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Employee training device and method for replacing CPU test slot

A slot and employee technology, applied in the simulation device of space navigation conditions, transportation and packaging, space navigation equipment, etc., can solve the problems of lower product qualification rate, affecting production line production, damage to units, etc., to reduce installation and disassembly. , The effect of reducing damage efficiency and increasing production efficiency

Pending Publication Date: 2022-04-12
SUZHOU TF AMD SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the CPU test slot is manually replaced, and there are the following situations: due to unskilled operation, the time for replacing the CPU test slot is increased, the unit is damaged, and the production line is affected; the CPU test slot is installed backwards, resulting in the need for reinstallation; there is no basis for use Installation is required; personnel go directly to work without training, resulting in a lower product qualification rate; lack of corresponding training records, it is impossible to judge whether the personnel are qualified for maintenance and the level of personnel ability

Method used

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  • Employee training device and method for replacing CPU test slot
  • Employee training device and method for replacing CPU test slot
  • Employee training device and method for replacing CPU test slot

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Embodiment Construction

[0050] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art. It should be noted here that the descriptions of these embodiments are used to help understand the present invention, but are not intended to limit the present invention.

[0051] This embodiment provides an employee training device for replacing the CPU test slot, which can simulate the installation situation of the CPU test slot on the test motherboard for employees to conduct simulation training and assessment. refer to Figure 1 to Figure 5As shown, the employee training device mainly includes a bracket 1, a training disk 2 and a control system. Training disc 2 is installed on the top of support 1, and the lower end of support 1 is provided with wheel 12, and wheel 12 is specifically self-locking ground wheel, to move...

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Abstract

The invention discloses an employee training device and method for replacing a CPU test slot. The employee training device comprises a training disc, and each test unit of the training disc comprises an installation tool which comprises an installation groove used for accommodating a CPU test slot; the limiting cover plate can seal and cover the notch after the CPU test slot is placed into the mounting groove; the detection rod can be pressed on the front surface of the limiting cover plate after the limiting cover plate covers the notch; the first sensor is used for sending out a first detection signal after detecting the CPU test slot; the second sensor is used for sending a second detection signal after detecting that the detection rod is pressed on the front surface of the limiting cover plate; the employee training device further comprises a controller which is used for judging whether the CPU test slot is correctly inserted into the test unit after receiving the first detection signal and the second detection signal of the same test unit. According to the invention, the replacement efficiency of the CPU test slot is improved, and the damage rate of the CPU test slot is reduced.

Description

technical field [0001] The invention belongs to the field of test equipment for semiconductor devices, and relates to a staff training device and method for replacing a CPU test slot. Background technique [0002] In the semiconductor testing process, spare parts need to be replaced frequently. For example, when testing the CPU, the CPU is inserted into the test slot on the test board, and is electrically connected to the electronic circuits or components on the test board through the conductive parts (such as pins, shrapnel, etc.) on the test slot. However, after being used for a period of time, due to the impact of dust or broken and damaged conductive parts, the test socket needs to be replaced to ensure that the CPU to be tested is effectively connected to the test board. Therefore, during the test, it is necessary to replace the test slot of the CPU accordingly, but the quality of the replacement is determined according to the proficiency of the operator. At present, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09B9/00G09B23/18
Inventor 嵇康曾昭孔朱军郭宏伟崔秀秀
Owner SUZHOU TF AMD SEMICON CO LTD