Chip testing device and method
A chip testing and chip technology, applied in measuring devices, electronic circuit testing, measuring electricity, etc., can solve problems such as inaccurate chip testing results
Pending Publication Date: 2022-02-25
江苏捷策创电子科技有限公司
View PDF0 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0002] The quality of the chip is related to the quality of the product including the chip. Before the chip leaves the factory, it needs to be tested by the chip testing device. The chip testing device will test a large number of chips until the testing of these chips is completed. When the chip testing device has a problem, the chip test results will be inaccurate
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0032] The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that, the specific embodiments described herein are only used to explain the embodiments of the present invention, but are not intended to limit the embodiments of the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all structures related to the embodiments of the present invention.
[0033] figure 1 A schematic structural diagram of a chip testing device provided by an embodiment of the present invention, refer to figure 1 , the chip test device includes a chip test module 110, a self-test module 120 and an alarm module 130; the chip test module 110 includes a plurality of devices, and the chip test module 110 is used to test the quality of the chip; the self-test module 120 is connected with the chip test module 110 , the...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The embodiment of the invention provides a chip testing device and method. The chip testing device comprises a chip testing module, a self-checking module and an alarm module. The chip testing module comprises a plurality of devices and is used for testing the quality of a chip; the self-checking module is connected with the chip testing module, and the self-checking module is used for detecting whether a device which does not work in the chip testing module has a fault when the chip testing module tests the chip, and sending an alarm signal to the alarm module when detecting that the device which does not work has the fault; and the alarm module is connected with the self-checking module, and the alarm module is used for sending out an alarm prompt when receiving the alarm signal. According to the chip testing device and method provided by the embodiment of the invention, whether the chip testing device has a fault or not can be monitored during chip testing, and an alarm prompt is given out when the chip testing device has the fault.
Description
technical field [0001] The invention relates to the field of chip testing, in particular to a chip testing device and method. Background technique [0002] The quality of the chip is related to the quality of the product including the chip. Before the chip leaves the factory, it needs to be tested by the chip test device. The chip test device will test a large number of chips until the test of these chips is completed. The test results will be inaccurate. After a large number of chip tests are completed, if the test results of multiple consecutive chips are inaccurate, it is necessary to detect whether the chip testing device is faulty. The existing chip testing device can detect whether there is a fault after the chip testing is completed. SUMMARY OF THE INVENTION [0003] The chip testing device and method provided by the embodiments of the present invention can monitor whether the chip testing device has a fault during chip testing, and issue an alarm prompt when the c...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2856
Inventor 苏佳宁张先燃朱骁昱
Owner 江苏捷策创电子科技有限公司