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High-precision speckle interference phase shift fringe dynamic measurement system and method

A speckle interference and dynamic measurement technology, applied in measurement devices, instruments, optical devices, etc., to achieve the effect of reducing measurement vibration isolation requirements, low circuit requirements, and improving reliability

Pending Publication Date: 2021-11-02
EAST CHINA JIAOTONG UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

In this new technology described earlier, it suggests combining different techniques together into one system called pictorial phase mapping technique. It allows cameras and sensors to work correctly at once without requiring complex timing circuits. Additionally, there are multiple cores within each sensor chip used for processing data simultaneously instead of individually. These improvements result in faster and more reliable imaging performance than previous methods like digital still photography.

Problems solved by technology

This patented technical solution describes an improved technique called LSP Interferometer: A special type of device called LSIM or Phase Locked Loop Machines (PLC). They are devices with multiple components such as mirror elements and sensors. By controllably adjustting these parts based on specific conditions like temperature changes, they create stable patterns over large areas without any instabilities caused by external factors like vibrations or pressure variations. To overcome issues associated with conventional methods involving complex timing circuits and long measuring times, there was developed a new approach known as Fringe Anti-Interfere Technology (FIN), where instead of relying solely upon regular pulse signals captured from moving objects, the sensor records the resulting data while simultaneously updating the position of the light source's point within certain limits. Overall, FIN provides better quality measurements than traditional techniques but requires more complicated hardware systems compared to existing technologies.

Method used

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  • High-precision speckle interference phase shift fringe dynamic measurement system and method
  • High-precision speckle interference phase shift fringe dynamic measurement system and method
  • High-precision speckle interference phase shift fringe dynamic measurement system and method

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Embodiment Construction

[0080] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" etc. The indicated orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, or in a specific orientation. construction and operation, therefore, should not be construed as limiting the invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and should not be construed as indicating or implying relative importance.

[0081] In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "installation", "connection" and "connection" should be un...

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Abstract

The invention relates to a high-precision speckle interference phase shift fringe dynamic measurement system and method, and the system comprises: a laser which is used as a light source and emits laser; a piezoelectric ceramic which can move and is provided with a reflecting mirror, wherein the reflecting mirror is used for reflecting the laser and generating a phase shift speckle pattern on the surface of an object; a camera which is used for capturing an image; a Michelson interferometer which is used for generating interference fringes; a signal synchronization module which is used for manufacturing a synchronization signal generation circuit; and a computer which is used for displaying the image captured by the camera and calculating an interference fringe pattern. The synchronizing signal generating circuit can generate a square wave signal and a step signal, the rising edges of the square wave signal and the step signal are synchronous, the square wave signal is used for controlling image acquisition of the camera, and the step signal is used for controlling movement of the piezoelectric ceramic to generate a phase shift diagram; the step waves generate step voltages, the voltage difference values of all steps are equal, and the displacement of piezoelectric ceramic movement corresponding to the maximum voltage difference and the minimum voltage difference is equal to one wavelength of a light source of the laser.

Description

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Claims

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Application Information

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Owner EAST CHINA JIAOTONG UNIVERSITY
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