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Software defect positioning method and device, electronic equipment and medium

A software defect and location method technology, which is applied in the field of electronic equipment and media, devices, and software defect location methods, can solve problems such as high complexity, many steps, and large time and cost for testers, so as to narrow the search scope and improve efficiency Effect

Pending Publication Date: 2022-04-05
CERNET CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Both are methods aimed at testing whether the software is normal or not, and rarely pay attention to the characteristics of the time and location of the defect, and these software testing methods have many steps and high complexity, requiring testers to spend a lot of time and cost

Method used

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  • Software defect positioning method and device, electronic equipment and medium
  • Software defect positioning method and device, electronic equipment and medium
  • Software defect positioning method and device, electronic equipment and medium

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Embodiment Construction

[0024] In order to make the objects, technical solutions and advantages of the present disclosure, the present disclosure will be described in detail below with reference to the accompanying drawings.

[0025] It should be noted that in the drawings or specification description, similar or identical portions are used. The technical features in various embodiments in the specification can perform freely combined formation of new schemes without conflict, and each of the claims may be combined as a new aspects, or in various claims. Embodiments, and in the drawings, the shape or thickness of the embodiment can be expanded and indicated by simplification or convenient. Further, the components or implementations not shown or described in the drawings are the form known in the art. Additionally, although this article can provide demonstrations of parameters containing specific values, it should be understood that the parameters do not need to be exactly equal to the corresponding value...

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PUM

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Abstract

The invention provides a software defect positioning method and device, and the method comprises the steps: obtaining a software test log which comprises software defect information; extracting code coverage information in the software test log, wherein the code coverage information is used for representing the operation completion degree of each row of codes; obtaining an executed code according to the code coverage information; and locating the software defect from the executed code. According to the method disclosed by the invention, the searching range of the software defects is reduced, the software testing efficiency is improved, and a foundation is laid for further software defect analysis.

Description

Technical field [0001] The present disclosure relates to the field of software testing, and in particular, to a software defect positioning method, device, electronic device, and medium. Background technique [0002] With the development and popularization of information technology, the software can be seen everywhere in our lives, and the software has become an integral part of informationization, so the quality of software is particularly important. As the code constituting the software, the quality of the code is not only related to the cost of software development, but also related to the user's experience. The defect of the code may seriously affect the quality of the code, and the less potential defects have found, the more serious the consequences. It is well known that applications in software development involve many areas and modules, software developers have unevenly leading to code quality, and the defects in queries and positioning code are very important. [0003] A...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 黄友俊李星吴建平张明明
Owner CERNET CORP
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