Method and device for quantifying thinking similarity of testers

A technology of testers and quantification methods, which is applied in the field of quantification of testers' thinking similarity, which can solve problems such as complex analysis elements that cannot be quantified by testers and test thinking similarities, and achieve the effect of improving the discovery probability and testing efficiency
CN114385482APending Publication Date: 2022-04-22电信科学技术第十研究所有限公司
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
电信科学技术第十研究所有限公司
Publication Date
2022-04-22

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Abstract

The invention discloses a method and a device for quantifying thinking similarity of testers, and the method comprises the steps: classifying the first-round defects measured by the testers in the first round, and calculating the defect degree coefficient of the classified first-round defects; calculating an initial test thinking classification metric value of each tester under the corresponding test thinking category; calculating a corrected test thinking classification metric value of each tester under the corresponding test thinking category; calculating a test thinking classification metric value of each tester under the corresponding test thinking category, and calculating a standardized test thinking classification metric value of each tester under the corresponding test thinking category; and calculating a test thinking similarity value among the testers. According to the method, the test technology difference of the testers can be effectively determined, so that the problems of thinking ability improvement of the testers, team combination of different testers, test team cultivation and the like are effectively solved, and the effects of improving the project defect discovery probability and the test efficiency are achieved.
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Description

technical field

[0001] The invention relates to the technical field of computer software testing, in particular to a method and device for quantifying the thinking similarity of testers. Background technique

[0002] In the prior art, when evaluating the thinking similarity of testers based on test defects, it is generally obtained by separately analyzing the testing thinking of each tester. However, the elements of this analysis method are relatively complex and are not easy to be quantified in the actual analysis process. Therefore, the original analysis method cannot quantify the similarity of testers’ testing thinking, and cannot effectively clarify the differences in testers’ testing techniques. It is impossible to solve the problems of improving the thinking ability of testers, combining different testers, and training the test team, which will affect the probability of defect discovery and test efficiency.

[0003] It is noted that this section is intended to provide...

Claims

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