTION OF THE INVENTION The present invention will be described below to understand the present invention, but it should be understood, and the present invention is not limited to the scope of the specific embodiments, and in terms of ordinary skill in the art, as long as various changes Within the spirit and scope of the invention appended claims, it is apparent from the appended claims.
[0041]After the sinusoidal stripes passed through the projectile, the striped pattern in its focusing plane was the most clear, and the striped system was also the highest, and the adjustment was gradually smaller before and after its imaging surface (FIP: FOCUSED Image Plane), which was gauge, such asfigure 1 Indicated.
[0042]This system is likefigure 2 As shown, the following components are included: gratings, CCD cameras, projection lenses, mirrors and beam mirrors;
[0043]The grating is placed on the projection lens side; the mirror is placed on the other side of the projection ...
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